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"Wrapper Scan Chains Design for Rapid and Low Power Testing of Embedded Cores."

Yinhe Han et al. (2005)

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DOI: 10.1093/IETISY/E88-D.9.2126

access: closed

type: Journal Article

metadata version: 2023-05-23

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  - https://dblp.org/rec/journals/ieicet/HanHLLCW05
Yinhe Han, Yu Hu, Xiaowei Li, Huawei Li, Anshuman Chandra, Xiaoqing Wen:
Wrapper Scan Chains Design for Rapid and Low Power Testing of Embedded Cores. IEICE Trans. Inf. Syst. 88-D(9): 2126-2134 (2005)

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