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"Random Pattern Testable Design with Partial Circuit Duplication."

Hiroshi Yokoyama, Xiaoqing Wen, Hideo Tamamoto (1997)

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DOI: 10.1109/ATS.1997.643982

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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  dblp key:
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  - https://dblp.org/rec/conf/ats/YokoyamaWT97
Hiroshi Yokoyama, Xiaoqing Wen, Hideo Tamamoto:
Random Pattern Testable Design with Partial Circuit Duplication. Asian Test Symposium 1997: 353-358

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