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"An Effective Test Pattern Generation for Testing Signal Integrity."

YongJoon Kim et al. (2006)

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DOI: 10.1109/ATS.2006.261032

access: closed

type: Conference or Workshop Paper

metadata version: 2024-02-27

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YongJoon Kim, Myung-Hoon Yang, Youngkyu Park, Daeyeal Lee, Sungho Kang:
An Effective Test Pattern Generation for Testing Signal Integrity. ATS 2006: 279-286

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