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2020 – today
- 2023
[j126]Youngkwang Lee
, Donghyun Han, Sooryeong Lee, Sungho Kang:
Novel Error-Tolerant Voltage-Divider-Based Through-Silicon-Via Test Architecture. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 42(1): 308-321 (2023)- [j125]Hayoung Lee, Seung Ho Shin, Younwoo Yoo, Sungho Kang:
TRUST: Through-Silicon via Repair Using Switch Matrix Topology. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 42(7): 2377-2390 (2023) - [j124]Sunghoon Kim, Seokjun Jang, Sungho Kang:
Scan Chain Architecture With Data Duplication for Multiple Scan Cell Fault Diagnosis. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 42(8): 2717-2727 (2023) - [j123]Hayoung Lee, Jihye Kim, Jongho Park, Sungho Kang:
STRAIT: Self-Test and Self-Recovery for AI Accelerator. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 42(9): 3092-3104 (2023) - [j122]Yong Lee, Seokjun Jang, Sungho Kang:
Shift Left Quality Management System (QMS) Using a 3-D Matrix Scanning Method on System on a Chip. IEEE Trans. Circuits Syst. II Express Briefs 70(4): 1580-1584 (2023) - [j121]Youngkwang Lee, Donghyun Han, Sungho Kang:
TSV Built-In Self-Repair Architecture for Improving the Yield and Reliability of HBM. IEEE Trans. Very Large Scale Integr. Syst. 31(4): 578-590 (2023) - [i2]YeongHyeon Park, Sungho Kang, Myung Jin Kim, Hyeonho Jeong, Hyunkyu Park, Hyeong-Seok Kim, Juneho Yi:
Neural Network Training Strategy to Enhance Anomaly Detection Performance: A Perspective on Reconstruction Loss Amplification. CoRR abs/2308.14595 (2023) - [i1]YeongHyeon Park, Sungho Kang, Myung Jin Kim, Yeonho Lee, Juneho Yi:
Excision and Recovery: Enhancing Surface Anomaly Detection with Attention-based Single Deterministic Masking. CoRR abs/2310.04010 (2023) - 2022
- [j120]Youngkwang Lee, Young-Woo Lee, Sungyoul Seo, Sungho Kang:
Reduced-Pin-Count BOST for Test-Cost Reduction. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 41(3): 750-761 (2022) - [j119]Sangmin Park, Minho Cheong, Donghyun Han, Sungho Kang:
Herringbone-Based TSV Architecture for Clustered Fault Repair and Aging Recovery. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 41(4): 1142-1153 (2022) - [j118]Hogyeong Kim, Hayoung Lee, Donghyun Han, Sungho Kang:
Multibank Optimized Redundancy Analysis Using Efficient Fault Collection. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 41(8): 2739-2752 (2022) - [j117]Gyungbin Kim, Minho Cheong, Sungho Kang:
SPAR: A New Test-Point Insertion Using Shared Points for Area Overhead Reduction. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 41(11): 4939-4951 (2022) - [j116]Hyeonchan Lim, Hyojoon Yun, Sungho Kang:
A Hybrid Test Scheme for Automotive IC in Multisite Testing. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 41(12): 5671-5680 (2022) - [j115]Hyeonchan Lim, Hyojoon Yun, Sungho Kang:
Scan Cell Modification for Intra Cell-Aware Scan Chain Diagnosis. IEEE Trans. Circuits Syst. II Express Briefs 69(11): 4498-4502 (2022) - [j114]Hayoung Lee, Younwoo Yoo, Seung Ho Shin, Sungho Kang:
ECMO: ECC Architecture Reusing Content-Addressable Memories for Obtaining High Reliability in DRAM. IEEE Trans. Very Large Scale Integr. Syst. 30(6): 781-793 (2022) - [c106]Seung Ho Shin, Hayoung Lee, Sooryeong Lee, Younwoo Yoo, Sungho Kang:
An Improved Early Termination Methodology Using Convolutional Neural Network. ISOCC 2022: 21-22 - [c105]Sooryeong Lee, Hayoung Lee, Younwoo Yoo, Seung Ho Shin, Sungho Kang:
PROG: Per-Row Output Generator for BOST. ISOCC 2022: 23-24 - [c104]Sunghoon Kim, Seokjun Jang, Youngki Moon, Sungho Kang:
Pair-Grouping Scan Chain Architecture for Multiple Scan Cell Fault Diagnosis. ISOCC 2022: 25-26 - [c103]Hayoung Lee, Sooryeong Lee, Younwoo Yoo, Seung Ho Shin, Sungho Kang:
FAME: Fault Address Memory Structure for Repair Time Reduction. ISOCC 2022: 31-32 - [c102]Jongho Park, Sangjun Lee, Inhwan Lee, Sungwhan Park, Sungho Kang:
Correlation Aware Random Pattern Generation for Test Time and Shift Power Reduction of Logic BIST. ISOCC 2022: 53-54 - [c101]Hyeonchan Lim, Hyojoon Yun, Juyong Lee, Sungho Kang:
Cell-Aware Scan Diagnosis Using Partially Synchronous Set and Reset. ISOCC 2022: 121-122 - [c100]Tae Hyun Kim, Hyeonchan Lim, Minho Cheong, Hyojoon Yun, Sungho Kang:
Logic Diagnosis Based on Deep Learning for Multiple Faults. ISOCC 2022: 366-367 - 2021
- [j113]Jaewon Park, Jae Hoon Lee, Sang-Kil Park, Ki Chul Chun, Kyomin Sohn, Sungho Kang:
An In-DRAM BIST for 16 Gb DDR4 DRAM in the 2nd 10-nm-Class DRAM Process. IEEE Access 9: 33487-33497 (2021) - [j112]Hayoung Lee, Hyunggoy Oh, Sungho Kang:
On-Chip Error Detection Reusing Built-In Self-Repair for Silicon Debug. IEEE Access 9: 56443-56456 (2021) - [j111]Donghyun Han, Hayoung Lee, Sungho Kang:
Effective Spare Line Allocation Built-in Redundancy Analysis With Base Common Spare for Yield Improvement of 3D Memory. IEEE Access 9: 76716-76729 (2021) - [j110]Hyungil Woo, Seokjun Jang, Sungho Kang:
A Secure Scan Architecture Protecting Scan Test and Scan Dump Using Skew-Based Lock and Key. IEEE Access 9: 102161-102176 (2021) - [j109]Kwonhyoung Lee, Sangjun Lee, Jongho Park, Inhwan Lee, Sungho Kang:
A Low-Power BIST Scheme Using Weight-Aware Scan Grouping and Scheduling for Automotive ICs. IEEE Access 9: 116115-116132 (2021) - [j108]Seokjun Jang, Jihye Kim, Sungho Kang:
Reconfigurable Scan Architecture for High Diagnostic Resolution. IEEE Access 9: 120537-120550 (2021) - [j107]Donghyun Han, Hayoung Lee, Seungtaek Lee, Sungho Kang:
ECC-Aware Fast and Reliable Pattern Matching Redundancy Analysis for Highly Reliable Memory. IEEE Access 9: 133274-133288 (2021) - [j106]Sangjun Lee, Kyunghwan Cho, Jihye Kim, Jongho Park, Inhwan Lee, Sungho Kang:
Low-Power Scan Correlation-Aware Scan Cluster Reordering for Wireless Sensor Networks. Sensors 21(18): 6111 (2021) - [j105]Jungil Mok, Hyeonchan Lim, Sungho Kang:
Enhanced Postbond Test Architecture for Bridge Defects Between the TSVs. IEEE Trans. Very Large Scale Integr. Syst. 29(6): 1164-1177 (2021) - [c99]Antea Risso, Vageeswar Rajaram, Matilde Maria Pavese, Sungho Kang, Sila Deniz Calisgan, Zhenyun Qian, Matteo Rinaldi:
Long-lasting Leaf Water Stress Detector Based On An Infrared Micromechanical Photoswitch And A Solar Powered Sunlight Digitizer. IEEE SENSORS 2021: 1-4 - [c98]Youngkwang Lee, Donghyun Han, Sooryeong Lee, Sungho Kang:
A Circular-based TSV Repair Architecture. ISOCC 2021: 1-2 - [c97]Donghyun Han, Youngkwang Lee, Sooryeong Lee, Sungho Kang:
Hardware Efficient Built-in Self-test Architecture for Power and Ground TSVs in 3D IC. ISOCC 2021: 101-102 - [c96]Sangjun Lee, Jongho Park, Inhwan Lee, Kwonhyoung Lee, Sungho Kang:
Hybrid Test Access Mechanism for Multiple Identical Cores. ISOCC 2021: 365-366 - [c95]Seokjun Jang, Hyungil Woo, Sunghoon Kim, Sungho Kang:
Secure Scan Design through Pseudo Fault Injection. ISOCC 2021: 425-426 - [c94]Younwoo Yoo, Hayoung Lee, Seung Ho Shin, Sungho Kang:
Post-bond Repair of Line Faults with Double-bit ECC for 3D Memory. ISOCC 2021: 427-428 - [c93]Seung Ho Shin, Hayoung Lee, Younwoo Yoo, Sungho Kang:
An Effective Spare Allocation Methodology for 3D Memory Repair with BIRA. ISOCC 2021: 429-430 - [c92]Youngki Moon, Hyunho Yoo, Donghyun Han, Sungho Kang:
Area Efficient Built-In Redundancy Analysis using Pre-Solutions with Various Spare Structure. ISOCC 2021: 431-432 - 2020
- [j104]Jihye Kim, Hayoung Lee, Seokjun Jang, Sungho Kang:
Fine-Grained Defect Diagnosis for CMOL FPGA Circuits. IEEE Access 8: 163140-163151 (2020) - [j103]Sung-Wook Shin, Jung-Hyun Park, Woo-Jin Lee, Sungho Kang, Hyunggun Kim, Sung-Taek Chung:
Analysis of Electroencephalography Signals on the Contents of Cognitive Function Game: Attention and Memory. J. Medical Imaging Health Informatics 10(6): 1452-1458 (2020) - [j102]Hyunyul Lim, Minho Cheong, Sungho Kang:
Scan-Chain-Fault Diagnosis Using Regressions in Cryptographic Chips for Wireless Sensor Networks. Sensors 20(17): 4771 (2020) - [j101]Minho Cheong, Ingeol Lee, Sungho Kang:
A 3-D Rotation-Based Through-Silicon via Redundancy Architecture for Clustering Faults. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 39(9): 1925-1934 (2020) - [j100]Young-Woo Lee, Hyeonchan Lim, Youngkwang Lee, Sungho Kang:
Robust Secure Shield Architecture for Detection and Protection Against Invasive Attacks. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 39(10): 3023-3034 (2020) - [j99]Sangjun Lee, Kyunghwan Cho, Sungki Choi, Sungho Kang:
A New Logic Topology-Based Scan Chain Stitching for Test-Power Reduction. IEEE Trans. Circuits Syst. 67-II(12): 3432-3436 (2020) - [j98]Tae Hyun Kim, Hayoung Lee, Sungho Kang:
GPU-Based Redundancy Analysis Using Concurrent Evaluation. IEEE Trans. Very Large Scale Integr. Syst. 28(3): 805-817 (2020) - [c91]Hayoung Lee, Donghyun Han, Hogyeong Kim, Sungho Kang:
Redundancy Analysis Optimization with Clustered Known Solutions for High Speed Repair. ISOCC 2020: 51-52 - [c90]Hyeonchan Lim, Tae Hyun Kim, Seunghwan Kim, Sungho Kang:
Diagnosis of Scan Chain Faults Based-on Machine-Learning. ISOCC 2020: 57-58 - [c89]Jihye Kim, Hayoung Lee, Seokjun Jang, Hogyeong Kim, Sungho Kang:
Memory-like Defect Diagnosis for CMOL FPGAs. ISOCC 2020: 139-140 - [c88]Hayoung Lee, Keewon Cho, Sungho Kang, Wooheon Kang, Seungtaek Lee, Woosik Jeong:
Fail Memory Configuration Set for RA Estimation. ITC 2020: 1-9 - [c87]Hayoung Lee, Donghyun Han, Hogyeong Kim, Sungho Kang:
W-ERA: One-Time Memory Repair with Wafer-Level Early Repair Analysis for Cost Reduction. ITC-Asia 2020: 94-99
2010 – 2019
- 2019
- [j97]Jaewon Jang, Minho Cheong, Sungho Kang:
TSV Repair Architecture for Clustered Faults. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 38(1): 190-194 (2019) - [j96]Keewon Cho, Young-Woo Lee, Sungyoul Seo, Sungho Kang:
An Efficient BIRA Utilizing Characteristics of Spare Pivot Faults. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 38(3): 551-561 (2019) - [j95]Ingeol Lee, Minho Cheong, Sungho Kang:
Highly Reliable Redundant TSV Architecture for Clustered Faults. IEEE Trans. Reliab. 68(1): 237-247 (2019) - [j94]Jihye Kim, Sangjun Lee, Sungho Kang:
Test-Friendly Data-Selectable Self-Gating (DSSG). IEEE Trans. Very Large Scale Integr. Syst. 27(8): 1972-1976 (2019) - [j93]Hayoung Lee, Donghyun Han, Seungtaek Lee, Sungho Kang:
Dynamic Built-In Redundancy Analysis for Memory Repair. IEEE Trans. Very Large Scale Integr. Syst. 27(10): 2365-2374 (2019) - [c86]Sila Deniz Calisgan, Vageeswar Rajaram, Zhenyun Qian, Sungho Kang, Antea Risso, Matteo Rinaldi:
Zero-Power Chemical Sensor Based on a Polymer/Metal Micromechanical Switch. IEEE SENSORS 2019: 1-4 - [c85]Minho Cheng, Hyunyul Lim, Tae Hyun Kim, Sungho Kang:
A Hardware-efficient TSV Repair Scheme Based on Butterfly Topology. ISOCC 2019: 63-64 - [c84]Jihye Kim, Sangjun Lee, Minho Moon, Sungho Kang:
Transition-delay Test Methodology for Designs with Self-gating. ISOCC 2019: 93-94 - [c83]Young-Woo Lee, Youngkwang Lee, Minho Moon, Sungho Kang:
Tunable Compact Probing Detector with Fast Analysis Time Against Invasive Attacks. ISOCC 2019: 115-116 - [c82]Kyunghwan Cho, Jihye Kim, Hyunggoy Oh, Sangjun Lee, Sungho Kang:
A New Scan Chain Reordering Method for Low Power Consumption based on Care Bit Density. ISOCC 2019: 134-135 - [c81]Hayoung Lee, Donghyun Han, Seungtaek Lee, Sungho Kang:
Redundancy Analysis based on Fault Distribution for Memory with Complex Spares. ISOCC 2019: 235-236 - 2018
- [j92]Sungyoul Seo, Keewon Cho, Young-Woo Lee, Sungho Kang:
A Statistic-Based Scan Chain Reordering for Energy-Quality Scalable Scan Test. IEEE J. Emerg. Sel. Topics Circuits Syst. 8(3): 391-403 (2018) - [j91]Inhyuk Choi, Hyunggoy Oh, Young-Woo Lee, Sungho Kang:
Test Resource Reused Debug Scheme to Reduce the Post-Silicon Debug Cost. IEEE Trans. Computers 67(12): 1835-1839 (2018) - [j90]Jaeil Lim, Hyunggoy Oh, Heetae Kim, Sungho Kang:
Thermal Aware Test Scheduling for NTV Circuit. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 37(4): 906-910 (2018) - [j89]Hayoung Lee, Kiwon Cho, Donghyun Kim, Sungho Kang:
Fault Group Pattern Matching With Efficient Early Termination for High-Speed Redundancy Analysis. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 37(7): 1473-1482 (2018) - [j88]Hayoung Lee, Jooyoung Kim, Keewon Cho, Sungho Kang:
Fast Built-In Redundancy Analysis Based on Sequential Spare Line Allocation. IEEE Trans. Reliab. 67(1): 264-273 (2018) - [j87]Donghyun Kim, Hayoung Lee, Sungho Kang:
An Area-Efficient BIRA With 1-D Spare Segments. IEEE Trans. Very Large Scale Integr. Syst. 26(1): 206-210 (2018) - [c80]Sila Deniz Calisgan, Vladimir Villanueva-Lopez, Vageeswar Rajaram, Zhenyun Qian, Sungho Kang, Samuel P. Hernandez-Rivera, Matteo Rinaldi:
Spectroscopic Chemical Sensing Based on Narrowband MEMS Resonant Infrared Detectors. IEEE SENSORS 2018: 1-4 - [c79]Vageeswar Rajaram, Zhenyun Qian, Sungho Kang, Sila Deniz Calisgan, Nicol E. McGruer, Matteo Rinaldi:
A False Alarm-Free Zero-Power Micromechanical Photoswitch. IEEE SENSORS 2018: 1-4 - [c78]Hyunggoy Oh, Heetae Kim, Sangjun Lee, Sungho Kang:
Dynamic voltage Drop induced Path Delay Analysis for STV and NTV Circuits during At-speed Scan Test. ISOCC 2018: 7-8 - [c77]Minho Cheong, Ingeol Lee, Sungho Kang:
A Test Methodology for Neural Computing Unit. ISOCC 2018: 11-12 - [c76]Keewon Cho, Young-Woo Lee, Sungyoul Seo, Sungho Kang:
2-D Failure Bitmap Compression Using Line Fault Marking Method. ISOCC 2018: 21-22 - [c75]Hyeonchan Lim, Seokjun Jang, Sungho Kang:
A Software-based Scan Chain Diagnosis for Double Faults in A Scan Chain. ISOCC 2018: 265-266 - [c74]Heetae Kim, Hyunggoy Oh, Sangjun Lee, Sungho Kang:
Low Power Scan Chain Architecture Based on Circuit Topology. ISOCC 2018: 267-268 - [c73]Donghyun Han, Hayoung Lee, Seungtaek Lee, Minho Moon, Sungho Kang:
3D Memory Formed of Unrepairable Memory Dice and Spare Layer. TENCON 2018: 1362-1366 - [c72]Dongsu Lee, Hyunyul Lim, Tae Hyun Kim, Sungho Kang:
Neural Network Reliability Enhancement Approach Using Dropout Underutilization in GPU. TENCON 2018: 2281-2286 - 2017
- [j86]Hyunggoy Oh, Heetae Kim, Jaeil Lim, Sungho Kang:
Reconfigurable scan architecture for test power and data volume reduction. IEICE Electron. Express 14(13): 20170415 (2017) - [j85]Heetae Kim, Hyunggoy Oh, Jaeil Lim, Sungho Kang:
A novel X-filling method for capture power reduction. IEICE Electron. Express 14(23): 20171093 (2017) - [j84]Younsun Kim, Hyunggoy Oh, Sungho Kang:
Proof of Concept of Home IoT Connected Vehicles. Sensors 17(6): 1289 (2017) - [j83]Hyunggoy Oh, Taewoo Han, Inhyuk Choi, Sungho Kang:
An On-Chip Error Detection Method to Reduce the Post-Silicon Debug Time. IEEE Trans. Computers 66(1): 38-44 (2017) - [j82]Hyunggoy Oh, Inhyuk Choi, Sungho Kang:
DRAM-Based Error Detection Method to Reduce the Post-Silicon Debug Time for Multiple Identical Cores. IEEE Trans. Computers 66(9): 1504-1517 (2017) - [j81]Jaeseok Park, Hyunyul Lim, Sungho Kang:
FRESH: A New Test Result Extraction Scheme for Fast TSV Tests. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 36(2): 336-345 (2017) - [j80]Young-Woo Lee, Hyeonchan Lim, Sungho Kang:
Grouping-Based TSV Test Architecture for Resistive Open and Bridge Defects in 3-D-ICs. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 36(10): 1759-1763 (2017) - [j79]Jaeseok Park, Minho Cheong, Sungho Kang:
R2-TSV: A Repairable and Reliable TSV Set Structure Reutilizing Redundancies. IEEE Trans. Reliab. 66(2): 458-466 (2017) - [j78]Jooyoung Kim, Woosung Lee, Keewon Cho, Sungho Kang:
Hardware-Efficient Built-In Redundancy Analysis for Memory With Various Spares. IEEE Trans. Very Large Scale Integr. Syst. 25(3): 844-856 (2017) - [j77]Jaewon Jang, Minho Cheong, Jin-Ho Ahn, Sung Kyu Lim, Sungho Kang:
Chain-Based Approach for Fast Through-Silicon-Via Coupling Delay Estimation. IEEE Trans. Very Large Scale Integr. Syst. 25(3): 1178-1182 (2017) - [c71]Vageeswar Rajaram, Zhenyun Qian, Sungho Kang, Nicol E. McGruer, Matteo Rinaldi:
Threshold scaling of near-zero power micromechanical photoswitches using bias voltage. IEEE SENSORS 2017: 1-3 - [c70]Donghyun Han, Hayoung Lee, Donghyun Kim, Sungho Kang:
A new repair scheme for TSV-based 3D memory using base die repair cells. ISOCC 2017: 11-12 - [c69]Hyunyul Lim, Tae Hyun Kim, Dongsu Lee, Sungho Kang:
LARECD: Low area overhead and reliable error correction DMR architecture. ISOCC 2017: 27-28 - [c68]Keewon Cho, Young-Woo Lee, Sungyoul Seo, Sungho Kang:
An efficient built-in self-repair scheme for area reduction. ISOCC 2017: 105-106 - [c67]Hyunggoy Oh, Heetae Kim, Jaeil Lim, Sungho Kang:
A selective error data capture method using on-chip DRAM for silicon debug of multi-core design. ISOCC 2017: 121-122 - [c66]Hyeonchan Lim, Junghwan Kim, Soyeon Kang, Sungho Kang:
Test data reduction method based on berlekamp-massey algorithm. ISOCC 2017: 123-124 - [c65]Sungyoul Seo, Hyeonchan Lim, Soyeon Kang, Sungho Kang:
Off-chip test architecture for improving multi-site testing efficiency using tri-state decoder and 3V-level encoder. ISQED 2017: 191-195 - [c64]Hyeonchan Lim, Sungyoul Seo, Soyeon Kang, Sungho Kang:
Broadcast scan compression based on deterministic pattern generation algorithm. ISQED 2017: 449-453 - [c63]Young-Woo Lee, Inhyuk Choi, Kang-Hoon Oh, James Jinsoo Ko, Sungho Kang:
Test item priority estimation for high parallel test efficiency under ATE debug time constraints. ITC-Asia 2017: 150-154 - 2016
- [j76]Keewon Cho, Wooheon Kang, Hyungjun Cho, Changwook Lee, Sungho Kang:
A Survey of Repair Analysis Algorithms for Memories. ACM Comput. Surv. 49(3): 47:1-47:41 (2016) - [j75]Sungyoul Seo, Yong Lee, Sungho Kang:
Tri-State Coding Using Reconfiguration of Twisted Ring Counter for Test Data Compression. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 35(2): 274-284 (2016) - [j74]Taewoo Han, Inhyuk Choi, Hyunggoy Oh, Sungho Kang:
Parallelized Network-on-Chip-Reused Test Access Mechanism for Multiple Identical Cores. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 35(7): 1219-1223 (2016) - [j73]Wooheon Kang, Changwook Lee, Hyunyul Lim, Sungho Kang:
A New 3-D Fuse Architecture to Improve Yield of 3-D Memories. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 35(10): 1763-1767 (2016) - [j72]Wooheon Kang, Changwook Lee, Hyunyul Lim, Sungho Kang:
Optimized Built-In Self-Repair for Multiple Memories. IEEE Trans. Very Large Scale Integr. Syst. 24(6): 2174-2183 (2016) - [c62]Hyunggoy Oh, Inhyuk Choi, Sungho Kang:
A new online test and debug methodology for automotive camera image processing system. APCCAS 2016: 370-371 - [c61]Inhyuk Choi, Hyunggoy Oh, Sungho Kang:
Test access mechaism for stack test time reduction of 3-dimensional integrated circuit. APCCAS 2016: 522-525 - [c60]Zhenyun Qian, Sungho Kang, Vageeswar Rajaram, Matteo Rinaldi:
Narrowband MEMS resonant infrared detectors based on ultrathin perfect plasmonic absorbers. IEEE SENSORS 2016: 1-3 - [c59]Soyeon Kang, Inhyuk Choi, Hyeonchan Lim, Sungyoul Seo, Sungho Kang:
Software-based embedded core test using multi-polynomial for test data reduction. ISOCC 2016: 39-40 - [c58]Keewon Cho, Jooyoung Kim, Hayoung Lee, Sungho Kang:
Discussion of cost-effective redundancy architectures. ISOCC 2016: 97-98 - [c57]Young-Woo Lee, Junghwan Kim, Inhyuk Choi, Sungho Kang:
A TSV test structure for simultaneously detecting resistive open and bridge defects in 3D-ICs. ISOCC 2016: 129-130 - [c56]Tae Hyun Kim, Hyunyul Lim, Sungho Kang:
P-backtracking: A new scan chain diagnosis method with probability. ISOCC 2016: 141-142 - [c55]Heetae Kim, Inhyuk Choi, Jaeil Lim, Hyunggoy Oh, Sungho Kang:
Process variation-aware bridge fault analysis. ISOCC 2016: 147-148 - [c54]Junghwan Kim, Young-Woo Lee, Minho Cheong, Sungyoul Seo, Sungho Kang:
A test methodology to screen scan-path failures. ISOCC 2016: 149-150 - 2015
- [j71]