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"Dynamic Built-In Redundancy Analysis for Memory Repair."

Hayoung Lee et al. (2019)

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DOI: 10.1109/TVLSI.2019.2920999

access: closed

type: Journal Article

metadata version: 2024-02-27

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  - https://dblp.org/rec/journals/tvlsi/LeeHLK19
Hayoung Lee, Donghyun Han, Seungtaek Lee, Sungho Kang:
Dynamic Built-In Redundancy Analysis for Memory Repair. IEEE Trans. Very Large Scale Integr. Syst. 27(10): 2365-2374 (2019)

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