Google
Google Scholar
Semantic Scholar
MS Academic
CiteSeerX
ORCIDSungho Kang
Refine list
refinements active!
zoomed in on ?? of ?? records
view refined list in
export refined list as
showing all ?? records
2020 – today
- 2020
[j102]Jihye Kim
, Hayoung Lee, Seokjun Jang, Sungho Kang:
Fine-Grained Defect Diagnosis for CMOL FPGA Circuits. IEEE Access 8: 163140-163151 (2020)- [j101]Hyunyul Lim, Minho Cheong, Sungho Kang:
Scan-Chain-Fault Diagnosis Using Regressions in Cryptographic Chips for Wireless Sensor Networks. Sensors 20(17): 4771 (2020) - [j100]Minho Cheong, Ingeol Lee, Sungho Kang:
A 3-D Rotation-Based Through-Silicon via Redundancy Architecture for Clustering Faults. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 39(9): 1925-1934 (2020) - [j99]Young-Woo Lee, Hyeonchan Lim, Youngkwang Lee, Sungho Kang:
Robust Secure Shield Architecture for Detection and Protection Against Invasive Attacks. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 39(10): 3023-3034 (2020) - [j98]Sangjun Lee, Kyunghwan Cho, Sungki Choi, Sungho Kang:
A New Logic Topology-Based Scan Chain Stitching for Test-Power Reduction. IEEE Trans. Circuits Syst. 67-II(12): 3432-3436 (2020) - [j97]Tae Hyun Kim, Hayoung Lee, Sungho Kang:
GPU-Based Redundancy Analysis Using Concurrent Evaluation. IEEE Trans. Very Large Scale Integr. Syst. 28(3): 805-817 (2020) - [c79]Hayoung Lee, Donghyun Han, Hogyeong Kim, Sungho Kang:
W-ERA: One-Time Memory Repair with Wafer-Level Early Repair Analysis for Cost Reduction. ITC-Asia 2020: 94-99
2010 – 2019
- 2019
- [j96]Jaewon Jang, Minho Cheong, Sungho Kang:
TSV Repair Architecture for Clustered Faults. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 38(1): 190-194 (2019) - [j95]Keewon Cho, Young-Woo Lee, Sungyoul Seo, Sungho Kang:
An Efficient BIRA Utilizing Characteristics of Spare Pivot Faults. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 38(3): 551-561 (2019) - [j94]Ingeol Lee, Minho Cheong, Sungho Kang:
Highly Reliable Redundant TSV Architecture for Clustered Faults. IEEE Trans. Reliab. 68(1): 237-247 (2019) - [j93]Jihye Kim, Sangjun Lee, Sungho Kang:
Test-Friendly Data-Selectable Self-Gating (DSSG). IEEE Trans. Very Large Scale Integr. Syst. 27(8): 1972-1976 (2019) - [j92]Hayoung Lee, Donghyun Han, Seungtaek Lee, Sungho Kang:
Dynamic Built-In Redundancy Analysis for Memory Repair. IEEE Trans. Very Large Scale Integr. Syst. 27(10): 2365-2374 (2019) - [c78]Minho Cheng, Hyunyul Lim, Tae Hyun Kim, Sungho Kang:
A Hardware-efficient TSV Repair Scheme Based on Butterfly Topology. ISOCC 2019: 63-64 - [c77]Jihye Kim, Sangjun Lee, Minho Moon, Sungho Kang:
Transition-delay Test Methodology for Designs with Self-gating. ISOCC 2019: 93-94 - [c76]Young-Woo Lee, Youngkwang Lee, Minho Moon, Sungho Kang:
Tunable Compact Probing Detector with Fast Analysis Time Against Invasive Attacks. ISOCC 2019: 115-116 - [c75]Kyunghwan Cho, Jihye Kim, Hyunggoy Oh, Sangjun Lee, Sungho Kang:
A New Scan Chain Reordering Method for Low Power Consumption based on Care Bit Density. ISOCC 2019: 134-135 - [c74]Hayoung Lee, Donghyun Han, Seungtaek Lee, Sungho Kang:
Redundancy Analysis based on Fault Distribution for Memory with Complex Spares. ISOCC 2019: 235-236 - 2018
- [j91]Sungyoul Seo, Keewon Cho, Young-Woo Lee, Sungho Kang:
A Statistic-Based Scan Chain Reordering for Energy-Quality Scalable Scan Test. IEEE J. Emerg. Sel. Topics Circuits Syst. 8(3): 391-403 (2018) - [j90]Inhyuk Choi, Hyunggoy Oh, Young-Woo Lee, Sungho Kang:
Test Resource Reused Debug Scheme to Reduce the Post-Silicon Debug Cost. IEEE Trans. Computers 67(12): 1835-1839 (2018) - [j89]Jaeil Lim, Hyunggoy Oh, Heetae Kim, Sungho Kang:
Thermal Aware Test Scheduling for NTV Circuit. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 37(4): 906-910 (2018) - [j88]Hayoung Lee, Kiwon Cho, Donghyun Kim, Sungho Kang:
Fault Group Pattern Matching With Efficient Early Termination for High-Speed Redundancy Analysis. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 37(7): 1473-1482 (2018) - [j87]Hayoung Lee, Jooyoung Kim, Keewon Cho, Sungho Kang:
Fast Built-In Redundancy Analysis Based on Sequential Spare Line Allocation. IEEE Trans. Reliab. 67(1): 264-273 (2018) - [j86]Donghyun Kim, Hayoung Lee, Sungho Kang:
An Area-Efficient BIRA With 1-D Spare Segments. IEEE Trans. Very Large Scale Integr. Syst. 26(1): 206-210 (2018) - [c73]Hyunggoy Oh, Heetae Kim, Sangjun Lee, Sungho Kang:
Dynamic voltage Drop induced Path Delay Analysis for STV and NTV Circuits during At-speed Scan Test. ISOCC 2018: 7-8 - [c72]Minho Cheong, Ingeol Lee, Sungho Kang:
A Test Methodology for Neural Computing Unit. ISOCC 2018: 11-12 - [c71]Keewon Cho, Young-Woo Lee, Sungyoul Seo, Sungho Kang:
2-D Failure Bitmap Compression Using Line Fault Marking Method. ISOCC 2018: 21-22 - [c70]Hyeonchan Lim, Seokjun Jang, Sungho Kang:
A Software-based Scan Chain Diagnosis for Double Faults in A Scan Chain. ISOCC 2018: 265-266 - [c69]Heetae Kim, Hyunggoy Oh, Sangjun Lee, Sungho Kang:
Low Power Scan Chain Architecture Based on Circuit Topology. ISOCC 2018: 267-268 - [c68]Donghyun Han, Hayoung Lee, Seungtaek Lee, Minho Moon, Sungho Kang:
3D Memory Formed of Unrepairable Memory Dice and Spare Layer. TENCON 2018: 1362-1366 - [c67]Dongsu Lee, Hyunyul Lim, Tae Hyun Kim, Sungho Kang:
Neural Network Reliability Enhancement Approach Using Dropout Underutilization in GPU. TENCON 2018: 2281-2286 - 2017
- [j85]Hyunggoy Oh, Heetae Kim, Jaeil Lim, Sungho Kang:
Reconfigurable scan architecture for test power and data volume reduction. IEICE Electron. Express 14(13): 20170415 (2017) - [j84]Heetae Kim, Hyunggoy Oh, Jaeil Lim, Sungho Kang:
A novel X-filling method for capture power reduction. IEICE Electron. Express 14(23): 20171093 (2017) - [j83]Younsun Kim, Hyunggoy Oh, Sungho Kang:
Proof of Concept of Home IoT Connected Vehicles. Sensors 17(6): 1289 (2017) - [j82]Hyunggoy Oh, Taewoo Han, Inhyuk Choi, Sungho Kang:
An On-Chip Error Detection Method to Reduce the Post-Silicon Debug Time. IEEE Trans. Computers 66(1): 38-44 (2017) - [j81]Hyunggoy Oh, Inhyuk Choi, Sungho Kang:
DRAM-Based Error Detection Method to Reduce the Post-Silicon Debug Time for Multiple Identical Cores. IEEE Trans. Computers 66(9): 1504-1517 (2017) - [j80]Jaeseok Park, Hyunyul Lim, Sungho Kang:
FRESH: A New Test Result Extraction Scheme for Fast TSV Tests. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 36(2): 336-345 (2017) - [j79]Young-Woo Lee, Hyeonchan Lim, Sungho Kang:
Grouping-Based TSV Test Architecture for Resistive Open and Bridge Defects in 3-D-ICs. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 36(10): 1759-1763 (2017) - [j78]Jaeseok Park, Minho Cheong, Sungho Kang:
R2-TSV: A Repairable and Reliable TSV Set Structure Reutilizing Redundancies. IEEE Trans. Reliab. 66(2): 458-466 (2017) - [j77]Jooyoung Kim, Woosung Lee, Keewon Cho, Sungho Kang:
Hardware-Efficient Built-In Redundancy Analysis for Memory With Various Spares. IEEE Trans. Very Large Scale Integr. Syst. 25(3): 844-856 (2017) - [j76]Jaewon Jang, Minho Cheong, Jin-Ho Ahn, Sung Kyu Lim, Sungho Kang:
Chain-Based Approach for Fast Through-Silicon-Via Coupling Delay Estimation. IEEE Trans. Very Large Scale Integr. Syst. 25(3): 1178-1182 (2017) - [c66]Donghyun Han, Hayoung Lee, Donghyun Kim, Sungho Kang:
A new repair scheme for TSV-based 3D memory using base die repair cells. ISOCC 2017: 11-12 - [c65]Hyunyul Lim, Tae Hyun Kim, Dongsu Lee, Sungho Kang:
LARECD: Low area overhead and reliable error correction DMR architecture. ISOCC 2017: 27-28 - [c64]Keewon Cho, Young-Woo Lee, Sungyoul Seo, Sungho Kang:
An efficient built-in self-repair scheme for area reduction. ISOCC 2017: 105-106 - [c63]Hyunggoy Oh, Heetae Kim, Jaeil Lim, Sungho Kang:
A selective error data capture method using on-chip DRAM for silicon debug of multi-core design. ISOCC 2017: 121-122 - [c62]Hyeonchan Lim, Junghwan Kim, Soyeon Kang, Sungho Kang:
Test data reduction method based on berlekamp-massey algorithm. ISOCC 2017: 123-124 - [c61]Sungyoul Seo, Hyeonchan Lim, Soyeon Kang, Sungho Kang:
Off-chip test architecture for improving multi-site testing efficiency using tri-state decoder and 3V-level encoder. ISQED 2017: 191-195 - [c60]Hyeonchan Lim, Sungyoul Seo, Soyeon Kang, Sungho Kang:
Broadcast scan compression based on deterministic pattern generation algorithm. ISQED 2017: 449-453 - [c59]Young-Woo Lee, Inhyuk Choi, Kang-Hoon Oh, James Jinsoo Ko, Sungho Kang:
Test item priority estimation for high parallel test efficiency under ATE debug time constraints. ITC-Asia 2017: 150-154 - 2016
- [j75]Keewon Cho, Wooheon Kang, Hyungjun Cho, Changwook Lee, Sungho Kang:
A Survey of Repair Analysis Algorithms for Memories. ACM Comput. Surv. 49(3): 47:1-47:41 (2016) - [j74]Sungyoul Seo, Yong Lee, Sungho Kang:
Tri-State Coding Using Reconfiguration of Twisted Ring Counter for Test Data Compression. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 35(2): 274-284 (2016) - [j73]Taewoo Han, Inhyuk Choi, Hyunggoy Oh, Sungho Kang:
Parallelized Network-on-Chip-Reused Test Access Mechanism for Multiple Identical Cores. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 35(7): 1219-1223 (2016) - [j72]Wooheon Kang, Changwook Lee, Hyunyul Lim, Sungho Kang:
A New 3-D Fuse Architecture to Improve Yield of 3-D Memories. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 35(10): 1763-1767 (2016) - [j71]Wooheon Kang, Changwook Lee, Hyunyul Lim, Sungho Kang:
Optimized Built-In Self-Repair for Multiple Memories. IEEE Trans. Very Large Scale Integr. Syst. 24(6): 2174-2183 (2016) - [c58]Hyunggoy Oh, Inhyuk Choi, Sungho Kang:
A new online test and debug methodology for automotive camera image processing system. APCCAS 2016: 370-371 - [c57]Inhyuk Choi, Hyunggoy Oh, Sungho Kang:
Test access mechaism for stack test time reduction of 3-dimensional integrated circuit. APCCAS 2016: 522-525 - [c56]Soyeon Kang, Inhyuk Choi, Hyeonchan Lim, Sungyoul Seo, Sungho Kang:
Software-based embedded core test using multi-polynomial for test data reduction. ISOCC 2016: 39-40 - [c55]Keewon Cho, Jooyoung Kim, Hayoung Lee, Sungho Kang:
Discussion of cost-effective redundancy architectures. ISOCC 2016: 97-98 - [c54]Young-Woo Lee, Junghwan Kim, Inhyuk Choi, Sungho Kang:
A TSV test structure for simultaneously detecting resistive open and bridge defects in 3D-ICs. ISOCC 2016: 129-130 - [c53]Tae Hyun Kim, Hyunyul Lim, Sungho Kang:
P-backtracking: A new scan chain diagnosis method with probability. ISOCC 2016: 141-142 - [c52]Heetae Kim, Inhyuk Choi, Jaeil Lim, Hyunggoy Oh, Sungho Kang:
Process variation-aware bridge fault analysis. ISOCC 2016: 147-148 - [c51]Junghwan Kim, Young-Woo Lee, Minho Cheong, Sungyoul Seo, Sungho Kang:
A test methodology to screen scan-path failures. ISOCC 2016: 149-150 - 2015
- [j70]Hyejeong Hong, Jaeil Lim, Hyunyul Lim, Sungho Kang:
Lifetime Reliability Enhancement of Microprocessors: Mitigating the Impact of Negative Bias Temperature Instability. ACM Comput. Surv. 48(1): 9:1-9:25 (2015) - [j69]HyeonUk Son, Jaewon Jang, Heetae Kim, Sungho Kang:
Reduced-code test method using sub-histograms for pipelined ADCs. IEICE Electron. Express 12(12): 20150417 (2015) - [j68]YounSun Kim, Ingeol Lee, Sungho Kang:
Eco Assist Techniques through Real-time Monitoring of BEV Energy Usage Efficiency. Sensors 15(7): 14946-14959 (2015) - [j67]Jaeil Lim, Hyunyul Lim, Sungho Kang:
3-D Stacked DRAM Refresh Management With Guaranteed Data Reliability. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 34(9): 1455-1466 (2015) - [j66]Haksong Kim, Yong Lee, Sungho Kang:
A Novel Massively Parallel Testing Method Using Multi-Root for High Reliability. IEEE Trans. Reliab. 64(1): 486-496 (2015) - [j65]Wooheon Kang, Changwook Lee, Hyunyul Lim, Sungho Kang:
A 3 Dimensional Built-In Self-Repair Scheme for Yield Improvement of 3 Dimensional Memories. IEEE Trans. Reliab. 64(2): 586-595 (2015) - [j64]Taewoo Han, Inhyuk Choi, Sungho Kang:
Majority-Based Test Access Mechanism for Parallel Testing of Multiple Identical Cores. IEEE Trans. Very Large Scale Integr. Syst. 23(8): 1439-1447 (2015) - [c50]Sungyoul Seo, Yong Lee, Hyeonchan Lim, Joohwan Lee, Hongbom Yoo, Yojoung Kim, Sungho Kang:
Scan Chain Reordering-Aware X-Filling and Stitching for Scan Shift Power Reduction. ATS 2015: 1-6 - [c49]Sungyoul Seo, Yong Lee, Joohwan Lee, Sungho Kang:
A scan shifting method based on clock gating of multiple groups for low power scan testing. ISQED 2015: 162-166 - [c48]Hyunyul Lim, Wooheon Kang, Sungyoul Seo, Yong Lee, Sungho Kang:
Low power scan bypass technique with test data reduction. ISQED 2015: 173-176 - [c47]Woosung Lee, Keewon Cho, Jooyoung Kim, Sungho Kang:
Near optimal repair rate built-in redundancy analysis with very small hardware overhead. ISQED 2015: 435-439 - 2014
- [j63]Taewoo Han, Inhyuk Choi, Sungho Kang:
A novel test access mechanism for parallel testing of multi-core system. IEICE Electron. Express 11(6): 20140093 (2014) - [j62]Hyejeong Hong, Jaeil Lim, Sungho Kang:
Recovery-enhancing task scheduling for multicore processors under NBTI impact. IEICE Electron. Express 11(11): 20140324 (2014) - [j61]Changwook Lee, Wooheon Kang, Donkoo Cho, Sungho Kang:
A New Fuse Architecture and a New Post-Share Redundancy Scheme for Yield Enhancement in 3-D-Stacked Memories. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 33(5): 786-797 (2014) - [j60]Hyoyoung Shin, Youngkyu Park, Gihwa Lee, Jungsik Park, Sungho Kang:
Interleaving Test Algorithm for Subthreshold Leakage-Current Defects in DRAM Considering the Equal Bit Line Stress. IEEE Trans. Very Large Scale Integr. Syst. 22(4): 803-812 (2014) - [j59]Wooheon Kang, Hyungjun Cho, Joohwan Lee, Sungho Kang:
A BIRA for Memories With an Optimal Repair Rate Using Spare Memories for Area Reduction. IEEE Trans. Very Large Scale Integr. Syst. 22(11): 2336-2349 (2014) - [j58]Hyungsu Sung, Keewon Cho, Kunsang Yoon, Sungho Kang:
A Delay Test Architecture for TSV With Resistive Open Defects in 3-D Stacked Memories. IEEE Trans. Very Large Scale Integr. Syst. 22(11): 2380-2387 (2014) - [c46]Taewoo Han, Inhyuk Choi, Hyunggoy Oh, Sungho Kang:
A Scalable and Parallel Test Access Strategy for NoC-Based Multicore System. ATS 2014: 81-86 - 2013
- [j57]Hyejeong Hong, Jaeil Lim, Hyunyul Lim, Sungho Kang:
Thermal-aware dynamic voltage frequency scaling for many-core processors under process variations. IEICE Electron. Express 10(14): 20130463 (2013) - [j56]Hyejeong Hong, Jaeil Lim, Hyunyul Lim, Sungho Kang:
Dynamic thermal management for 3D multicore processors under process variations. IEICE Electron. Express 10(23): 20130800 (2013) - [j55]Incheol Kim, Ingeol Lee, Sungho Kang:
Built-In Self-Test for Static ADC Testing with a Triangle-Wave. IEICE Trans. Electron. 96-C(2): 292-294 (2013) - [j54]Hyejeong Hong, Sungho Kang:
Acceleration of Deep Packet Inspection Using a Multi-Byte Processing Prefilter. IEICE Trans. Commun. 96-B(2): 643-646 (2013) - [c45]Wooheon Kang, Changwook Lee, Keewon Cho, Sungho Kang:
A Die Selection and Matching Method with Two Stages for Yield Enhancement of 3-D Memories. Asian Test Symposium 2013: 301-306 - [c44]Inhyuk Choi, Taewoo Han, Sungho Kang:
Bit transmission error correction scheme for FlexRay based automotive communication systems. GCCE 2013: 488-490 - 2012
- [j53]Hyuntae Park, Hyejeong Hong, Sungho Kang:
An efficient IP address lookup algorithm based on a small balanced tree using entry reduction. Comput. Networks 56(1): 231-243 (2012) - [j52]Yoseop Lim, Jaeseok Park, Sungho Kang:
A method for the fast diagnosis of multiple defects using an efficient candidate selection algorithm. IEICE Electron. Express 9(9): 834-839 (2012) - [j51]Yoseop Lim, Jaeseok Park, Sungho Kang:
An accurate diagnosis of transition fault clusters based on single fault simulation. IEICE Electron. Express 9(19): 1528-1533 (2012) - [c43]Jaeseok Park, Ingeol Lee, Young-Seok Park, Sung-Geun Kim, Kyungho Ryu, Dong-Hoon Jung, Kangwook Jo, Choong Keun Lee, Hongil Yoon, Seong-Ook Jung, Woo-Young Choi, Sungho Kang:
Integration of dual channel timing formatter system for high speed memory test equipment. ISOCC 2012: 185-187 - 2011
- [j50]HyeonUk Son, Incheol Kim, Sang-Goog Lee, Jin-Ho Ahn, Jeong-Do Kim, Sungho Kang:
Noise-Tolerant DAC BIST Scheme Using Integral Calculus Approach. IEICE Trans. Electron. 94-C(8): 1344-1347 (2011) - [j49]Hyuntae Park, Hyejeong Hong, Sungho Kang:
An Efficient IP Address Lookup Scheme Using Balanced Binary Search with Minimal Entry and Optimal Prefix Vector. IEICE Trans. Commun. 94-B(11): 3128-3131 (2011) - [j48]Hyunjin Kim, Sungho Kang:
Communication-aware task scheduling and voltage selection for total energy minimization in a multiprocessor system using Ant Colony Optimization. Inf. Sci. 181(18): 3995-4008 (2011) - [j47]Hong-Sik Kim, Joohong Lee, Hyunjin Kim, Sungho Kang, Woo-Chan Park:
A Lossless Color Image Compression Architecture Using a Parallel Golomb-Rice Hardware CODEC. IEEE Trans. Circuits Syst. Video Technol. 21(11): 1581-1587 (2011) - [j46]Hyunjin Kim, Hong-Sik Kim, Sungho Kang:
A Memory-Efficient Bit-Split Parallel String Matching Using Pattern Dividing for Intrusion Detection Systems. IEEE Trans. Parallel Distributed Syst. 22(11): 1904-1911 (2011) - [c42]Jaewon Cha, Ilwoong Kim, Sungho Kang:
New Fault Detection Algorithm for Multi-level Cell Flash Memroies. Asian Test Symposium 2011: 341-346 - [c41]Inhyuk Choi, Taewoo Han, Ilwoong Kim, Sungho Kang:
Path search engine for fast optimal path search using efficient hardware architecture. ISOCC 2011: 96-99 - 2010
- [j45]Hyunjin Kim, Sungho Kang:
A Pattern Group Partitioning for Parallel String Matching using a Pattern Grouping Metric. IEEE Commun. Lett. 14(9): 878-880 (2010) - [j44]Hyunjin Kim, Hyejeong Hong, Dongmyoung Baek, Jin-Ho Ahn, Sungho Kang:
A memory-efficient heterogeneous parallel pattern matching scheme in deep packet inspection. IEICE Electron. Express 7(5): 377-382 (2010) - [j43]Hong-Sik Kim, Young H. Jung, Hyunjin Kim, Jin-Ho Ahn, Woo-Chan Park, Sungho Kang:
A high performance network-on-chip scheme using lossless data compression. IEICE Electron. Express 7(11): 791-796 (2010) - [j42]YongJoon Kim, Jaeseok Park, Sungho Kang:
A Selective Scan Chain Activation Technique for Minimizing Average and Peak Power Consumption. IEICE Trans. Inf. Syst. 93-D(1): 193-196 (2010) - [j41]YongJoon Kim, Jaeseok Park, Sungho Kang:
Selective Scan Slice Grouping Technique for Efficient Test Data Compression. IEICE Trans. Inf. Syst. 93-D(2): 380-383 (2010) - [j40]Hyunjin Kim, Hong-Sik Kim, Jung-Hee Lee, Jin-Ho Ahn, Sungho Kang:
A Memory-Efficient Pattern Matching with Hardware-Based Bit-Split String Matchers for Deep Packet Inspection. IEICE Trans. Commun. 93-B(2): 396-398 (2010) - [j39]Youbean Kim, Jaewon Jang, Hyunwook Son, Sungho Kang:
Pattern Mapping Method for Low Power BIST Based on Transition Freezing Method. IEICE Trans. Inf. Syst. 93-D(3): 643-646 (2010) - [j38]Hyuntae Park, Hyunjin Kim, Hong-Sik Kim, Sungho Kang:
A Fast IP Address Lookup Algorithm Based on Search Space Reduction. IEICE Trans. Commun. 93-B(4): 1009-1012 (2010) - [j37]Hyunjin Kim, Hyejeong Hong, Dongmyong Baek, Sungho Kang:
A Pattern Partitioning Algorithm for Memory-Efficient Parallel String Matching in Deep Packet Inspection. IEICE Trans. Commun. 93-B(6): 1612-1614 (2010) - [j36]Seongyong Ahn, Hyejeong Hong, Hyunjin Kim, Jin-Ho Ahn, Dongmyong Baek, Sungho Kang:
A Hardware-Efficient Pattern Matching Architecture Using Process Element Tree for Deep Packet Inspection. IEICE Trans. Commun. 93-B(9): 2440-2442 (2010) - [j35]Myung-Hoon Yang, Hyungjun Cho, Wooheon Kang, Sungho Kang:
EOF: Efficient Built-In Redundancy Analysis Methodology With Optimal Repair Rate. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 29(7): 1130-1135 (2010) - [j34]Woosik Jeong, Joohwan Lee, Taewoo Han, Kaangchil Lee, Sungho Kang:
An Advanced BIRA for Memories With an Optimal Repair Rate and Fast Analysis Speed by Using a Branch Analyzer. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 29(12): 2014-2026 (2010)
2000 – 2009
- 2009
- [j33]Hyunjin Kim, Hyejeong Hong, Hong-Sik Kim, Sungho Kang:
A memory-efficient parallel string matching for intrusion detection systems. IEEE Commun. Lett. 13(12): 1004-1006 (2009) - [j32]YongJoon Kim, Jaeseok Park, Sungho Kang:
Selective scan slice repetition for simultaneous reduction of test power consumption and test data volume. IEICE Electron. Express 6(20): 1432-1437 (2009) - [j31]YongJoon Kim, Myung-Hoon Yang, Jaeseok Park, Eunsei Park, Sungho Kang:
Grouped Scan Slice Repetition Method for Reducing Test Data Volume and Test Application Time. IEICE Trans. Inf. Syst. 92-D(7): 1462-1465 (2009) - [j30]Youngkyu Park, Jaeseok Park, Taewoo Han, Sungho Kang:
An Effective Programmable Memory BIST for Embedded Memory. IEICE Trans. Inf. Syst. 92-D(12): 2508-2511 (2009) - [j29]Sunghoon Chun, Taejin Kim, Sungho Kang:
ATPG-XP: Test Generation for Maximal Crosstalk-Induced Faults. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 28(9): 1401-1413 (2009) - [j28]Woosik Jeong, Ilkwon Kang, Kyowon Jin, Sungho Kang:
A Fast Built-in Redundancy Analysis for Memories With Optimal Repair Rate Using a Line-Based Search Tree. IEEE Trans. Very Large Scale Integr. Syst. 17(12): 1665-1678 (2009) - [c40]Seung Ho Ok, Woo-Jin Seo, Jin-Ho Ahn, Sungho Kang, Byung In Moon:
An Ant Colony Optimization Approach for the Preference-Based Shortest Path Search. FGIT-FGCN 2009: 539-546 - [c39]Woo-Jin Seo, Seung Ho Ok, Jin-Ho Ahn, Sungho Kang, Byung In Moon:
An Efficient Hardware Architecture of the A-star Algorithm for the Shortest Path Search Engine. NCM 2009: 1499-1502 - [c38]YounSun Kim, Hong-Sik Kim, R. Lee, Sungho Kang:
FPGA-based verification methodology of SoC-type CMOS image signal processor. SoCC 2009: 231-234 - [c37]Sunghoon Chun, YongJoon Kim, Taejin Kim, Sungho Kang:
A High-Level Signal Integrity Fault Model and Test Methodology for Long On-Chip Interconnections. VTS 2009: 152-157 - 2008
- [j27]Hong-Sik Kim, Sungho Kang, Michael S. Hsiao:
A New Scan Architecture for Both Low Power Testing and Test Volume Compression Under SOC Test Environment. J. Electron. Test. 24(4): 365-378 (2008) - [j26]Myung-Hoon Yang, YongJoon Kim, Sunghoon Chun, Sungho Kang:
An Effective Power Reduction Methodology for Deterministic BIST Using Auxiliary LFSR. J. Electron. Test. 24(6): 591-595 (2008) - [j25]