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"A novel scheme to reduce power supply noise for high-quality at-speed scan ..."

Xiaoqing Wen et al. (2007)

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DOI: 10.1109/TEST.2007.4437632

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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  dblp key:
  - conf/itc/WenMKSYGOW07
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  persistent URL:
  - https://dblp.org/rec/conf/itc/WenMKSYGOW07
Xiaoqing Wen, Kohei Miyase, Seiji Kajihara, Tatsuya Suzuki, Yuta Yamato, Patrick Girard, Yuji Ohsumi, Laung-Terng Wang:
A novel scheme to reduce power supply noise for high-quality at-speed scan testing. ITC 2007: 1-10

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