"Using Launch-on-Capture for Testing BIST Designs Containing Synchronous ..."

Laung-Terng Wang et al. (2010)

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DOI: 10.1109/TCAD.2009.2035483

access: closed

type: Journal Article

metadata version: 2020-09-24

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Laung-Terng Wang, Xiaoqing Wen, Shianling Wu, Hiroshi Furukawa, Hao-Jan Chao, Boryau Sheu, Jianghao Guo, Wen-Ben Jone:
Using Launch-on-Capture for Testing BIST Designs Containing Synchronous and Asynchronous Clock Domains. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 29(2): 299-312 (2010)

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