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"Design of a Highly Reliable SRAM Cell with Advanced Self-Recoverability ..."

Zhengda Dou et al. (2020)

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DOI: 10.1109/ITC-ASIA51099.2020.00018

access: closed

type: Conference or Workshop Paper

metadata version: 2021-06-11

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  - conf/itc-asia/DouYZHCN00W20
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  - https://dblp.org/rec/conf/itc-asia/DouYZHCN00W20
Zhengda Dou, Aibin Yan, Jun Zhou, Yuanjie Hu, Yan Chen, Tianming Ni, Jie Cui, Patrick Girard, Xiaoqing Wen:
Design of a Highly Reliable SRAM Cell with Advanced Self-Recoverability from Soft Errors. ITC-Asia 2020: 35-40

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