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Seungtaek Lee

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2020 – today

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2021
[j2]
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  - journals/access/HanLLK21
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Donghyun Han, Hayoung Lee, Seungtaek Lee, Sungho Kang:
ECC-Aware Fast and Reliable Pattern Matching Redundancy Analysis for Highly Reliable Memory. IEEE Access 9: 133274-133288 (2021)
2020
[c4]
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  - conf/itc/LeeCKKLJ20
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Hayoung Lee, Keewon Cho, Sungho Kang, Wooheon Kang, Seungtaek Lee, Woosik Jeong:
Fail Memory Configuration Set for RA Estimation. ITC 2020: 1-9
[c3]
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  - conf/itc/OhHGLJ20
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Youngsu Oh, Dongmin Han, Byeongseon Go, Seungtaek Lee, Woosik Jeong:
Novel Eye Diagram Estimation Technique to Assess Signal Integrity in High-Speed Memory Test. ITC 2020: 1-5

2010 – 2019

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2019
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Hayoung Lee, Donghyun Han, Seungtaek Lee, Sungho Kang:
Dynamic Built-In Redundancy Analysis for Memory Repair. IEEE Trans. Very Large Scale Integr. Syst. 27(10): 2365-2374 (2019)
[c2]
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Hayoung Lee, Donghyun Han, Seungtaek Lee, Sungho Kang:
Redundancy Analysis based on Fault Distribution for Memory with Complex Spares. ISOCC 2019: 235-236
2018
[c1]
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  - conf/tencon/HanLLMK18
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Donghyun Han, Hayoung Lee, Seungtaek Lee, Minho Moon, Sungho Kang:
3D Memory Formed of Unrepairable Memory Dice and Spare Layer. TENCON 2018: 1362-1366

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