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2020 – today
- 2022
[j114]Youngkwang Lee, Young-Woo Lee
, Sungyoul Seo, Sungho Kang:
Reduced-Pin-Count BOST for Test-Cost Reduction. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 41(3): 750-761 (2022)- [j113]Sangmin Park, Minho Cheong, Donghyun Han, Sungho Kang:
Herringbone-Based TSV Architecture for Clustered Fault Repair and Aging Recovery. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 41(4): 1142-1153 (2022) - 2021
- [j112]Jaewon Park, Jae Hoon Lee, Sang-Kil Park, Ki Chul Chun, Kyomin Sohn, Sungho Kang:
An In-DRAM BIST for 16 Gb DDR4 DRAM in the 2nd 10-nm-Class DRAM Process. IEEE Access 9: 33487-33497 (2021) - [j111]Hayoung Lee, Hyunggoy Oh, Sungho Kang:
On-Chip Error Detection Reusing Built-In Self-Repair for Silicon Debug. IEEE Access 9: 56443-56456 (2021) - [j110]Donghyun Han, Hayoung Lee, Sungho Kang:
Effective Spare Line Allocation Built-in Redundancy Analysis With Base Common Spare for Yield Improvement of 3D Memory. IEEE Access 9: 76716-76729 (2021) - [j109]Hyungil Woo, Seokjun Jang, Sungho Kang:
A Secure Scan Architecture Protecting Scan Test and Scan Dump Using Skew-Based Lock and Key. IEEE Access 9: 102161-102176 (2021) - [j108]Kwonhyoung Lee, Sangjun Lee, Jongho Park, Inhwan Lee, Sungho Kang:
A Low-Power BIST Scheme Using Weight-Aware Scan Grouping and Scheduling for Automotive ICs. IEEE Access 9: 116115-116132 (2021) - [j107]Seokjun Jang, Jihye Kim, Sungho Kang:
Reconfigurable Scan Architecture for High Diagnostic Resolution. IEEE Access 9: 120537-120550 (2021) - [j106]Donghyun Han, Hayoung Lee, Seungtaek Lee, Sungho Kang:
ECC-Aware Fast and Reliable Pattern Matching Redundancy Analysis for Highly Reliable Memory. IEEE Access 9: 133274-133288 (2021) - [j105]Sangjun Lee, Kyunghwan Cho, Jihye Kim, Jongho Park, Inhwan Lee, Sungho Kang:
Low-Power Scan Correlation-Aware Scan Cluster Reordering for Wireless Sensor Networks. Sensors 21(18): 6111 (2021) - [j104]Jungil Mok, Hyeonchan Lim, Sungho Kang:
Enhanced Postbond Test Architecture for Bridge Defects Between the TSVs. IEEE Trans. Very Large Scale Integr. Syst. 29(6): 1164-1177 (2021) - [c90]Youngkwang Lee, Donghyun Han, Sooryeong Lee, Sungho Kang:
A Circular-based TSV Repair Architecture. ISOCC 2021: 1-2 - [c89]Donghyun Han, Youngkwang Lee, Sooryeong Lee, Sungho Kang:
Hardware Efficient Built-in Self-test Architecture for Power and Ground TSVs in 3D IC. ISOCC 2021: 101-102 - [c88]Sangjun Lee, Jongho Park, Inhwan Lee, Kwonhyoung Lee, Sungho Kang:
Hybrid Test Access Mechanism for Multiple Identical Cores. ISOCC 2021: 365-366 - [c87]Seokjun Jang, Hyungil Woo, Sunghoon Kim, Sungho Kang:
Secure Scan Design through Pseudo Fault Injection. ISOCC 2021: 425-426 - [c86]Younwoo Yoo, Hayoung Lee, Seung Ho Shin, Sungho Kang:
Post-bond Repair of Line Faults with Double-bit ECC for 3D Memory. ISOCC 2021: 427-428 - [c85]Seung Ho Shin, Hayoung Lee, Younwoo Yoo, Sungho Kang:
An Effective Spare Allocation Methodology for 3D Memory Repair with BIRA. ISOCC 2021: 429-430 - [c84]Youngki Moon, Hyunho Yoo, Donghyun Han, Sungho Kang:
Area Efficient Built-In Redundancy Analysis using Pre-Solutions with Various Spare Structure. ISOCC 2021: 431-432 - 2020
- [j103]Jihye Kim, Hayoung Lee, Seokjun Jang, Sungho Kang:
Fine-Grained Defect Diagnosis for CMOL FPGA Circuits. IEEE Access 8: 163140-163151 (2020) - [j102]Sung-Wook Shin, Jung-Hyun Park, Woo-Jin Lee, Sungho Kang, Hyunggun Kim, Sung-Taek Chung:
Analysis of Electroencephalography Signals on the Contents of Cognitive Function Game: Attention and Memory. J. Medical Imaging Health Informatics 10(6): 1452-1458 (2020) - [j101]Hyunyul Lim, Minho Cheong, Sungho Kang:
Scan-Chain-Fault Diagnosis Using Regressions in Cryptographic Chips for Wireless Sensor Networks. Sensors 20(17): 4771 (2020) - [j100]Minho Cheong, Ingeol Lee, Sungho Kang:
A 3-D Rotation-Based Through-Silicon via Redundancy Architecture for Clustering Faults. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 39(9): 1925-1934 (2020) - [j99]Young-Woo Lee, Hyeonchan Lim, Youngkwang Lee, Sungho Kang:
Robust Secure Shield Architecture for Detection and Protection Against Invasive Attacks. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 39(10): 3023-3034 (2020) - [j98]Sangjun Lee, Kyunghwan Cho, Sungki Choi, Sungho Kang:
A New Logic Topology-Based Scan Chain Stitching for Test-Power Reduction. IEEE Trans. Circuits Syst. 67-II(12): 3432-3436 (2020) - [j97]Tae Hyun Kim, Hayoung Lee, Sungho Kang:
GPU-Based Redundancy Analysis Using Concurrent Evaluation. IEEE Trans. Very Large Scale Integr. Syst. 28(3): 805-817 (2020) - [c83]Hayoung Lee, Donghyun Han, Hogyeong Kim, Sungho Kang:
Redundancy Analysis Optimization with Clustered Known Solutions for High Speed Repair. ISOCC 2020: 51-52 - [c82]Hyeonchan Lim, Tae Hyun Kim, Seunghwan Kim, Sungho Kang:
Diagnosis of Scan Chain Faults Based-on Machine-Learning. ISOCC 2020: 57-58 - [c81]Jihye Kim, Hayoung Lee, Seokjun Jang, Hogyeong Kim, Sungho Kang:
Memory-like Defect Diagnosis for CMOL FPGAs. ISOCC 2020: 139-140 - [c80]Hayoung Lee, Keewon Cho, Sungho Kang, Wooheon Kang, Seungtaek Lee, Woosik Jeong:
Fail Memory Configuration Set for RA Estimation. ITC 2020: 1-9 - [c79]Hayoung Lee, Donghyun Han, Hogyeong Kim, Sungho Kang:
W-ERA: One-Time Memory Repair with Wafer-Level Early Repair Analysis for Cost Reduction. ITC-Asia 2020: 94-99
2010 – 2019
- 2019
- [j96]Jaewon Jang, Minho Cheong, Sungho Kang:
TSV Repair Architecture for Clustered Faults. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 38(1): 190-194 (2019) - [j95]Keewon Cho, Young-Woo Lee, Sungyoul Seo, Sungho Kang:
An Efficient BIRA Utilizing Characteristics of Spare Pivot Faults. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 38(3): 551-561 (2019) - [j94]Ingeol Lee, Minho Cheong, Sungho Kang:
Highly Reliable Redundant TSV Architecture for Clustered Faults. IEEE Trans. Reliab. 68(1): 237-247 (2019) - [j93]Jihye Kim, Sangjun Lee, Sungho Kang:
Test-Friendly Data-Selectable Self-Gating (DSSG). IEEE Trans. Very Large Scale Integr. Syst. 27(8): 1972-1976 (2019) - [j92]Hayoung Lee, Donghyun Han, Seungtaek Lee, Sungho Kang:
Dynamic Built-In Redundancy Analysis for Memory Repair. IEEE Trans. Very Large Scale Integr. Syst. 27(10): 2365-2374 (2019) - [c78]Minho Cheng, Hyunyul Lim, Tae Hyun Kim, Sungho Kang:
A Hardware-efficient TSV Repair Scheme Based on Butterfly Topology. ISOCC 2019: 63-64 - [c77]Jihye Kim, Sangjun Lee, Minho Moon, Sungho Kang:
Transition-delay Test Methodology for Designs with Self-gating. ISOCC 2019: 93-94 - [c76]Young-Woo Lee, Youngkwang Lee, Minho Moon, Sungho Kang:
Tunable Compact Probing Detector with Fast Analysis Time Against Invasive Attacks. ISOCC 2019: 115-116 - [c75]Kyunghwan Cho, Jihye Kim, Hyunggoy Oh, Sangjun Lee, Sungho Kang:
A New Scan Chain Reordering Method for Low Power Consumption based on Care Bit Density. ISOCC 2019: 134-135 - [c74]Hayoung Lee, Donghyun Han, Seungtaek Lee, Sungho Kang:
Redundancy Analysis based on Fault Distribution for Memory with Complex Spares. ISOCC 2019: 235-236 - 2018
- [j91]Sungyoul Seo, Keewon Cho, Young-Woo Lee, Sungho Kang:
A Statistic-Based Scan Chain Reordering for Energy-Quality Scalable Scan Test. IEEE J. Emerg. Sel. Topics Circuits Syst. 8(3): 391-403 (2018) - [j90]Inhyuk Choi, Hyunggoy Oh, Young-Woo Lee, Sungho Kang:
Test Resource Reused Debug Scheme to Reduce the Post-Silicon Debug Cost. IEEE Trans. Computers 67(12): 1835-1839 (2018) - [j89]Jaeil Lim, Hyunggoy Oh, Heetae Kim, Sungho Kang:
Thermal Aware Test Scheduling for NTV Circuit. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 37(4): 906-910 (2018) - [j88]Hayoung Lee, Kiwon Cho, Donghyun Kim, Sungho Kang:
Fault Group Pattern Matching With Efficient Early Termination for High-Speed Redundancy Analysis. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 37(7): 1473-1482 (2018) - [j87]Hayoung Lee, Jooyoung Kim, Keewon Cho, Sungho Kang:
Fast Built-In Redundancy Analysis Based on Sequential Spare Line Allocation. IEEE Trans. Reliab. 67(1): 264-273 (2018) - [j86]Donghyun Kim, Hayoung Lee, Sungho Kang:
An Area-Efficient BIRA With 1-D Spare Segments. IEEE Trans. Very Large Scale Integr. Syst. 26(1): 206-210 (2018) - [c73]Hyunggoy Oh, Heetae Kim, Sangjun Lee, Sungho Kang:
Dynamic voltage Drop induced Path Delay Analysis for STV and NTV Circuits during At-speed Scan Test. ISOCC 2018: 7-8 - [c72]Minho Cheong, Ingeol Lee, Sungho Kang:
A Test Methodology for Neural Computing Unit. ISOCC 2018: 11-12 - [c71]Keewon Cho, Young-Woo Lee, Sungyoul Seo, Sungho Kang:
2-D Failure Bitmap Compression Using Line Fault Marking Method. ISOCC 2018: 21-22 - [c70]Hyeonchan Lim, Seokjun Jang, Sungho Kang:
A Software-based Scan Chain Diagnosis for Double Faults in A Scan Chain. ISOCC 2018: 265-266 - [c69]Heetae Kim, Hyunggoy Oh, Sangjun Lee, Sungho Kang:
Low Power Scan Chain Architecture Based on Circuit Topology. ISOCC 2018: 267-268 - [c68]Donghyun Han, Hayoung Lee, Seungtaek Lee, Minho Moon, Sungho Kang:
3D Memory Formed of Unrepairable Memory Dice and Spare Layer. TENCON 2018: 1362-1366 - [c67]Dongsu Lee, Hyunyul Lim, Tae Hyun Kim, Sungho Kang:
Neural Network Reliability Enhancement Approach Using Dropout Underutilization in GPU. TENCON 2018: 2281-2286 - 2017
- [j85]Hyunggoy Oh, Heetae Kim, Jaeil Lim, Sungho Kang:
Reconfigurable scan architecture for test power and data volume reduction. IEICE Electron. Express 14(13): 20170415 (2017) - [j84]Heetae Kim, Hyunggoy Oh, Jaeil Lim, Sungho Kang:
A novel X-filling method for capture power reduction. IEICE Electron. Express 14(23): 20171093 (2017) - [j83]Younsun Kim, Hyunggoy Oh, Sungho Kang:
Proof of Concept of Home IoT Connected Vehicles. Sensors 17(6): 1289 (2017) - [j82]Hyunggoy Oh, Taewoo Han, Inhyuk Choi, Sungho Kang:
An On-Chip Error Detection Method to Reduce the Post-Silicon Debug Time. IEEE Trans. Computers 66(1): 38-44 (2017) - [j81]Hyunggoy Oh, Inhyuk Choi, Sungho Kang:
DRAM-Based Error Detection Method to Reduce the Post-Silicon Debug Time for Multiple Identical Cores. IEEE Trans. Computers 66(9): 1504-1517 (2017) - [j80]Jaeseok Park, Hyunyul Lim, Sungho Kang:
FRESH: A New Test Result Extraction Scheme for Fast TSV Tests. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 36(2): 336-345 (2017) - [j79]Young-Woo Lee, Hyeonchan Lim, Sungho Kang:
Grouping-Based TSV Test Architecture for Resistive Open and Bridge Defects in 3-D-ICs. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 36(10): 1759-1763 (2017) - [j78]Jaeseok Park, Minho Cheong, Sungho Kang:
R2-TSV: A Repairable and Reliable TSV Set Structure Reutilizing Redundancies. IEEE Trans. Reliab. 66(2): 458-466 (2017) - [j77]Jooyoung Kim, Woosung Lee, Keewon Cho, Sungho Kang:
Hardware-Efficient Built-In Redundancy Analysis for Memory With Various Spares. IEEE Trans. Very Large Scale Integr. Syst. 25(3): 844-856 (2017) - [j76]Jaewon Jang, Minho Cheong, Jin-Ho Ahn, Sung Kyu Lim, Sungho Kang:
Chain-Based Approach for Fast Through-Silicon-Via Coupling Delay Estimation. IEEE Trans. Very Large Scale Integr. Syst. 25(3): 1178-1182 (2017) - [c66]Donghyun Han, Hayoung Lee, Donghyun Kim, Sungho Kang:
A new repair scheme for TSV-based 3D memory using base die repair cells. ISOCC 2017: 11-12 - [c65]Hyunyul Lim, Tae Hyun Kim, Dongsu Lee, Sungho Kang:
LARECD: Low area overhead and reliable error correction DMR architecture. ISOCC 2017: 27-28 - [c64]Keewon Cho, Young-Woo Lee, Sungyoul Seo, Sungho Kang:
An efficient built-in self-repair scheme for area reduction. ISOCC 2017: 105-106 - [c63]Hyunggoy Oh, Heetae Kim, Jaeil Lim, Sungho Kang:
A selective error data capture method using on-chip DRAM for silicon debug of multi-core design. ISOCC 2017: 121-122 - [c62]Hyeonchan Lim, Junghwan Kim, Soyeon Kang, Sungho Kang:
Test data reduction method based on berlekamp-massey algorithm. ISOCC 2017: 123-124 - [c61]Sungyoul Seo, Hyeonchan Lim, Soyeon Kang, Sungho Kang:
Off-chip test architecture for improving multi-site testing efficiency using tri-state decoder and 3V-level encoder. ISQED 2017: 191-195 - [c60]Hyeonchan Lim, Sungyoul Seo, Soyeon Kang, Sungho Kang:
Broadcast scan compression based on deterministic pattern generation algorithm. ISQED 2017: 449-453 - [c59]Young-Woo Lee, Inhyuk Choi, Kang-Hoon Oh, James Jinsoo Ko, Sungho Kang:
Test item priority estimation for high parallel test efficiency under ATE debug time constraints. ITC-Asia 2017: 150-154 - 2016
- [j75]Keewon Cho, Wooheon Kang, Hyungjun Cho, Changwook Lee, Sungho Kang:
A Survey of Repair Analysis Algorithms for Memories. ACM Comput. Surv. 49(3): 47:1-47:41 (2016) - [j74]Sungyoul Seo, Yong Lee, Sungho Kang:
Tri-State Coding Using Reconfiguration of Twisted Ring Counter for Test Data Compression. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 35(2): 274-284 (2016) - [j73]Taewoo Han, Inhyuk Choi, Hyunggoy Oh, Sungho Kang:
Parallelized Network-on-Chip-Reused Test Access Mechanism for Multiple Identical Cores. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 35(7): 1219-1223 (2016) - [j72]Wooheon Kang, Changwook Lee, Hyunyul Lim, Sungho Kang:
A New 3-D Fuse Architecture to Improve Yield of 3-D Memories. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 35(10): 1763-1767 (2016) - [j71]Wooheon Kang, Changwook Lee, Hyunyul Lim, Sungho Kang:
Optimized Built-In Self-Repair for Multiple Memories. IEEE Trans. Very Large Scale Integr. Syst. 24(6): 2174-2183 (2016) - [c58]Hyunggoy Oh, Inhyuk Choi, Sungho Kang:
A new online test and debug methodology for automotive camera image processing system. APCCAS 2016: 370-371 - [c57]Inhyuk Choi, Hyunggoy Oh, Sungho Kang:
Test access mechaism for stack test time reduction of 3-dimensional integrated circuit. APCCAS 2016: 522-525 - [c56]Soyeon Kang, Inhyuk Choi, Hyeonchan Lim, Sungyoul Seo, Sungho Kang:
Software-based embedded core test using multi-polynomial for test data reduction. ISOCC 2016: 39-40 - [c55]Keewon Cho, Jooyoung Kim, Hayoung Lee, Sungho Kang:
Discussion of cost-effective redundancy architectures. ISOCC 2016: 97-98 - [c54]Young-Woo Lee, Junghwan Kim, Inhyuk Choi, Sungho Kang:
A TSV test structure for simultaneously detecting resistive open and bridge defects in 3D-ICs. ISOCC 2016: 129-130 - [c53]Tae Hyun Kim, Hyunyul Lim, Sungho Kang:
P-backtracking: A new scan chain diagnosis method with probability. ISOCC 2016: 141-142 - [c52]Heetae Kim, Inhyuk Choi, Jaeil Lim, Hyunggoy Oh, Sungho Kang:
Process variation-aware bridge fault analysis. ISOCC 2016: 147-148 - [c51]Junghwan Kim, Young-Woo Lee, Minho Cheong, Sungyoul Seo, Sungho Kang:
A test methodology to screen scan-path failures. ISOCC 2016: 149-150 - 2015
- [j70]Hyejeong Hong, Jaeil Lim, Hyunyul Lim, Sungho Kang:
Lifetime Reliability Enhancement of Microprocessors: Mitigating the Impact of Negative Bias Temperature Instability. ACM Comput. Surv. 48(1): 9:1-9:25 (2015) - [j69]HyeonUk Son, Jaewon Jang, Heetae Kim, Sungho Kang:
Reduced-code test method using sub-histograms for pipelined ADCs. IEICE Electron. Express 12(12): 20150417 (2015) - [j68]Younsun Kim, Ingeol Lee, Sungho Kang:
Eco Assist Techniques through Real-time Monitoring of BEV Energy Usage Efficiency. Sensors 15(7): 14946-14959 (2015) - [j67]Jaeil Lim, Hyunyul Lim, Sungho Kang:
3-D Stacked DRAM Refresh Management With Guaranteed Data Reliability. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 34(9): 1455-1466 (2015) - [j66]Haksong Kim, Yong Lee, Sungho Kang:
A Novel Massively Parallel Testing Method Using Multi-Root for High Reliability. IEEE Trans. Reliab. 64(1): 486-496 (2015) - [j65]Wooheon Kang, Changwook Lee, Hyunyul Lim, Sungho Kang:
A 3 Dimensional Built-In Self-Repair Scheme for Yield Improvement of 3 Dimensional Memories. IEEE Trans. Reliab. 64(2): 586-595 (2015) - [j64]Taewoo Han, Inhyuk Choi, Sungho Kang:
Majority-Based Test Access Mechanism for Parallel Testing of Multiple Identical Cores. IEEE Trans. Very Large Scale Integr. Syst. 23(8): 1439-1447 (2015) - [c50]Sungyoul Seo, Yong Lee, Hyeonchan Lim, Joohwan Lee, Hongbom Yoo, Yojoung Kim, Sungho Kang:
Scan Chain Reordering-Aware X-Filling and Stitching for Scan Shift Power Reduction. ATS 2015: 1-6 - [c49]Sungyoul Seo, Yong Lee, Joohwan Lee, Sungho Kang:
A scan shifting method based on clock gating of multiple groups for low power scan testing. ISQED 2015: 162-166 - [c48]Hyunyul Lim, Wooheon Kang, Sungyoul Seo, Yong Lee, Sungho Kang:
Low power scan bypass technique with test data reduction. ISQED 2015: 173-176 - [c47]Woosung Lee, Keewon Cho, Jooyoung Kim, Sungho Kang:
Near optimal repair rate built-in redundancy analysis with very small hardware overhead. ISQED 2015: 435-439 - 2014
- [j63]Taewoo Han, Inhyuk Choi, Sungho Kang:
A novel test access mechanism for parallel testing of multi-core system. IEICE Electron. Express 11(6): 20140093 (2014) - [j62]Hyejeong Hong, Jaeil Lim, Sungho Kang:
Recovery-enhancing task scheduling for multicore processors under NBTI impact. IEICE Electron. Express 11(11): 20140324 (2014) - [j61]Changwook Lee, Wooheon Kang, Donkoo Cho, Sungho Kang:
A New Fuse Architecture and a New Post-Share Redundancy Scheme for Yield Enhancement in 3-D-Stacked Memories. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 33(5): 786-797 (2014) - [j60]Hyoyoung Shin, Youngkyu Park, Gihwa Lee, Jungsik Park, Sungho Kang:
Interleaving Test Algorithm for Subthreshold Leakage-Current Defects in DRAM Considering the Equal Bit Line Stress. IEEE Trans. Very Large Scale Integr. Syst. 22(4): 803-812 (2014) - [j59]Wooheon Kang, Hyungjun Cho, Joohwan Lee, Sungho Kang:
A BIRA for Memories With an Optimal Repair Rate Using Spare Memories for Area Reduction. IEEE Trans. Very Large Scale Integr. Syst. 22(11): 2336-2349 (2014) - [j58]Hyungsu Sung, Keewon Cho, Kunsang Yoon, Sungho Kang:
A Delay Test Architecture for TSV With Resistive Open Defects in 3-D Stacked Memories. IEEE Trans. Very Large Scale Integr. Syst. 22(11): 2380-2387 (2014) - [c46]Taewoo Han, Inhyuk Choi, Hyunggoy Oh, Sungho Kang:
A Scalable and Parallel Test Access Strategy for NoC-Based Multicore System. ATS 2014: 81-86 - 2013
- [j57]Hyejeong Hong, Jaeil Lim, Hyunyul Lim, Sungho Kang:
Thermal-aware dynamic voltage frequency scaling for many-core processors under process variations. IEICE Electron. Express 10(14): 20130463 (2013) - [j56]Hyejeong Hong, Jaeil Lim, Hyunyul Lim, Sungho Kang:
Dynamic thermal management for 3D multicore processors under process variations. IEICE Electron. Express 10(23): 20130800 (2013) - [j55]Incheol Kim, Ingeol Lee, Sungho Kang:
Built-In Self-Test for Static ADC Testing with a Triangle-Wave. IEICE Trans. Electron. 96-C(2): 292-294 (2013) - [j54]Hyejeong Hong, Sungho Kang:
Acceleration of Deep Packet Inspection Using a Multi-Byte Processing Prefilter. IEICE Trans. Commun. 96-B(2): 643-646 (2013) - [c45]Wooheon Kang, Changwook Lee, Keewon Cho, Sungho Kang:
A Die Selection and Matching Method with Two Stages for Yield Enhancement of 3-D Memories. Asian Test Symposium 2013: 301-306 - [c44]Inhyuk Choi, Taewoo Han, Sungho Kang:
Bit transmission error correction scheme for FlexRay based automotive communication systems. GCCE 2013: 488-490 - 2012
- [j53]Hyuntae Park, Hyejeong Hong, Sungho Kang:
An efficient IP address lookup algorithm based on a small balanced tree using entry reduction. Comput. Networks 56(1): 231-243 (2012) - [j52]Yoseop Lim, Jaeseok Park, Sungho Kang:
A method for the fast diagnosis of multiple defects using an efficient candidate selection algorithm. IEICE Electron. Express 9(9): 834-839 (2012) - [j51]Yoseop Lim, Jaeseok Park, Sungho Kang:
An accurate diagnosis of transition fault clusters based on single fault simulation. IEICE Electron. Express 9(19): 1528-1533 (2012) - [c43]Jaeseok Park, Ingeol Lee, Young-Seok Park, Sung-Geun Kim, Kyungho Ryu, Dong-Hoon Jung, Kangwook Jo, Choong Keun Lee, Hongil Yoon, Seong-Ook Jung, Woo-Young Choi, Sungho Kang:
Integration of dual channel timing formatter system for high speed memory test equipment. ISOCC 2012: 185-187 - 2011
- [j50]HyeonUk Son, Incheol Kim, Sang-Goog Lee, Jin-Ho Ahn, Jeong-Do Kim, Sungho Kang:
Noise-Tolerant DAC BIST Scheme Using Integral Calculus Approach. IEICE Trans. Electron. 94-C(8): 1344-1347 (2011) - [j49]Hyuntae Park, Hyejeong Hong, Sungho Kang:
An Efficient IP Address Lookup Scheme Using Balanced Binary Search with Minimal Entry and Optimal Prefix Vector. IEICE Trans. Commun. 94-B(11): 3128-3131 (2011) - [j48]Hyunjin Kim, Sungho Kang:
Communication-aware task scheduling and voltage selection for total energy minimization in a multiprocessor system using Ant Colony Optimization. Inf. Sci. 181(18): 3995-4008 (2011) - [j47]