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2020 – today
- 2025
[j98]Aibin Yan, Yuting He, Zhengfeng Huang, Wenjie Yan, Jie Cui, Xiaolei Wang, Tianming Ni, Patrick Girard, Xiaoqing Wen:
Cost Efficient Flip-Flop Designs With Multiple-Node Upset-Tolerance and Algorithm-Based Verifications. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 44(1): 390-394 (2025)- 2024
- [j97]Vaibhav Jain
, Devendra Kumar Sharma, Hari Mohan Gaur, Ashutosh Kumar Singh, Xiaoqing Wen:
Comprehensive and Comparative Analysis of QCA-based Circuit Designs for Next-generation Computation. ACM Comput. Surv. 56(5): 120:1-120:36 (2024) - [j96]Qingping Zhang, Wenfa Zhan, Xiaoqing Wen:
A new die-level flexible design-for-test architecture for 3D stacked ICs. Integr. 97: 102190 (2024) - [j95]Aibin Yan, Han Bao, Wangjin Jiang, Jie Cui, Zhengfeng Huang, Xiaoqing Wen:
Efficient design approaches to CMOS full adder circuits. Microelectron. J. 149: 106235 (2024) - [j94]Zhengfeng Huang, Liting Sun, Xu Wang, Huaguo Liang, Yingchun Lu, Aibin Yan, Jun Pan, Xiaoqing Wen:
NEST: A Quadruple-Node Upset Recovery Latch Design and Algorithm-Based Recovery Optimization. IEEE Trans. Aerosp. Electron. Syst. 60(4): 4590-4600 (2024) - [j93]Aibin Yan, Zhixing Li, Zhongyu Gao, Jing Zhang, Zhengfeng Huang, Tianming Ni, Jie Cui, Xiaolei Wang, Patrick Girard, Xiaoqing Wen:
MURLAV: A Multiple-Node-Upset Recovery Latch and Algorithm-Based Verification Method. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 43(7): 2205-2214 (2024) - [j92]Aibin Yan, Yu Chen, Zhongyu Gao, Tianming Ni, Zhengfeng Huang, Jie Cui, Patrick Girard, Xiaoqing Wen:
FeMPIM: A FeFET-Based Multifunctional Processing-in-Memory Cell. IEEE Trans. Circuits Syst. II Express Briefs 71(4): 2299-2303 (2024) - [j91]Tianming Ni, Xiaoqing Wen, Hussam Amrouch, Cheng Zhuo, Peilin Song:
Introduction to the Special Issue on Design for Testability and Reliability of Security-aware Hardware. ACM Trans. Design Autom. Electr. Syst. 29(1): 1:1-1:3 (2024) - [j90]Chencan Zhou, Yang Cao, Quan Shi, Lu-Xin Wang, Xiaoqing Wen:
A Robust Newton Iteration Method for Mixed-Cell-Height Circuit Legalization Under Technology and Region Constraints. ACM Trans. Design Autom. Electr. Syst. 29(6): 1-25 (2024) - [j89]Aibin Yan, Litao Wang, Jie Cui, Zhengfeng Huang, Tianming Ni, Patrick Girard, Xiaoqing Wen:
Nonvolatile Latch Designs With Node-Upset Tolerance and Recovery Using Magnetic Tunnel Junctions and CMOS. IEEE Trans. Very Large Scale Integr. Syst. 32(1): 116-127 (2024) - [c145]Aibin Yan, Chen Dong, Xing Guo, Jie Song, Jie Cui, Tianming Ni, Patrick Girard, Xiaoqing Wen:
IDLD: Interlocked Dual-Circle Latch Design with Low Cost and Triple-Node-Upset-Recovery for Aerospace Applications. ACM Great Lakes Symposium on VLSI 2024: 19-24 - [c144]Aibin Yan, Zhuoyuan Lin, Guangzhu Liu, Qingyang Zhang, Zhengfeng Huang, Jie Cui, Xiaoqing Wen, Patrick Girard:
Nonvolatile and SEU-Recoverable Latch Based on FeFET and CMOS for Energy-Harvesting Devices. ISCAS 2024: 1-5 - [c143]Yang Chang, Guangzhu Liu, Inam Ullah, Gaoyang Shan, Xiaoqing Wen, Aibin Yan:
SHRCO: Design of an SRAM with High Reliability and Cost Optimization for Safety-Critical Applications. ITC-Asia 2024: 1-6 - [c142]Zhengfeng Huang, Yankun Lin, Fansheng Zeng, Jingchang Bian, Zhao Yang, Huaguo Liang, Yingchun Lu, Liang Yao, Xiaoqing Wen, Tianming Ni:
PFO PUF: A Lightweight Parallel Feed Obfuscation PUF Resistant to Machine Learning Attacks. ITC-Asia 2024: 1-6 - [c141]Xuehua Li, Jie Song, Chunjiong Zhang, Yuting He, Xiaoqing Wen, Zhengfeng Huang:
Multiple-Error Interceptive Voter Designs for Safety-Critical Applications. ITC-Asia 2024: 1-6 - [c140]Zhen Shen, Qingyang Zhang, Byeong-Hee Roh, Jie Song, Xiaoqing Wen:
CQCTL: A Cost-Optimized and Quadruple-Node-Upset Completely Tolerant Latch Design for Safety-Critical Applications. ITC-Asia 2024: 1-6 - [c139]Senling Wang, Shaoqi Wei, Hisashi Okamoto, Tatusya Nishikawa, Hiroshi Kai, Yoshinobu Higami, Hiroyuki Yotsuyanagi, Ruijun Ma, Tianming Ni, Hiroshi Takahashi, Xiaoqing Wen:
Test Point Selection for Multi-Cycle Logic BIST using Multivariate Temporal-Spatial GCNs. ITC-Asia 2024: 1-6 - [c138]Fan Xia, Jing Zhang, Jehad Ali, Chunjiong Zhang, Xiaoqing Wen, Aibin Yan:
SRBML: A Single-Event-Upset Recoverable and BTI-Mitigated Latch Design for Long-Term Reliability Enhancement. ITC-Asia 2024: 1-5 - [c137]Jiajia Zhang, Zhenmin Li, Gaoyang Shan, Jie Song, Xing Guo, Xiaoqing Wen:
ICLTR: A Input-split Inverters and C-elements based Low-Cost Latch with Triple-Node-Upset Recovery. ITC-Asia 2024: 1-6 - [i5]Xiaoqing Wen, Quanbi Feng, Jianyu Niu, Yinqian Zhang, Chen Feng:
MECURY: Practical Cross-Chain Exchange via Trusted Hardware. CoRR abs/2409.14640 (2024) - [i4]Xiaoqing Wen, Quanbi Feng, Jianyu Niu, Yinqian Zhang, Chen Feng:
TeeRollup: Efficient Rollup Design Using Heterogeneous TEE. CoRR abs/2409.14647 (2024) - 2023
- [j88]Aibin Yan, Yuting He, Xiaoxiao Niu, Jie Cui, Tianming Ni, Zhengfeng Huang, Patrick Girard, Xiaoqing Wen:
A Highly Robust and Low-Power Flip-Flop Cell With Complete Double-Node-Upset Tolerance for Aerospace Applications. IEEE Des. Test 40(4): 34-41 (2023) - [j87]Shiling Shi, Stefan Holst, Xiaoqing Wen:
GPU-Accelerated Estimation and Targeted Reduction of Peak IR-Drop during Scan Chain Shifting. IEICE Trans. Inf. Syst. 106(10): 1694-1704 (2023) - [j86]Zhenyu Guan, Zhiting Liu, Xiaoqing Wen, Qinjun Wan, Wenhan Xu:
Trusted fingerprint localization for multimedia devices based on blockchain. Inf. Sci. 643: 119231 (2023) - [j85]Aibin Yan, Jing Xiang, Yang Chang, Zhengfeng Huang, Jie Cui, Patrick Girard, Xiaoqing Wen:
Two sextuple cross-coupled SRAM cells with double-node-upset protection and cost optimization for aerospace applications. Microelectron. J. 139: 105908 (2023) - [j84]Wenfa Zhan, Luping Zhang, Xuejun Feng, Pan Pan, Xueyuan Cai, Xiaoqing Wen:
An equivalent processing method for integrated circuit electrical parameter data using BP neural networks. Microelectron. J. 139: 105912 (2023) - [j83]Aibin Yan, Zhixing Li, Jie Cui, Zhengfeng Huang, Tianming Ni, Patrick Girard, Xiaoqing Wen:
Designs of Two Quadruple-Node-Upset Self-Recoverable Latches for Highly Robust Computing in Harsh Radiation Environments. IEEE Trans. Aerosp. Electron. Syst. 59(3): 2885-2897 (2023) - [j82]Aibin Yan, Zhixing Li, Jie Cui, Zhengfeng Huang, Tianming Ni, Patrick Girard, Xiaoqing Wen:
LDAVPM: A Latch Design and Algorithm-Based Verification Protected Against Multiple-Node-Upsets in Harsh Radiation Environments. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 42(6): 2069-2073 (2023) - [j81]Tianming Ni, Qingsong Peng, Jingchang Bian, Liang Yao, Zhengfeng Huang, Aibin Yan, Senling Wang, Xiaoqing Wen:
Design of True Random Number Generator Based on Multi-Ring Convergence Oscillator Using Short Pulse Enhanced Randomness. IEEE Trans. Circuits Syst. I Regul. Pap. 70(12): 5074-5085 (2023) - [j80]Aibin Yan, Runqi Liu, Jie Cui, Tianming Ni, Patrick Girard, Xiaoqing Wen, Jiliang Zhang:
Designs of BCD Adder Based on Excess-3 Code in Quantum-Dot Cellular Automata. IEEE Trans. Circuits Syst. II Express Briefs 70(6): 2256-2260 (2023) - [j79]Aibin Yan, Aoran Cao, Zhengfeng Huang, Jie Cui, Tianming Ni, Patrick Girard, Xiaoqing Wen, Jiliang Zhang:
Two Double-Node-Upset-Hardened Flip-Flop Designs for High-Performance Applications. IEEE Trans. Emerg. Top. Comput. 11(4): 1070-1081 (2023) - [j78]Deepika Saxena, Ishu Gupta, Rishabh Gupta, Ashutosh Kumar Singh, Xiaoqing Wen:
An AI-Driven VM Threat Prediction Model for Multi-Risks Analysis-Based Cloud Cybersecurity. IEEE Trans. Syst. Man Cybern. Syst. 53(11): 6815-6827 (2023) - [j77]Wu Zhou, Yiming Ouyang, Dongyu Xu, Zhengfeng Huang, Huaguo Liang, Xiaoqing Wen:
Energy-Efficient Multiple Network-on-Chip Architecture With Bandwidth Expansion. IEEE Trans. Very Large Scale Integr. Syst. 31(4): 442-455 (2023) - [j76]Dongyu Xu, Yiming Ouyang, Wu Zhou, Zhengfeng Huang, Huaguo Liang, Xiaoqing Wen:
RMC_NoC: A Reliable On-Chip Network Architecture With Reconfigurable Multifunctional Channel. IEEE Trans. Very Large Scale Integr. Syst. 31(12): 2061-2074 (2023) - [c136]Tianming Ni, Fei Li, Qingsong Peng, Senling Wang, Xiaoqing Wen:
A Lightweight and Machine-Learning-Resistant PUF framework based on Nonlinear Structure and Obfuscating Challenges. AsianHOST 2023: 1-6 - [c135]Mu Nie, Wen Jiang, Wankou Yang, Senling Wang, Xiaoqing Wen, Tianming Ni:
Enhancing Defect Diagnosis and Localization in Wafer Map Testing Through Weakly Supervised Learning. ATS 2023: 1-6 - [c134]Aibin Yan, Yu Chen, Zhengfeng Huang, Jie Cui, Xiaoqing Wen:
A High-Performance and P-Type FeFET-Based Non-Volatile Latch. ATS 2023: 1-5 - [c133]Aibin Yan, Xuehua Li, Zhongyu Gao, Zhengfeng Huang, Tianming Ni, Xiaoqing Wen:
Advanced DICE Based Triple-Node-Upset Recovery Latch with Optimized Overhead for Space Applications. ATS 2023: 1-5 - [c132]Aibin Yan, Zhen Zhou, Liang Ding, Jie Cui, Zhengfeng Huang, Xiaoqing Wen, Patrick Girard:
High Performance and DNU-Recovery Spintronic Retention Latch for Hybrid MTJ/CMOS Technology. DATE 2023: 1-2 - [c131]Senling Wang, Shaoqi Wei, Jun Ma, Hiroshi Kai, Yoshinobu Higami, Hiroshi Takahashi, Akihiro Shimizu, Xiaoqing Wen, Tianming Ni:
SASL-JTAG: A Light-Weight Dependable JTAG. DFT 2023: 1-3 - [c130]Aibin Yan, Xuehua Li, Tianming Ni, Zhengfeng Huang, Xiaoqing Wen:
A Robust and High-Performance Flip-Flop with Complete Soft-Error Recovery. DSA 2023: 474-476 - [c129]Stefan Holst, Ruijun Ma, Xiaoqing Wen, Aibin Yan, Hui Xu:
BiSTAHL: A Built-In Self-Testable Soft-Error-Hardened Scan-Cell. ETS 2023: 1-6 - [c128]Aibin Yan, Shaojie Wei, Jinjun Zhang, Jie Cui, Jie Song, Tianming Ni, Patrick Girard, Xiaoqing Wen:
A Low Area and Low Delay Latch Design with Complete Double-Node-Upset-Recovery for Aerospace Applications. ACM Great Lakes Symposium on VLSI 2023: 167-171 - [c127]Aibin Yan, Yang Chang, Jing Xiang, Hao Luo, Jie Cui, Zhengfeng Huang, Tianming Ni, Xiaoqing Wen:
Two Highly Reliable and High-Speed SRAM Cells for Safety-Critical Applications. ACM Great Lakes Symposium on VLSI 2023: 293-298 - [c126]Aibin Yan, Shaojie Wei, Zhixing Li, Jie Cui, Zhengfeng Huang, Patrick Girard, Xiaoqing Wen:
Design of Low-Cost Approximate CMOS Full Adders. ISCAS 2023: 1-5 - [c125]Aibin Yan, Jing Xiang, Zhengfeng Huang, Tianming Ni, Jie Cui, Patrick Girard, Xiaoqing Wen:
Design of A Highly Reliable and Low-Power SRAM With Double-Node Upset Recovery for Safety-critical Applications. ITC-Asia 2023: 1-6 - [c124]Aibin Yan, Fan Xia, Tianming Ni, Jie Cui, Zhengfeng Huang, Patrick Girard, Xiaoqing Wen:
A Low Overhead and Double-Node-Upset Self-Recoverable Latch. ITC-Asia 2023: 1-5 - [c123]Aibin Yan, Chao Zhou, Shaojie Wei, Jie Cui, Zhengfeng Huang, Patrick Girard, Xiaoqing Wen:
Design of a Novel Latch with Quadruple-Node-Upset Recovery for Harsh Radiation Hardness. ITC-Asia 2023: 1-6 - [c122]Shiling Shi, Stefan Holst, Xiaoqing Wen:
Mitigating Test-Induced Yield-Loss by IR-Drop-Aware X-Filling. MCSoC 2023: 501-507 - [i3]Deepika Saxena, Ishu Gupta, Rishabh Gupta, Ashutosh Kumar Singh, Xiaoqing Wen:
An AI-Driven VM Threat Prediction Model for Multi-Risks Analysis-Based Cloud Cybersecurity. CoRR abs/2308.09578 (2023) - 2022
- [j75]Tianming Ni, Jingchang Bian, Zhao Yang, Mu Nie, Liang Yao, Zhengfeng Huang, Aibin Yan, Xiaoqing Wen:
Broadcast-TDMA: A Cost-Effective Fault-Tolerance Method for TSV Lifetime Reliability Enhancement. IEEE Des. Test 39(5): 34-42 (2022) - [j74]Ruijun Ma, Stefan Holst, Xiaoqing Wen, Aibin Yan, Hui Xu:
Evaluation and Test of Production Defects in Hardened Latches. IEICE Trans. Inf. Syst. 105-D(5): 996-1009 (2022) - [j73]Aibin Yan, Kuikui Qian, Tai Song, Zhengfeng Huang, Tianming Ni, Yu Chen, Xiaoqing Wen:
A double-node-upset completely tolerant CMOS latch design with extremely low cost for high-performance applications. Integr. 86: 22-29 (2022) - [j72]Deepika Saxena, Ishu Gupta, Jitendra Kumar, Ashutosh Kumar Singh, Xiaoqing Wen:
A Secure and Multiobjective Virtual Machine Placement Framework for Cloud Data Center. IEEE Syst. J. 16(2): 3163-3174 (2022) - [j71]Aibin Yan, Zhengzheng Fan, Liang Ding, Jie Cui, Zhengfeng Huang, Qijun Wang, Hao Zheng, Patrick Girard, Xiaoqing Wen:
Cost-Effective and Highly Reliable Circuit-Components Design for Safety-Critical Applications. IEEE Trans. Aerosp. Electron. Syst. 58(1): 517-529 (2022) - [j70]Qi Xu, Wenhao Sun, Song Chen, Yi Kang, Xiaoqing Wen:
Cellular Structure-Based Fault-Tolerance TSV Configuration in 3D-IC. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 41(5): 1196-1208 (2022) - [j69]Qi Xu, Hao Geng, Tianming Ni, Song Chen, Bei Yu, Yi Kang, Xiaoqing Wen:
Fortune: A New Fault-Tolerance TSV Configuration in Router-Based Redundancy Structure. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 41(10): 3182-3187 (2022) - [j68]Qi Xu, Hao Geng, Song Chen, Bo Yuan, Cheng Zhuo, Yi Kang, Xiaoqing Wen:
GoodFloorplan: Graph Convolutional Network and Reinforcement Learning-Based Floorplanning. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 41(10): 3492-3502 (2022) - [j67]Aibin Yan, Zhelong Xu, Xiangfeng Feng, Jie Cui, Zhili Chen, Tianming Ni, Zhengfeng Huang, Patrick Girard, Xiaoqing Wen:
Novel Quadruple-Node-Upset-Tolerant Latch Designs With Optimized Overhead for Reliable Computing in Harsh Radiation Environments. IEEE Trans. Emerg. Top. Comput. 10(1): 404-413 (2022) - [c121]Tianming Ni, Qingsong Peng, Jingchang Bian, Liang Yao, Zhengfeng Huang, Aibin Yan, Xiaoqing Wen:
MRCO: A Multi-ring Convergence Oscillator-based High-Efficiency True Random Number Generator. AsianHOST 2022: 1-6 - [c120]Aibin Yan, Liang Ding, Zhen Zhou, Zhengfeng Huang, Jie Cui, Patrick Girard, Xiaoqing Wen:
A Radiation-Hardened Non-Volatile Magnetic Latch with High Reliability and Persistent Storage. ATS 2022: 1-6 - [c119]Aibin Yan, Zhixing Li, Shiwei Huang, Zijie Zhai, Xiangyu Cheng, Jie Cui, Tianming Ni, Xiaoqing Wen, Patrick Girard:
SCLCRL: Shuttling C-elements based Low-Cost and Robust Latch Design Protected against Triple Node Upsets in Harsh Radiation Environments. DATE 2022: 1257-1262 - [c118]Aibin Yan, Zhen Zhou, Shaojie Wei, Jie Cui, Yong Zhou, Tianming Ni, Patrick Girard, Xiaoqing Wen:
A Highly Robust, Low Delay and DNU-Recovery Latch Design for Nanoscale CMOS Technology. ACM Great Lakes Symposium on VLSI 2022: 255-260 - [c117]Aibin Yan, Zhihui He, Jing Xiang, Jie Cui, Yong Zhou, Zhengfeng Huang, Patrick Girard, Xiaoqing Wen:
Two 0.8 V, Highly Reliable RHBD 10T and 12T SRAM Cells for Aerospace Applications. ACM Great Lakes Symposium on VLSI 2022: 261-266 - [c116]Aibin Yan, Yu Chen, Shukai Song, Zijie Zhai, Jie Cui, Zhengfeng Huang, Patrick Girard, Xiaoqing Wen:
Sextuple Cross-Coupled-DICE Based Double-Node-Upset Recoverable and Low-Delay Flip-Flop for Aerospace Applications. ACM Great Lakes Symposium on VLSI 2022: 333-338 - [c115]Taiki Utsunomiya, Ryu Hoshino, Kohei Miyase, Shyue-Kung Lu, Xiaoqing Wen, Seiji Kajihara:
Effective Switching Probability Calculation to Locate Hotspots in Logic Circuits. ITC-Asia 2022: 43-48 - [c114]Aibin Yan, Shukai Song, Jixiang Zhang, Jie Cui, Zhengfeng Huang, Tianming Ni, Xiaoqing Wen, Patrick Girard:
Cost-Optimized and Robust Latch Hardened against Quadruple Node Upsets for Nanoscale CMOS. ITC-Asia 2022: 73-78 - [c113]Kalyan Baital, Amlan Chakrabarti, Biswadeep Chatterjee, Stefan Holst, Xiaoqing Wen:
Power and Energy Safe Real-Time Multi-Core Task Scheduling. VLSID 2022: 16-21 - [c112]Aibin Yan, Kuikui Qian, Jie Cui, Ningning Cui, Zhengfeng Huang, Xiaoqing Wen, Patrick Girard:
A Highly Reliable and Low Power RHBD Flip-Flop Cell for Aerospace Applications. VTS 2022: 1-6 - 2021
- [j66]Aibin Yan, Aoran Cao, Zhelong Xu, Jie Cui, Tianming Ni, Patrick Girard, Xiaoqing Wen:
Design of Radiation Hardened Latch and Flip-Flop with Cost-Effectiveness for Low-Orbit Aerospace Applications. J. Electron. Test. 37(4): 489-502 (2021) - [j65]Yucong Zhang, Stefan Holst, Xiaoqing Wen, Kohei Miyase, Seiji Kajihara, Jun Qian:
On the Efficacy of Scan Chain Grouping for Mitigating IR-Drop-Induced Test Data Corruption. IEICE Trans. Inf. Syst. 104-D(6): 816-827 (2021) - [j64]Aibin Yan, Zhihui He, Jun Zhou, Jie Cui, Tianming Ni, Zhengfeng Huang, Xiaoqing Wen, Patrick Girard:
Dual-modular-redundancy and dual-level error-interception based triple-node-upset tolerant latch designs for safety-critical applications. Microelectron. J. 111: 105034 (2021) - [j63]Tianming Ni, Qi Xu, Zhengfeng Huang, Huaguo Liang, Aibin Yan, Xiaoqing Wen:
A Cost-Effective TSV Repair Architecture for Clustered Faults in 3-D IC. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 40(9): 1952-1956 (2021) - [j62]Aibin Yan, Chaoping Lai, Yinlei Zhang, Jie Cui, Zhengfeng Huang, Jie Song, Jing Guo, Xiaoqing Wen:
Novel Low Cost, Double-and-Triple-Node-Upset-Tolerant Latch Designs for Nano-scale CMOS. IEEE Trans. Emerg. Top. Comput. 9(1): 520-533 (2021) - [j61]Tianming Ni, Zhao Yang, Hao Chang, Xiaoqiang Zhang, Lin Lu, Aibin Yan, Zhengfeng Huang, Xiaoqing Wen:
A Novel TDMA-Based Fault Tolerance Technique for the TSVs in 3D-ICs Using Honeycomb Topology. IEEE Trans. Emerg. Top. Comput. 9(2): 724-734 (2021) - [c111]Xiaoqing Wen:
LSI Testing: A Core Technology to a Successful LSI Industry. ASICON 2021: 1-4 - [c110]Stefan Holst, Lim Bumun, Xiaoqing Wen:
GPU-Accelerated Timing Simulation of Systolic-Array-Based AI Accelerators. ATS 2021: 127-132 - [c109]Xiaoqing Wen, Zhenyu Guan, Dawei Li, Hanzheng Lyu, Huimin Li:
A Blockchain-based Framework for Information Management in Internet of Vehicles. CSCloud/EdgeCom 2021: 18-23 - [c108]Qi Xu, Junpeng Wang, Hao Geng, Song Chen, Xiaoqing Wen:
Reliability-Driven Neuromorphic Computing Systems Design. DATE 2021: 1586-1591 - [c107]Aibin Yan, Aoran Cao, Kuikui Qian, Liang Ding, Zhihui He, Zhengzheng Fan, Xiaoqing Wen:
A Reliable and Low-Cost Flip-Flop Hardened against Double-Node-Upsets. DSA 2021: 734-736 - [c106]Aibin Yan, Aoran Cao, Zhengzheng Fan, Zhelong Xu, Tianming Ni, Patrick Girard, Xiaoqing Wen:
A 4NU-Recoverable and HIS-Insensitive Latch Design for Highly Robust Computing in Harsh Radiation Environments. ACM Great Lakes Symposium on VLSI 2021: 301-306 - [c105]Aibin Yan, Liang Ding, Chuanbo Shan, Haoran Cai, Xiaofeng Chen, Zhanjun Wei, Zhengfeng Huang, Xiaoqing Wen:
TPDICE and Sim Based 4-Node-Upset Completely Hardened Latch Design for Highly Robust Computing in Harsh Radiation. ISCAS 2021: 1-5 - [c104]Zhenyu Guan, Xiaoqing Wen, Dawei Li, Mai Xu, Haihua Li:
A Blockchain-based Verified Locating Scheme for IoT Devices. ISPA/BDCloud/SocialCom/SustainCom 2021: 799-805 - [c103]Aibin Yan, Zijie Zhai, Lele Wang, Jixiang Zhang, Ningning Cui, Tianming Ni, Xiaoqing Wen:
Parallel DICE Cells and Dual-Level CEs based 3-Node-Upset Tolerant Latch Design for Highly Robust Computing. ITC-Asia 2021: 1-5 - [c102]Aibin Yan, Kuikui Qian, Jie Cui, Ningning Cui, Tianming Ni, Zhengfeng Huang, Xiaoqing Wen:
A Sextuple Cross-Coupled Dual-Interlocked-Storage-Cell based Multiple-Node-Upset Self-Recoverable Latch. NANOARCH 2021: 1-6 - [i2]Deepika Saxena, Ishu Gupta, Jitendra Kumar, Ashutosh Kumar Singh, Xiaoqing Wen:
A Secure and Multi-objective Virtual Machine Placement Framework for Cloud Data Centre. CoRR abs/2107.13502 (2021) - 2020
- [j60]Aibin Yan, Xiangfeng Feng, Yuanjie Hu, Chaoping Lai, Jie Cui, Zhili Chen, Kohei Miyase, Xiaoqing Wen:
Design of a Triple-Node-Upset Self-Recoverable Latch for Aerospace Applications in Harsh Radiation Environments. IEEE Trans. Aerosp. Electron. Syst. 56(2): 1163-1171 (2020) - [j59]Aibin Yan, Zhelong Xu, Kang Yang, Jie Cui, Zhengfeng Huang, Patrick Girard, Xiaoqing Wen:
A Novel Low-Cost TMR-Without-Voter Based HIS-Insensitive and MNU-Tolerant Latch Design for Aerospace Applications. IEEE Trans. Aerosp. Electron. Syst. 56(4): 2666-2676 (2020) - [j58]Aibin Yan, Yan Chen, Zhelong Xu, Zhili Chen, Jie Cui, Zhengfeng Huang, Patrick Girard, Xiaoqing Wen:
Design of Double-Upset Recoverable and Transient-Pulse Filterable Latches for Low-Power and Low-Orbit Aerospace Applications. IEEE Trans. Aerosp. Electron. Syst. 56(5): 3931-3940 (2020) - [j57]Aibin Yan, Yuanjie Hu, Jie Cui, Zhili Chen, Zhengfeng Huang, Tianming Ni, Patrick Girard, Xiaoqing Wen:
Information Assurance Through Redundant Design: A Novel TNU Error-Resilient Latch for Harsh Radiation Environment. IEEE Trans. Computers 69(6): 789-799 (2020) - [j56]Tianming Ni, Yao Yao, Hao Chang, Lin Lu, Huaguo Liang, Aibin Yan, Zhengfeng Huang, Xiaoqing Wen:
LCHR-TSV: Novel Low Cost and Highly Repairable Honeycomb-Based TSV Redundancy Architecture for Clustered Faults. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 39(10): 2938-2951 (2020) - [j55]Aibin Yan, Yafei Ling, Jie Cui, Zhili Chen, Zhengfeng Huang, Jie Song, Patrick Girard, Xiaoqing Wen:
Quadruple Cross-Coupled Dual-Interlocked-Storage-Cells-Based Multiple-Node-Upset-Tolerant Latch Designs. IEEE Trans. Circuits Syst. I Regul. Pap. 67-I(3): 879-890 (2020) - [j54]Tianming Ni, Hao Chang, Tai Song, Qi Xu, Zhengfeng Huang, Huaguo Liang, Aibin Yan, Xiaoqing Wen:
Non-Intrusive Online Distributed Pulse Shrinking-Based Interconnect Testing in 2.5D IC. IEEE Trans. Circuits Syst. 67-II(11): 2657-2661 (2020) - [j53]Aibin Yan, Yan Chen, Yuanjie Hu, Jun Zhou, Tianming Ni, Jie Cui, Patrick Girard, Xiaoqing Wen:
Novel Speed-and-Power-Optimized SRAM Cell Designs With Enhanced Self-Recoverability From Single- and Double-Node Upsets. IEEE Trans. Circuits Syst. 67-I(12): 4684-4695 (2020) - [j52]Takaaki Kato, Senling Wang, Yasuo Sato, Seiji Kajihara, Xiaoqing Wen:
A Flexible Scan-in Power Control Method in Logic BIST and Its Evaluation with TEG Chips. IEEE Trans. Emerg. Top. Comput. 8(3): 591-601 (2020) - [c101]Aibin Yan, Yan Chen, Jun Zhou, Jie Cui, Tianming Ni, Xiaoqing Wen, Patrick Girard:
A Sextuple Cross-Coupled SRAM Cell Protected against Double-Node Upsets. ATS 2020: 1-5 - [c100]Aibin Yan, Xiangfeng Feng, Xiaohu Zhao, Hang Zhou, Jie Cui, Zuobin Ying, Patrick Girard, Xiaoqing Wen:
HITTSFL: Design of a Cost-Effective HIS-Insensitive TNU-Tolerant and SET-Filterable Latch for Safety-Critical Applications. DAC 2020: 1-6 - [c99]Aibin Yan, Zhelong Xu, Jie Cui, Zuobin Ying, Zhengfeng Huang, Huaguo Liang, Patrick Girard, Xiaoqing Wen:
Dual-Interlocked-Storage-Cell-Based Double-Node-Upset Self-Recoverable Flip-Flop Design for Safety-Critical Applications. ISCAS 2020: 1-5 - [c98]Stefan Holst, Matthias Kampmann, Alexander Sprenger, Jan Dennis Reimer, Sybille Hellebrand, Hans-Joachim Wunderlich, Xiaoqing Wen:
Logic Fault Diagnosis of Hidden Delay Defects. ITC 2020: 1-10 - [c97]Zhengda Dou, Aibin Yan, Jun Zhou, Yuanjie Hu, Yan Chen, Tianming Ni, Jie Cui, Patrick Girard, Xiaoqing Wen:
Design of a Highly Reliable SRAM Cell with Advanced Self-Recoverability from Soft Errors. ITC-Asia 2020: 35-40
2010 – 2019
- 2019
- [j51]Aibin Yan, Jun Zhou, Yuanjie Hu, Jie Cui, Zhengfeng Huang, Patrick Girard, Xiaoqing Wen:
Novel Quadruple Cross-Coupled Memory Cell Designs With Protection Against Single Event Upsets and Double-Node Upsets. IEEE Access 7: 176188-176196 (2019) - [j50]