Stop the war!

Остановите войну!

for scientists:

default search action

combined dblp search
author search
venue search
publication search

ask others

"MURLAV: A Multiple-Node-Upset Recovery Latch and Algorithm-Based ..."

Aibin Yan et al. (2024)

> Home

Details and statistics

DOI: 10.1109/TCAD.2024.3357593

access: closed

type: Journal Article

metadata version: 2024-07-02

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/tcad/YanLGZHNCWGW24
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/tcad/YanLGZHNCWGW24
Aibin Yan, Zhixing Li, Zhongyu Gao, Jing Zhang, Zhengfeng Huang, Tianming Ni, Jie Cui, Xiaolei Wang, Patrick Girard, Xiaoqing Wen:
MURLAV: A Multiple-Node-Upset Recovery Latch and Algorithm-Based Verification Method. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 43(7): 2205-2214 (2024)

a service of

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.