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"Off-chip test architecture for improving multi-site testing efficiency ..."

Sungyoul Seo et al. (2017)

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DOI: 10.1109/ISQED.2017.7918315

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-11

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  dblp key:
  - conf/isqed/SeoLKK17
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Sungyoul Seo, Hyeonchan Lim, Soyeon Kang, Sungho Kang:
Off-chip test architecture for improving multi-site testing efficiency using tri-state decoder and 3V-level encoder. ISQED 2017: 191-195

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