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ORCIDITC 2007: Santa Clara, California, USA
- Jill Sibert, Janusz Rajski:
2007 IEEE International Test Conference, ITC 2007, Santa Clara, California, USA, October 21-26, 2007. IEEE Computer Society 2007, ISBN 1-4244-1128-9
Microprocessor Test
- Robert L. Franch, Phillip J. Restle, James K. Norman, William V. Huott, Joshua Friedrich, R. Dixon, Steve Weitzel, K. van Goor, Gerard Salem:
On-chip timing uncertainty measurements on IBM microprocessors. 1-7 - Robert F. Molyneaux, Thomas A. Ziaja, Hong Kim, Shahryar Aryani, Sungbae Hwang, Alex Hsieh:
Design for testability features of the SUN microsystems niagara2 CMP/CMT SPARC chip. 1-8 - Anuja Sehgal, Jeff Fitzgerald, Jeff Rearick:
Test cost reduction for the AMD™ Athlon processor using test partitioning. 1-10
Improving Test Quality
- Kunal P. Ganeshpure, Sandip Kundu:
On ATPG for multiple aggressor crosstalk faults in presence of gate delays. 1-7 - Ritesh P. Turakhia, W. Robert Daasch, Mark Ward, John Van Slyke:
Silicon evaluation of longest path avoidance testing for small delay defects. 1-10 - Jennifer Dworak:
Which defects are most critical? optimizing test sets to minimize failures due to test escapes. 1-10
Memory Testing
- Kevin W. Gorman, Michael Roberge, Adrian Paparelli
, Gary Pomichter, Stephen Sliva, William Corbin:
Advancements in at-speed array BIST: multiple improvements. 1-10 - Olivier Ginez, Patrick Girard, Christian Landrault, Serge Pravossoudovitch, Arnaud Virazel, Jean Michel Daga:
A concurrent approach for testing address decoder faults in eFlash memories. 1-10 - Chin-Lung Su, Chih-Wea Tsai, Cheng-Wen Wu, Ji-Jan Chen, Wen Ching Wu, Chien-Chung Hung, Ming-Jer Kao:
Diagnosis for MRAM write disturbance fault. 1-9
New Serdes Test Techniques
- Kiyotaka Ichiyama, Masahiro Ishida, Takahiro J. Yamaguchi, Mani Soma:
Data jitter measurement using a delta-time-to-voltage converter method. 1-7 - Mike P. Li, Jinhua Chen:
New methods for receiver internal jitter measurement. 1-10 - Stephen K. Sunter, Aubin Roy:
A selt-testing BOST for high-frequency PLLs, DLLs, and SerDes. 1-8
SOC Test
- Qiang Xu, Yubin Zhang, Krishnendu Chakrabarty:
Test-wrapper designs for the detection of signal-integrity faults on core-external interconnects of SoCs. 1-9 - Zhiyuan He, Zebo Peng, Petru Eles:
A heuristic for thermal-safe SoC test scheduling. 1-10 - Érika F. Cota, Fernanda Lima Kastensmidt, Maico Cassel, Paulo Meirelles, Alexandre M. Amory, Marcelo Lubaszewski:
Redefining and testing interconnect faults in Mesh NoCs. 1-10
Getting Accustomed to Unknowns
- Peter Wohl, John A. Waicukauski, Sanjay Ramnath:
Fully X-tolerant combinational scan compression. 1-10 - Nur A. Touba:
X-canceling MISR - An X-tolerant methodology for compacting output responses with unknowns using a MISR. 1-10 - Andreas Leininger, Martin Fischer, Michael Richter, Michael Gössel:
Using timing flexibility of automatic test equipment to complement X-tolerant test compression techniques. 1-9
Advanced Diagnosis Algorithms
- Yu Huang, Wu-Tung Cheng, Ruifeng Guo, Will Hsu, Yuan-Shih Chen, Albert Mann:
Diagnose compound scan chain and system logic defects. 1-10 - Ruifeng Guo, Yu Huang, Wu-Tung Cheng:
A complete test set to diagnose scan chain failures. 1-10 - Chen Liu, Wei Zou, Sudhakar M. Reddy, Wu-Tung Cheng, Manish Sharma, Huaxing Tang:
Interconnect open defect diagnosis with minimal physical information. 1-10
Breaking the 10-GB/s Barrier
- David C. Keezer, Dany Minier, Patrice Ducharme, Doris Viens, Greg Flynn, John McKillop:
Multi-GHz loopback testing using MEMs switches and SiGe logic. 1-10 - Jose Moreira, Heidi Barnes, Guenter Hoersch:
Analyzing and addressing the impact of test fixture relays for multi-gigabit ATE I/O characterization applications. 1-10 - Minh Quach, Mark Hinton, Regee Petaja:
Critical roles of RF and microwave electromagnetic field solver simulators in multi-gigabit high-speed digital applications. 1-9
Microprocessor Test Advances
- Samy Makar, Tony Altinis, Niteen Patkar, Janet Wu:
Testing of Vega2, a chip multi-processor with spare processors. 1-10 - Da Wang, Xiaoxin Fan, Xiang Fu, Hui Liu, Ke Wen, Rui Li, Huawei Li, Yu Hu, Xiaowei Li:
The design-for-testability features of a general purpose microprocessor. 1-9 - Frank Frederick, Teresa L. McLaurin:
Design for test features of the ARM clock control macro. 1-8
Advances in ATPG and Delay Test
- Pouria Bastani, Benjamin N. Lee, Li-C. Wang, Savithri Sundareswaran, Magdy S. Abadir:
Analyzing the risk of timing modeling based on path delay tests. 1-10 - Ankur Parikh, Weixin Wu, Michael S. Hsiao:
Mining-guided state justification with partitioned navigation tracks. 1-10 - Shun-Yen Lu, Ming-Ting Hsieh, Jing-Jia Liou:
An efficient SAT-based path delay fault ATPG with an unified sensitization model. 1-7
Advanced Characterization Methods
- Kunhyuk Kang, Muhammad Ashraful Alam, Kaushik Roy:
Characterization of NBTI induced temporal performance degradation in nano-scale SRAM array using IDDQ. 1-10 - Zahi S. Abuhamdeh, Vincent D'Alassandro, Richard Pico, Dale Montrone, Alfred L. Crouch, Andrew Tracy:
Separating temperature effects from ring-oscillator readings to measure true IR-drop on a chip. 1-10 - Yukio Okuda:
Gate delay ratio model for unified path delay analysis. 1-10
HF in Volume Production
- Udaya Shankar Natarajan, Hemalatha Shanmugasundaram, Prachi Deshpande, Chin Soon Wah:
Rapid UHF RFID silicon debug and production testing. 1-10 - Yongquan Fan, Yi Cai, Zeljko Zilic:
A high accuracy high throughput jitter test solution on ATE for 3GBPS and 6gbps serial-ata. 1-10 - Brian Moore, Chris Sellathamby, Philippe Cauvet, Hérvé Fleury, M. Paulson, Md. Mahbub Reja, Lin Fu, Brenda Bai, Edwin Walter Reid, Igor M. Filanovsky, Steven Slupsky:
High throughput non-contact SiP testing. 1-10
Power-aware Testing
- V. R. Devanathan, C. P. Ravikumar, V. Kamakoti:
A stochastic pattern generation and optimization framework for variation-tolerant, power-safe scan test. 1-10 - Bin Li, Lei Fang, Michael S. Hsiao:
Efficient power droop aware delay fault testing. 1-10 - V. R. Devanathan, C. P. Ravikumar, Rajat Mehrotra, V. Kamakoti:
PMScan : A power-managed scan for simultaneous reduction of dynamic and leakage power during scan test. 1-9
New Advances in Detecting PCBA Structural Defects
- Mike Farrell, Glen Leinbach:
Implementing bead probe technology for in-circuit test: A case study. 1-8 - Kenneth P. Parker, Don DeMille:
A bead probe CAD strategy for in-circuit test. 1-8 - Tee Chwee Liong, Andy Pascual:
Impact of Quad Flat No Lead package (QFN) on automated X-ray inspection (AXI). 1-10
Towards More Efficient Defect Diagnosis
- Osei Poku, Ronald D. Blanton:
Delay defect diagnosis using segment network faults. 1-10 - Dongok Kim, M. Enamul Amyeen, Srikanth Venkataraman, Irith Pomeranz, Swagato Basumallick, Berni Landau:
Testing for systematic defects based on DFM guidelines. 1-10 - Manish Sharma, Wu-Tung Cheng, Ting-Pu Tai, Y. S. Cheng, Will Hsu, Chen Liu, Sudhakar M. Reddy, Albert Mann:
Faster defect localization in nanometer technology based on defective cell diagnosis. 1-10
New Tests for PLLs
- Hideo Okawara:
Real-time signal processing - a new PLL test approach. 1-9 - Guo Yu, Peng Li:
A methodology for systematic built-in self-test of phase-locked loops targeting at parametric failures. 1-10 - Takahiro J. Yamaguchi, H. X. Hou, Koji Takayama, Dave Armstrong, Masahiro Ishida, Mani Soma:
An FFT-based jitter separation method for high-frequency jitter testing with a 10x reduction in test time. 1-8
Delay Test Topics
- Gefu Xu, Adit D. Singh:
Achieving high transition delay fault coverage with partial DTSFF scan chains. 1-9 - Rohit Kapur, Jindrich Zejda, Thomas W. Williams:
Fundamentals of timing information for test: How simple can we get? 1-7 - Anis Uzzaman, Bibo Li, Thomas J. Snethen, Brion L. Keller, Gary Grise:
Automated handling of programmable on-product clock generation (OPCG) circuitry for delay test vector generation. 1-10
Test and Debug Data Reduction
- Abdul Wahid Hakmi, Hans-Joachim Wunderlich, Christian G. Zoellin, Andreas Glowatz, Friedrich Hapke, Jürgen Schlöffel, Laurent Souef:
Programmable deterministic Built-In Self-Test. 1-9 - Seongmoon Wang, Zhanglei Wang, Wenlong Wei, Srimat T. Chakradhar:
A low cost test data compression technique for high n-detection fault coverage. 1-10 - Ehab Anis, Nicola Nicolici:
On using lossless compression of debug data in embedded logic analysis. 1-10
Functional and Outlier Test
- Tao Xu, Krishnendu Chakrabarty:
Functional testing of digital microfluidic biochips. 1-10 - Onur Guzey, Li-C. Wang, Jayanta Bhadra:
Enhancing signal controllability in functional test-benches through automatic constraint extraction. 1-10 - Jeffrey L. Roehr:
Measurement ratio testing for improved quality and outlier detection. 1-10
Testing the Future - ATE to the Rescue!
- Andrew C. Evans:
The new ATE: Protocol aware. 1-10 - Seong-Hun Choe, Shuji Tanaka, Masayoshi Esashi:
A matched expansion MEMS probe card with low CTE LTCC substrate. 1-6 - William J. Bowhers:
Management of common-mode currents in semiconductor ATE. 1-9
Advances in DFT
- Omar I. Khan, Michael L. Bushnell, Suresh Kumar Devanathan, Vishwani D. Agrawal:
SPARTAN: a spectral and information theoretic approach to partial-scan. 1-10 - Dean L. Lewis, Hsien-Hsin S. Lee:
A scanisland based design enabling prebond testability in die-stacked microprocessors. 1-8 - Jing Li, Swaroop Ghosh, Kaushik Roy:
A generic and reconfigurable test paradigm using Low-cost integrated Poly-Si TFTs. 1-10
Advanced Concepts in Board and System Test
- Carl Edward Gray, Odile Liboiron-Ladouceur, David C. Keezer, Keren Bergman:
Co-development of test electronics and PCI Express interface for a multi-Gbps optical switching network. 1-9 - Kenneth P. Parker, Stephen Hird:
Finding power/ground defects on connectors - a new approach. 1-7 - Heiko Ehrenberg:
IEEE P1581 can solve your board level memory cluster test problems. 1-9
Characterization with Delay Test, Iddq and Probing
- Sean Hsi Yuan Wu, Benjamin N. Lee, Li-C. Wang, Magdy S. Abadir:
Statistical analysis and optimization of parametric delay test. 1-10 - Rudolf Schlangen, Reiner Leihkauf, Uwe Kerst, Christian Boit, Rajesh Jain, Tahir Malik, Keneth R. Wilsher, Ted R. Lundquist, Bernd Krüger:
Backside E-Beam Probing on Nano scale devices. 1-9 - Michael Laisne, Triphuong Nguyen, Songlin Zuo, Xiangdong Pan, Hailong Cui, Cher Bai, A. Street, M. Parley, Neetu Agrawal, K. Sundararaman:
Verification and debugging of IDDQ test of low power chips. 1-7
DFT and Analog Testing
- Srividya Sundar, Bruce C. Kim, Toby Byrd, Felipe Toledo, Sudhir Wokhlu, Erika Beskar, Raul Rousselin, David Cotton, Gary Kendall:
Low cost automatic mixed-signal board test using IEEE 1149.4. 1-9 - Fang Liu, Sule Ozev:
Efficient simulation of parametric faults for multi-stage analog circuits. 1-9 - Carlos Arthur Lang Lisbôa, Fernanda Lima Kastensmidt, Egas Henes Neto, Gilson I. Wirth, Luigi Carro:
Using built-in sensors to cope with long duration transient faults in future technologies. 1-10
Reducing Test Power
- Xiaoqing Wen, Kohei Miyase, Seiji Kajihara, Tatsuya Suzuki, Yuta Yamato, Patrick Girard, Yuji Ohsumi, Laung-Terng Wang:
A novel scheme to reduce power supply noise for high-quality at-speed scan testing. 1-10 - Qiang Xu, Dianwei Hu, Dong Xiang:
Pattern-directed circuit virtual partitioning for test power reduction. 1-10 - Kyoung Youn Cho, Subhasish Mitra, Edward J. McCluskey:
California scan architecture for high quality and low power testing. 1-10
Fault Simulation
- Soumitra Bose, Vishwani D. Agrawal:
Estimating stuck fault coverage in sequential logic using state traversal and entropy analysis. 1-10 - Dong Xiang, Yang Zhao, Kaiwei Li, Hideo Fujiwara:
Fast and effective fault simulation for path delay faults based on selected testable paths. 1-10 - Soumitra Bose, Hillary Grimes, Vishwani D. Agrawal:
Delay fault simulation with bounded gate delay mode. 1-10
Fault and Error Tolerance in Nanotechnologies
- Shideh Shahidi, Sandeep K. Gupta:
ERTG: A test generator for error-rate testing. 1-10 - Ramtilak Vemu, Sankar Gurumurthy, Jacob A. Abraham:
ACCE: Automatic correction of control-flow errors. 1-10 - Xiaojun Ma, Jing Huang, Fabrizio Lombardi:
Modeling facet roughening errors in self-assembly by snake tile sets. 1-10
RF Test Methods
- Erkan Acar, Sule Ozev:
Low cost characterization of RF transceivers through IQ data analysis. 1-10 - Koji Asami:
An algorithm to evaluate wide-band quadrature mixers. 1-7 - Fang Liu, Erkan Acar, Sule Ozev:
Test yield estimation for analog/RF circuits over multiple correlated measurements. 1-10
Defect Tolerance in Microprocessors
- Yukiya Miura:
Dependable clock distribution for crosstalk aware design. 1-9 - Cecilia Metra, Martin Omaña, T. M. Mak, Simon Tam:
Novel compensation scheme for local clocks of high performance microprocessors. 1-9 - Miltiadis Hatzimihail, Mihalis Psarakis, Dimitris Gizopoulos, Antonis M. Paschalis:
A methodology for detecting performance faults in microprocessors via performance monitoring hardware. 1-10
The Last Word on N-Detect Test!
- Irith Pomeranz, Sudhakar M. Reddy:
On the saturation of n-detection test sets with increased n. 1-10 - Gaurav Bhargava, Dale Meehl, James Sage:
Achieving serendipitous N-detect mark-offs in Multi-Capture-Clock scan patterns. 1-7 - Jeroen Geuzebroek, Erik Jan Marinissen, Ananta K. Majhi, Andreas Glowatz, Friedrich Hapke:
Embedded multi-detect ATPG and Its Effect on the Detection of Unmodeled Defects. 1-10
System Issues with Test
- Jukka Antila, Timo Karhu:
A comparative study of continuous sampling plans for functional board testing. 1-7 - Teresa L. McLaurin, Rich Slobodnik, Kun-Han Tsai, Ana Keim:
Enhanced testing of clock faults. 1-9 - Alex S. Biewenga, Frans G. M. de Jong:
SiP-test: Predicting delivery quality. 1-10
ADC Test
- Luís Rolíndez, Salvador Mir, Jean-Louis Carbonéro, Dimitri Goguet, Nabil Chouba:
A stereo audio Σ∑ ADC architecture with embedded SNDR self-test. 1-10 - Hochul Kim, Kye-Shin Lee:
Sigma-delta ADC characterization using noise transfer function pole-zero tracking. 1-9 - Hanqing Xing, Hanjun Jiang, Degang Chen, Randall L. Geiger:
A fully digital-compatible BIST strategy for ADC linearity testing. 1-10
IJTAG and SJTAG Boundary-Scan-Based System Test
- Alfred L. Crouch:
IJTAG: The path to organized instrument connectivity. 1-10 - Bradford G. Van Treuren, Adam W. Ley:
JTAG system test in a MicroTCA world. 1-10 - Gunnar Carlsson, Johan Holmqvist, Erik Larsson:
Protocol requirements in an SJTAG/IJTAG environment. 1-9
Power Issues in Test
- Swarup Bhunia, Kaushik Roy:
Power dissipation, variations and nanoscale CMOS design: Test challenges and self-calibration/self-repair solutions. 1-10 - Srivaths Ravi:
Power-aware test: Challenges and solutions. 1-10 - Sachin Idgunji:
Case study of a low power MTCMOS based ARM926 SoC : Design, analysis and test challenges. 1-10
System Test Strategies
- Parmod Aggarwal:
Cost effective manufacturing test using mission mode tests. 1-8 - Tapan J. Chakraborty, Chen-Huan Chiang, Bradford G. Van Treuren:
A practical approach to comprehensive system test & debug using boundary scan based test architecture. 1-10
Reliability and Test
- Ming Zhang:
Design-for-reliability: A soft error case study. 1 - Subhasish Mitra, Mridul Agarwal:
Circuit failure prediction to overcome scaled CMOS reliability challenges. 1-3 - Michael Nicolaidis:
GRAAL: a new fault tolerant design paradigm for mitigating the flaws of deep nanometric technologies. 1-10
Panels
- Steve Comen:
Where is car IC testing going? 1 - Bernd Gessner:
How to ensure zero defects from the beginning with semiconductor test methods. 1-2 - Gary Wittie:
Car IC test changing but the same quality goal. 1 - Davide Appello:
Automotive IC's: less testing, more prevention. 1-2 - Peter M. O'Neill:
Statistical test: A new paradigm to improve test effectiveness & efficiency. 1-10 - Andrew Marshall:
A universal DC to logic performance correlation. 1-4 - Peter C. Maxwell:
Principles and results of some test cost reduction methods for ASICs. 1-5
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