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2020 – today
- 2024
- [j28]Ying Zhang, Aodi He, Jiaying Li, Ahmed Rezine, Zebo Peng, Erik Larsson, Tao Yang, Jianhui Jiang, Huawei Li:
On Modeling and Detecting Trojans in Instruction Sets. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 43(10): 3226-3239 (2024) - [c83]Erik Larsson:
Embedded Tutorial: Access to On-chip Instruments via Functional Ports. LATS 2024: 1-2 - [i2]Niklas Wretblad, Oskar Holmström, Erik Larsson, Axel Wiksäter, Oscar Söderlund, Hjalmar Öhman, Ture Pontén, Martin Forsberg, Martin Sörme, Fredrik Heintz:
Improving Relational Database Interactions with Large Language Models: Column Descriptions and Their Impact on Text-to-SQL Performance. CoRR abs/2408.04691 (2024) - 2023
- [c82]Erik Larsson:
Co-optimization of security and accessibility to on-chip instruments. LATS 2023: 1-2 - 2022
- [c81]Farrokh Ghani Zadegan, Zilin Zhang, Kim Petersén, Erik Larsson:
Reusing IEEE 1687-Compatible Instruments and Sub-Networks over a System Bus. ITC 2022: 219-228 - 2021
- [j27]Erik Larsson, Zehang Xiang, Prathamesh Murali:
Graceful Degradation of Reconfigurable Scan Networks. IEEE Trans. Very Large Scale Integr. Syst. 29(7): 1475-1479 (2021) - [c80]Erik Larsson, Shashi Kiran Gangaraju, Prathamesh Murali:
System-Level Access to On-Chip Instruments. ETS 2021: 1-6 - [c79]Erik Larsson, Prathamesh Murali, Ziling Zhang:
Accessing general IEEE Std. 1687 networks via functional ports. ITC 2021: 354-363 - 2020
- [j26]Esther Rheinbay, Morten Muhlig Nielsen, Federico Abascal, Jeremiah Wala, Ofer Shapira, Grace Tiao, Henrik Hornshøj, Julian M. Hess, Randi Istrup Juul, Ziao Lin, Lars Feuerbach, Radhakrishnan Sabarinathan, Tobias Madsen, Jaegil Kim, Loris Mularoni, Shimin Shuai, Andrés Lanzós, Carl Herrmann, Yosef E. Maruvka, Ciyue Shen, Samirkumar B. Amin, Pratiti Bandopadhayay, Johanna Bertl, Keith A. Boroevich, John Busanovich, Joana Carlevaro-Fita, Dimple Chakravarty, Calvin Wing Yiu Chan, David Craft, Priyanka Dhingra, Klev Diamanti, Nuno A. Fonseca, Abel Gonzalez-Perez, Qianyun Guo, Mark P. Hamilton, Nicholas J. Haradhvala, Chen Hong, Keren Isaev, Todd A. Johnson, Malene Juul, André Kahles, Abdullah Kahraman, Youngwook Kim, Jan Komorowski, Kiran Kumar, Sushant Kumar, Donghoon Lee, Kjong-Van Lehmann, Yilong Li, Eric Minwei Liu, Lucas Lochovsky, Keunchil Park, Oriol Pich, Nicola D. Roberts, Gordon Saksena, Steven E. Schumacher, Nikos Sidiropoulos, Lina Sieverling, Nasa Sinnott-Armstrong, Chip Stewart, David Tamborero, Jose M. C. Tubio, Husen M. Umer, Liis Uusküla-Reimand, Claes Wadelius, Lina Wadi, Xiaotong Yao, Cheng-Zhong Zhang, Jing Zhang, James E. Haber, Asger Hobolth, Marcin Imielinski, Manolis Kellis, Michael S. Lawrence, Christian von Mering, Hidewaki Nakagawa, Benjamin J. Raphael, Mark A. Rubin, Chris Sander, Lincoln D. Stein, Joshua M. Stuart, Tatsuhiko Tsunoda, David A. Wheeler, Rory Johnson, Jüri Reimand, Mark Gerstein, Ekta Khurana, Peter J. Campbell, Núria López-Bigas, Gary D. Bader, Jonathan Barenboim, Rameen Beroukhim, Søren Brunak, Ken Chen, Jung Kyoon Choi, Jordi Deu-Pons, J. Lynn Fink, Joan Frigola, Carlo Gambacorti Passerini, Dale W. Garsed, Gad Getz, Ivo Glynne Gut, David Haan, Arif Ozgun Harmanci, Mohamed Helmy, Ermin Hodzic, José M. G. Izarzugaza, Jong K. Kim, Jan O. Korbel, Erik Larsson, Shantao Li, Xiaotong Li, Shaoke Lou, Kathleen Marchal, Iñigo Martincorena, Alexander Martínez-Fundichely, Patrick D. McGillivray, William Meyerson, Ferran Muiños, Marta Paczkowska, Kiejung Park, Jakob Skou Pedersen, Tirso Pons, Sergio Pulido-Tamayo, Iker Reyes-Salazar, Matthew A. Reyna, Carlota Rubio-Perez, Süleyman Cenk Sahinalp, Leonidas Salichos, Mark Shackleton, Raunak Shrestha, Alfonso Valencia, Miguel Vazquez, Lieven P. C. Verbeke, Jiayin Wang, Jonathan Warrell, Sebastian M. Waszak, Joachim Weischenfeldt, Guanming Wu, Jun Yu, Xuanping Zhang, Yan Zhang, Zhongming Zhao, Lihua Zou, Kadir C. Akdemir, Eva G. Alvarez, Adrian Baez-Ortega, Paul C. Boutros, David D. L. Bowtell, Benedikt Brors, Kathleen H. Burns, Kin Chan, Isidro Cortés-Ciriano, Ana Dueso-Barroso, Andrew J. Dunford, Paul A. Edwards, Xavier Estivill, Dariush Etemadmoghadam, Milana Frenkel-Morgenstern, Dmitry A. Gordenin, Barbara Hutter, David T. W. Jones, Young Seok Ju, Marat D. Kazanov, Leszek J. Klimczak, Youngil Koh, Eunjung Alice Lee, Jake June-Koo Lee, Andy G. Lynch, Geoff MacIntyre, Florian Markowetz, Matthew Meyerson, Satoru Miyano, Fabio C. P. Navarro, Stephan Ossowski, Peter J. Park, John V. Pearson, Montserrat Puiggròs, Karsten Rippe, Steven A. Roberts, Bernardo Rodriguez-Martin, Ralph Scully, David Torrents, Izar Villasante, Nicola Waddell, Jeremiah A. Wala, Lixing Yang, Sung-Soo Yoon, Jorge Zamora:
Analyses of non-coding somatic drivers in 2,658 cancer whole genomes. Nat. 578(7793): 102-111 (2020) - [c78]Erik Larsson, Zehang Xiang, Prathamesh Murali:
IEEE Std. P1687.1 for Access Control of Reconfigurable Scan Networks. ETS 2020: 1-2 - [c77]August Lidfeldt, Daniel Isaksson, Ludwig Hedlund, Simon Åberg, Markus Borg, Erik Larsson:
Enabling Image Recognition on Constrained Devices Using Neural Network Pruning and a CycleGAN. IOT Companion 2020: 10:1-10:14 - [i1]August Lidfeldt, Daniel Isaksson, Ludwig Hedlund, Simon Åberg, Markus Borg, Erik Larsson:
Enabling Image Recognition on Constrained Devices Using Neural Network Pruning and a CycleGAN. CoRR abs/2009.05300 (2020)
2010 – 2019
- 2019
- [j25]Breeta SenGupta, Dimitar Nikolov, Assmitra Dash, Erik Larsson:
Test Flow Selection for Stacked Integrated Circuits. J. Electron. Test. 35(4): 425-440 (2019) - [c76]Erik Larsson, Prathamesh Murali, Gani Kumisbek:
IEEE Std. P1687.1: Translator and Protocol. ITC 2019: 1-10 - 2018
- [j24]Farrokh Ghani Zadegan, Dimitar Nikolov, Erik Larsson:
On-Chip Fault Monitoring Using Self-Reconfiguring IEEE 1687 Networks. IEEE Trans. Computers 67(2): 237-251 (2018) - [j23]Riccardo Cantoro, Farrokh Ghani Zadegan, Marco Palena, Paolo Pasini, Erik Larsson, Matteo Sonza Reorda:
Test of Reconfigurable Modules in Scan Networks. IEEE Trans. Computers 67(12): 1806-1817 (2018) - 2017
- [j22]Breeta SenGupta, Dimitar Nikolov, Urban Ingelsson, Erik Larsson:
Test Planning for Core-based Integrated Circuits under Power Constraints. J. Electron. Test. 33(1): 7-23 (2017) - [j21]Dimitar Nikolov, Erik Larsson:
Clustered checkpointing: Maximizing the level of confidence for non-equidistant checkpointing. Integr. 58: 549-562 (2017) - [j20]Krishnendu Chakrabarty, Massimo Alioto, Bevan M. Baas, Chirn Chye Boon, Meng-Fan Chang, Naehyuck Chang, Yao-Wen Chang, Chip-Hong Chang, Shih-Chieh Chang, Poki Chen, Masud H. Chowdhury, Pasquale Corsonello, Ibrahim Abe M. Elfadel, Said Hamdioui, Masanori Hashimoto, Tsung-Yi Ho, Houman Homayoun, Yuh-Shyan Hwang, Rajiv V. Joshi, Tanay Karnik, Mehran Mozaffari Kermani, Chulwoo Kim, Tae-Hyoung Kim, Jaydeep P. Kulkarni, Eren Kursun, Erik Larsson, Hai (Helen) Li, Huawei Li, Patrick P. Mercier, Prabhat Mishra, Makoto Nagata, Arun S. Natarajan, Koji Nii, Partha Pratim Pande, Ioannis Savidis, Mingoo Seok, Sheldon X.-D. Tan, Mark M. Tehranipoor, Aida Todri-Sanial, Miroslav N. Velev, Xiaoqing Wen, Jiang Xu, Wei Zhang, Zhengya Zhang, Stacey Weber Jackson:
Editorial. IEEE Trans. Very Large Scale Integr. Syst. 25(1): 1-20 (2017) - [c75]Artur Jutman, Christophe Lotz, Erik Larsson, Matteo Sonza Reorda, Maksim Jenihhin, Jaan Raik, Hans G. Kerkhoff, Rene Krenz-Baath, Piet Engelke:
BASTION: Board and SoC test instrumentation for ageing and no failure found. DATE 2017: 115-120 - 2016
- [j19]Dimitar Nikolov, Erik Larsson:
Optimizing the Level of Confidence for Multiple Jobs. IEEE Trans. Computers 65(4): 1239-1252 (2016) - [c74]Dimitar Nikolov, Erik Larsson:
Maximizing level of confidence for non-equidistant Checkpointing. ASP-DAC 2016: 62-68 - [c73]Riccardo Cantoro, Mehrdad Montazeri, Matteo Sonza Reorda, Farrokh Ghani Zadegan, Erik Larsson:
On the diagnostic analysis of IEEE 1687 networks. ETS 2016: 1-2 - [c72]Farrokh Ghani Zadegan, Dimitar Nikolov, Erik Larsson:
A self-reconfiguring IEEE 1687 network for fault monitoring. ETS 2016: 1-6 - [c71]Jing Zhang, Lars-Johan Fritz, Liang Liu, Erik Larsson:
Compressor design for silicon debug. ETS 2016: 1-2 - [c70]Riccardo Cantoro, Mehrdad Montazeri, Matteo Sonza Reorda, Farrokh Ghani Zadegan, Erik Larsson:
Automatic generation of stimuli for fault diagnosis in IEEE 1687 networks. IOLTS 2016: 167-172 - [c69]Anton Tsertov, Artur Jutman, Sergei Devadze, Matteo Sonza Reorda, Erik Larsson, Farrokh Ghani Zadegan, Riccardo Cantoro, Mehrdad Montazeri, Rene Krenz-Baath:
A suite of IEEE 1687 benchmark networks. ITC 2016: 1-10 - [c68]Farrokh Ghani Zadegan, Rene Krenz-Baath, Erik Larsson:
Upper-bound computation for optimal retargeting in IEEE1687 networks. ITC 2016: 1-10 - [c67]Erik Larsson, Farrokh Ghani Zadegan:
Accessing on-chip instruments through the life-time of systems. LATS 2016: 2-4 - [c66]Farrokh Ghani Zadegan, Dimitar Nikolov, Erik Larsson:
In-field system-health monitoring based on IEEE 1687. SoCC 2016: 69-74 - 2015
- [j18]Urban Ingelsson, Sandeep Kumar Goel, Erik Larsson, Erik Jan Marinissen:
Abort-on-Fail Test Scheduling for Modular SOCs without and with Preemption. IEEE Trans. Computers 64(12): 3335-3347 (2015) - [c65]Riccardo Cantoro, Mehrdad Montazeri, Matteo Sonza Reorda, Farrokh Ghani Zadegan, Erik Larsson:
On the testability of IEEE 1687 networks. ATS 2015: 211-216 - [c64]Rene Krenz-Baath, Farrokh Ghani Zadegan, Erik Larsson:
Access time minimization in IEEE 1687 networks. ITC 2015: 1-10 - [c63]Erik Larsson, Bill Eklow, Scott Davidsson, Rob Aitken, Artur Jutman, Christophe Lotz:
No Fault Found: The root cause. VTS 2015: 1 - 2014
- [j17]Dimitar Nikolov, Urban Ingelsson, Virendra Singh, Erik Larsson:
Evaluation of Level of Confidence and Optimization of Roll-back Recovery with Checkpointing for Real-Time Systems. Microelectron. Reliab. 54(5): 1022-1049 (2014) - [c62]Farrokh Ghani Zadegan, Erik Larsson, Artur Jutman, Sergei Devadze, Rene Krenz-Baath:
Design, Verification, and Application of IEEE 1687. ATS 2014: 93-100 - [c61]Kim Petersén, Dimitar Nikolov, Urban Ingelsson, Gunnar Carlsson, Farrokh Ghani Zadegan, Erik Larsson:
Fault injection and fault handling: An MPSoC demonstrator using IEEE P1687. IOLTS 2014: 170-175 - [c60]Farrokh Ghani Zadegan, Gunnar Carlsson, Erik Larsson:
Robustness of TAP-based scan networks. ITC 2014: 1-10 - [c59]Breeta SenGupta, Erik Larsson:
Test planning and test access mechanism design for stacked chips using ILP. VTS 2014: 1-6 - 2013
- [c58]Erik Larsson:
Special session 9B: Embedded tutorial embedded DfT instrumentation: Design, access, retargeting and case studies. VTS 2013: 1-2 - 2012
- [j16]Ashwini Jeggari, Debora S. Marks, Erik Larsson:
miRcode: a map of putative microRNA target sites in the long non-coding transcriptome. Bioinform. 28(15): 2062-2063 (2012) - [j15]Farrokh Ghani Zadegan, Urban Ingelsson, Erik Larsson, Gunnar Carlsson:
Reusing and Retargeting On-Chip Instrument Access Procedures in IEEE P1687. IEEE Des. Test Comput. 29(2): 79-88 (2012) - [j14]Breeta SenGupta, Urban Ingelsson, Erik Larsson:
Scheduling Tests for 3D Stacked Chips under Power Constraints. J. Electron. Test. 28(1): 121-135 (2012) - [j13]Farrokh Ghani Zadegan, Urban Ingelsson, Gunnar Carlsson, Erik Larsson:
Access Time Analysis for IEEE P1687. IEEE Trans. Computers 61(10): 1459-1472 (2012) - [c57]Erik Larsson, Farrokh Ghani Zadegan:
Accessing Embedded DfT Instruments with IEEE P1687. Asian Test Symposium 2012: 71-76 - [c56]Erik Larsson, Konstantin Sibin:
Fault management in an IEEE P1687 (IJTAG) environment. DDECS 2012: 7 - [c55]Xinli Gu, Jeff Rearick, Bill Eklow, Martin Keim, Jun Qian, Artur Jutman, Krishnendu Chakrabarty, Erik Larsson:
Re-using chip level DFT at board level. ETS 2012: 1 - [c54]Sairamesh Nammi, Bo Göransson, Erik Larsson, Qingyu Miao:
Design principles for four branch downlink MIMO for long term HSPA evolution. ICC 2012: 6051-6055 - [c53]Breeta SenGupta, Urban Ingelsson, Erik Larsson:
Test Planning for Core-based 3D Stacked ICs with Through-Silicon Vias. VLSI Design 2012: 442-447 - 2011
- [c52]Farrokh Ghani Zadegan, Urban Ingelsson, Golnaz Asani, Gunnar Carlsson, Erik Larsson:
Test Scheduling in an IEEE P1687 Environment with Resource and Power Constraints. Asian Test Symposium 2011: 525-531 - [c51]Farrokh Ghani Zadegan, Urban Ingelsson, Gunnar Carlsson, Erik Larsson:
Design automation for IEEE P1687. DATE 2011: 1412-1417 - [c50]Urban Ingelsson, Shih-Yen Chang, Erik Larsson:
Measurement point selection for in-operation wear-out monitoring. DDECS 2011: 381-386 - [c49]Breeta SenGupta, Urban Ingelsson, Erik Larsson:
Scheduling Tests for 3D Stacked Chips under Power Constraints. DELTA 2011: 72-77 - [c48]Dimitar Nikolov, Urban Ingelsson, Virendra Singh, Erik Larsson:
Level of confidence evaluation and its usage for Roll-back Recovery with Checkpointing optimization. DSN Workshops 2011: 59-64 - [c47]Pramod Subramanyan, Virendra Singh, Kewal K. Saluja, Erik Larsson:
Adaptive execution assistance for multiplexed fault-tolerant chip multiprocessors. ICCD 2011: 419-426 - 2010
- [c46]Mudassar Majeed, Daniel Ahlstrom, Urban Ingelsson, Gunnar Carlsson, Erik Larsson:
Efficient Embedding of Deterministic Test Data. Asian Test Symposium 2010: 159-162 - [c45]Farrokh Ghani Zadegan, Urban Ingelsson, Gunnar Carlsson, Erik Larsson:
Test Time Analysis for IEEE P1687. Asian Test Symposium 2010: 455-460 - [c44]Pramod Subramanyan, Virendra Singh, Kewal K. Saluja, Erik Larsson:
Multiplexed redundant execution: A technique for efficient fault tolerance in chip multiprocessors. DATE 2010: 1572-1577 - [c43]Dimitar Nikolov, Urban Ingelsson, Virendra Singh, Erik Larsson:
Estimating Error-probability and its Application for Optimizing Roll-back Recovery with Checkpointing. DELTA 2010: 281-285 - [c42]Pramod Subramanyan, Virendra Singh, Kewal K. Saluja, Erik Larsson:
Energy-efficient fault tolerance in chip multiprocessors using Critical Value Forwarding. DSN 2010: 121-130 - [c41]Erik Larsson, Bart Vermeulen, Kees Goossens:
A distributed architecture to check global properties for post-silicon debug. ETS 2010: 182-187 - [c40]Jaynarayan T. Tudu, Erik Larsson, Virendra Singh, Hideo Fujiwara:
Scan cell reordering to minimize peak power during test cycle: A graph theoretic approach. ETS 2010: 259 - [c39]N. S. Vinay, Indira Rawat, Erik Larsson, Manoj Singh Gaur, Virendra Singh:
Thermal aware test scheduling for stacked multi-chip-modules. EWDTS 2010: 343-349 - [c38]Jaynarayan T. Tudu, Erik Larsson, Virendra Singh, Hideo Fujiwara:
Graph theoretic approach for scan cell reordering to minimize peak shift power. ACM Great Lakes Symposium on VLSI 2010: 73-78 - [c37]Pramod Subramanyan, Virendra Singh, Kewal K. Saluja, Erik Larsson:
Energy-efficient redundant execution for chip multiprocessors. ACM Great Lakes Symposium on VLSI 2010: 143-146 - [e1]Erik Larsson, Aawatif Hayar:
5th International ICST Conference on Cognitive Radio Oriented Wireless Networks and Communications, CROWNCOM 2010, Cannes, France, June 9-11, 2010. ICST / IEEE 2010, ISBN 978-1-4244-5885-1 [contents]
2000 – 2009
- 2009
- [c36]Dan Adolfsson, Joanna Siew, Erik Jan Marinissen, Erik Larsson:
On Scan Chain Diagnosis for Intermittent Faults. Asian Test Symposium 2009: 47-54 - [c35]Mikael Väyrynen, Virendra Singh, Erik Larsson:
Fault-tolerant average execution time optimization for general-purpose multi-processor system-on-chips. DATE 2009: 484-489 - [c34]Jaynarayan T. Tudu, Erik Larsson, Virendra Singh, Vishwani D. Agrawal:
On Minimization of Peak Power for Scan Circuit during Test. ETS 2009: 25-30 - 2008
- [j12]Erik Larsson, Zebo Peng:
A Reconfigurable Power Conscious Core Wrapper and its Application to System-on-Chip Test Scheduling. J. Electron. Test. 24(5): 497-504 (2008) - [j11]Erik Larsson:
Architecture for integrated test data compression and abort-on-fail testing in a multi-site environment. IET Comput. Digit. Tech. 2(4): 275-284 (2008) - [j10]Soheil Samii, Mikko Selkälä, Erik Larsson, Krishnendu Chakrabarty, Zebo Peng:
Cycle-Accurate Test Power Modeling and Its Application to SoC Test Architecture Design and Scheduling. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 27(5): 973-977 (2008) - [c33]Anders Larsson, Xin Zhang, Erik Larsson, Krishnendu Chakrabarty:
Core-Level Compression Technique Selection and SOC Test Architecture Design. ATS 2008: 277-282 - [c32]Anders Larsson, Erik Larsson, Krishnendu Chakrabarty, Petru Eles, Zebo Peng:
Test-Architecture Optimization and Test Scheduling for SOCs with Core-Level Expansion of Compressed Test Patterns. DATE 2008: 188-193 - [c31]Anders Larsson, Xin Zhang, Erik Larsson, Krishnendu Chakrabarty:
SOC Test Optimization with Compression-Technique Selection. ITC 2008: 1 - 2007
- [j9]Erik Larsson, Per Lindahl, Petter Mostad:
HeliCis: a DNA motif discovery tool for colocalized motif pairs with periodic spacing. BMC Bioinform. 8 (2007) - [j8]Erik Larsson, Stina Edbom:
Test data truncation for test quality maximisation under ATE memory depth constraint. IET Comput. Digit. Tech. 1(1): 27-37 (2007) - [c30]Erik Larsson, Jon Persson:
An Architecture for Combined Test Data Compression and Abort-on-Fail Test. ASP-DAC 2007: 726-731 - [c29]Anders Larsson, Erik Larsson, Petru Eles, Zebo Peng:
Optimized integration of test compression and sharing for SOC testing. DATE 2007: 207-212 - [c28]Tobias Dubois, Erik Jan Marinissen, Mohamed Azimane, Paul Wielage, Erik Larsson, Clemens Wouters:
Test quality analysis and improvement for an embedded asynchronous FIFO. DATE 2007: 859-864 - [c27]Anders Larsson, Erik Larsson, Petru Eles, Zebo Peng:
A Heuristic for Concurrent SOC Test Scheduling with Compression and Sharing. DDECS 2007: 61-66 - [c26]Gunnar Carlsson, Johan Holmqvist, Erik Larsson:
Protocol requirements in an SJTAG/IJTAG environment. ITC 2007: 1-9 - [c25]Erik Larsson, Mehdi Amirijoo, Daniel Karlsson, Petru Eles:
What impacts course evaluation? ITiCSE 2007: 333 - 2006
- [j7]Erik Larsson, Zebo Peng:
Power-Aware Test Planning in the Early System-on-Chip Design Exploration Process. IEEE Trans. Computers 55(2): 227-239 (2006) - [j6]Erik Larsson, Hideo Fujiwara:
System-on-chip test scheduling with reconfigurable core wrappers. IEEE Trans. Very Large Scale Integr. Syst. 14(3): 305-309 (2006) - [c24]Soheil Samii, Erik Larsson, Krishnendu Chakrabarty, Zebo Peng:
Cycle-Accurate Test Power Modeling and its Application to SoC Test Scheduling. ITC 2006: 1-10 - 2005
- [j5]Julien Pouget, Erik Larsson, Zebo Peng:
Multiple-Constraint Driven System-on-Chip Test Time Optimization. J. Electron. Test. 21(6): 599-611 (2005) - [j4]Erik Larsson, Julien Pouget, Zebo Peng:
Abort-on-Fail Based Test Scheduling. J. Electron. Test. 21(6): 651-658 (2005) - [c23]Anders Larsson, Erik Larsson, Petru Eles, Zebo Peng:
SOC Test Scheduling with Test Set Sharing and Broadcasting. Asian Test Symposium 2005: 162-169 - [c22]Anders Larsson, Erik Larsson, Petru Eles, Zebo Peng:
Optimization of a Bus-based Test Data Transportation Mechanism in System-on-Chip. DSD 2005: 403-411 - [c21]Urban Ingelsson, Sandeep Kumar Goel, Erik Larsson, Erik Jan Marinissen:
Test scheduling for modular SOCs in an abort-on-fail environment. ETS 2005: 8-13 - [c20]David Bäckström, Gunnar Carlsson, Erik Larsson:
Remote boundary-scan system test control for the ATCA standard. ITC 2005: 10 - [c19]Erik Larsson, Stina Edbom:
Combined Test Data Selection and Scheduling for Test Quality Optimization under ATE Memory Depth Constraint. VLSI-SoC 2005: 221-244 - 2004
- [j3]Erik Larsson, Hideo Fujiwara:
Preemptive System-on-Chip Test Scheduling. IEICE Trans. Inf. Syst. 87-D(3): 620-629 (2004) - [j2]Erik Larsson, Klas Arvidsson, Hideo Fujiwara, Zebo Peng:
Efficient test solutions for core-based designs. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 23(5): 758-775 (2004) - [c18]Stina Edbom, Erik Larsson:
An Integrated Technique for Test Vector Selection and Test Scheduling under Test Time Constraint. Asian Test Symposium 2004: 254-257 - [c17]Erik Larsson:
Integrating Core Selection in the SOC Test Solution Design-Flow. ITC 2004: 1349-1358 - [c16]Erik Larsson, Anders Larsson:
Student-oriented examination in a computer architecture course. ITiCSE 2004: 245 - [c15]Erik Larsson, Julien Pouget, Zebo Peng:
Defect-Aware SOC Test Scheduling. VTS 2004: 361-366 - 2003
- [c14]Erik Larsson, Hideo Fujiwara:
Optimal System-on-Chip Test Scheduling. Asian Test Symposium 2003: 306-311 - [c13]Julien Pouget, Erik Larsson, Zebo Peng:
SOC Test Time Minimization Under Multiple Constraints. Asian Test Symposium 2003: 312-317 - [c12]Anders Larsson, Erik Larsson, Petru Eles, Zebo Peng:
Buffer and Controller Minimisation for Time-Constrained Testing of System-On-Chip. DFT 2003: 385-392 - [c11]Julien Pouget, Erik Larsson, Zebo Peng, Marie-Lise Flottes, Bruno Rouzeyre:
An efficient approach to SoC wrapper design, TAM configuration and test scheduling. ETW 2003: 51-56 - [c10]Erik Larsson, Zebo Peng:
A Reconfigurable Power-Conscious Core Wrapper and its Application to SOC Test Scheduling. ITC 2003: 1135-1144 - [c9]Erik Larsson, Hideo Fujiwara:
Test Resource Partitioning and Optimization for SOC Designs. VTS 2003: 319-324 - 2002
- [j1]Erik Larsson, Zebo Peng:
An Integrated Framework for the Design and Optimization of SOC Test Solutions. J. Electron. Test. 18(4-5): 385-400 (2002) - [c8]Erik Larsson, Klas Arvidsson, Hideo Fujiwara, Zebo Peng:
Integrated Test Scheduling, Test Parallelization and TAMDesign. Asian Test Symposium 2002: 397-404 - [c7]Erik Larsson, Hideo Fujiwara:
Power constrained preemptive TAM scheduling. ETW 2002: 119-126 - 2001
- [c6]Erik Larsson, Zebo Peng:
Test Scheduling and Scan-Chain Division under Power Constraint. Asian Test Symposium 2001: 259-264 - [c5]Erik Larsson, Zebo Peng:
An integrated system-on-chip test framework. DATE 2001: 138-144 - [c4]Erik Larsson, Zebo Peng, Gunnar Carlsson:
The Design and Optimization of SOC Test Solutions. ICCAD 2001: 523-530 - 2000
- [b1]Erik Larsson:
An Integrated System-Level Design for Testability Methodology. Linköping University, Sweden, 2000 - [c3]John Saul, Betsy Black, Erik Larsson:
Helpdesk.Drew.Edu: Home Growing a Helpdesk Solution Using Open-Source Technology. SIGUCCS 2000: 289-293
1990 – 1999
- 1998
- [c2]Sven Fischer, Hans Grubeck, Ari Kangas, Havish Koorapaty, Erik Larsson, Patrik Lundqvist:
Time of arrival estimation of narrowband TDMA signals for mobile positioning. PIMRC 1998: 451-455 - 1997
- [c1]Xinli Gu, Erik Larsson, Krzysztof Kuchcinski, Zebo Peng:
A controller testability analysis and enhancement technique. ED&TC 1997: 153-157
Coauthor Index
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OpenAlex data
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last updated on 2024-10-23 21:28 CEST by the dblp team
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