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"Mitigating Test-Induced Yield-Loss by IR-Drop-Aware X-Filling."

Shiling Shi, Stefan Holst, Xiaoqing Wen (2023)

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DOI: 10.1109/MCSOC60832.2023.00080

access: closed

type: Conference or Workshop Paper

metadata version: 2024-02-09

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Shiling Shi, Stefan Holst, Xiaoqing Wen:
Mitigating Test-Induced Yield-Loss by IR-Drop-Aware X-Filling. MCSoC 2023: 501-507

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