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"Is test power reduction through X-filling good enough?"
Fangmei Wu et al. (2010)
- Fangmei Wu, Luigi Dilillo, Alberto Bosio, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Mohammad Tehranipoor, Kohei Miyase, Xiaoqing Wen, Nisar Ahmed:
Is test power reduction through X-filling good enough? ITC 2010: 805
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