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ORCID"A New Low Power Test Pattern Generator using a Transition Monitoring ..."
Youbean Kim et al. (2005)
- Youbean Kim, Myung-Hoon Yang, Yong Lee, Sungho Kang:
A New Low Power Test Pattern Generator using a Transition Monitoring Window based on BIST Architecture. Asian Test Symposium 2005: 230-235
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