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"Diagnosis of Realistic Defects Based on the X-Fault Model."
Ilia Polian et al. (2008)
- Ilia Polian, Kohei Miyase, Yusuke Nakamura, Seiji Kajihara, Piet Engelke, Bernd Becker, Stefan Spinner, Xiaoqing Wen:
Diagnosis of Realistic Defects Based on the X-Fault Model. DDECS 2008: 263-266
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