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ORCIDIEEE Transactions on Reliability, Volume 64
Volume 64, Number 1, March 2015
- Way Kuo
:
Risk and Reliability Are Part of Our Life. 2-3 - C. Mani Krishna:
Ameliorating Thermally Accelerated Aging With State-Based Application of Fault-Tolerance in Cyber-Physical Computers. 4-14 - Xin Xu, H. Howie Huang:
Exploring Data-Level Error Tolerance in High-Performance Solid-State Drives. 15-30 - David Han, Debasis Kundu:
Inference for a Step-Stress Model With Competing Risks for Failure From the Generalized Exponential Distribution Under Type-I Censoring. 31-43 - Chin-Diew Lai, Geoff Jones:
Beta Hazard Rate Distribution and Applications. 44-50 - Zhibing Xu, Yili Hong, William Q. Meeker:
Assessing Risk of a Serious Failure Mode Based on Limited Field Data. 51-62 - Tao Yuan, Yizhen Ji:
A Hierarchical Bayesian Degradation Model for Heterogeneous Data. 63-70 - Amparo Baíllo, Javier Cárcamo, Sofia Nieto:
A Test for Convex Dominance With Respect to the Exponential Class Based on an L1 Distance. 71-82 - Eduardo Sáenz-de-Cabezón, Henry P. Wynn:
Hilbert Functions in Design for Reliability. 83-93 - Khac Tuan Huynh, Anne Barros, Christophe Bérenguer:
Multi-Level Decision-Making for The Predictive Maintenance of k-Out-of-n : F Deteriorating Systems. 94-117 - Basima Elshqeirat, Sieteng Soh, Suresh Rai, Mihai M. Lazarescu:
Topology Design with Minimal Cost Subject to Network Reliability Constraint. 118-131 - Nai-Wen Chang, Wei-Hao Deng, Sun-Yuan Hsieh:
Conditional Diagnosability of (n, k)-Star Networks Under the Comparison Diagnosis Model. 132-143 - Narayanaswamy Balakrishnan, Nan Jiang, Tzong-Ru Tsai, Yuhlong Lio, Ding-Geng Chen:
Reliability Inference on Composite Dynamic Systems Based on Burr Type-XII Distribution. 144-153 - Yan-Hui Lin, Yanfu Li, Enrico Zio:
Integrating Random Shocks Into Multi-State Physics Models of Degradation Processes for Component Reliability Assessment. 154-166 - Chuang Sun, Zhengjia He, Hongrui Cao, Zhousuo Zhang, Xuefeng Chen, Ming Jian Zuo:
A Non-Probabilistic Metric Derived From Condition Information for Operational Reliability Assessment of Aero-Engines. 167-181 - Junbo Son, Yilu Zhang, Chaitanya Sankavaram, Shiyu Zhou:
RUL Prediction for Individual Units Based on Condition Monitoring Signals With a Change Point. 182-196 - Houman Hanachi, Jie Liu, Avisekh Banerjee, Ying Chen, Ashok Koul:
A Physics-Based Modeling Approach for Performance Monitoring in Gas Turbine Engines. 197-205 - Martin Wayne, Mohammad Modarres:
A Bayesian Model for Complex System Reliability Growth Under Arbitrary Corrective Actions. 206-220 - Hiren J. Patel, Michael A. Temple, Rusty O. Baldwin:
Improving ZigBee Device Network Authentication Using Ensemble Decision Tree Classifiers With Radio Frequency Distinct Native Attribute Fingerprinting. 221-233 - Xiaoxing Yang, Ke Tang, Xin Yao:
A Learning-to-Rank Approach to Software Defect Prediction. 234-246 - Dianxiang Xu, Weifeng Xu, Michael Kent, Lijo Thomas, Linzhang Wang:
An Automated Test Generation Technique for Software Quality Assurance. 247-268 - Syed Shariyar Murtaza, Nazim H. Madhavji, Mechelle Gittens, Abdelwahab Hamou-Lhadj:
Identifying Recurring Faulty Functions in Field Traces of a Large Industrial Software System. 269-283 - Ting Chen, Xiaosong Zhang, Xiao-li Ji, Cong Zhu, Yang Bai, Yue Wu:
Test Generation for Embedded Executables via Concolic Execution in a Real Environment. 284-296 - Layali Rashid, Karthik Pattabiraman, Sathish Gopalakrishnan:
Characterizing the Impact of Intermittent Hardware Faults on Programs. 297-310 - Lise Guérineau, Evans Gouno:
Inference for a Failure Counting Process Partially Observed. 311-319 - Jianwen Xiang, Fumio Machida, Kumiko Tadano, Yoshiharu Maeno:
An Imperfect Fault Coverage Model With Coverage of Irrelevant Components. 320-332 - Narayanaswamy Balakrishnan, Abedin Haidari, Khaled Masoumifard:
Stochastic Comparisons of Series and Parallel Systems With Generalized Exponential Components. 333-348 - Qingqing Zhai, Jun Yang, Rui Peng, Yu Zhao:
A Study of Optimal Component Order in a General 1-Out-of-n Warm Standby System. 349-358 - Jingyuan Shen, Lirong Cui, Shijia Du:
Birnbaum Importance for Linear Consecutive-k-out-of-n Systems With Sparse d. 359-375 - Tsai-Hung Fan, Tsung-Ming Hsu:
Statistical Inference of a Two-Component Series System With Correlated Log-Normal Lifetime Distribution Under Multiple Type-I Censoring. 376-385 - Lirong Cui, Cong Lin, Shijia Du:
m-Consecutive-k, l-Out-of-n Systems. 386-393 - Yu Liu, Peng Lin, Yanfeng Li, Hong-Zhong Huang:
Bayesian Reliability and Performance Assessment for Multi-State Systems. 394-409 - Gregory Levitin, Liudong Xing, Hanoch Ben-Haim, Yuan-Shun Dai:
Effect of Failure Propagation on Cold vs. Hot Standby Tradeoff in Heterogeneous 1-Out-of-N: G Systems. 410-419 - Young Myoung Ko, Eunshin Byon:
Reliability Evaluation of Large-Scale Systems With Identical Units. 420-434 - Ismihan Bayramoglu, C. Murat Ozkut:
The Reliability of Coherent Systems Subjected to Marshall-Olkin Type Shocks. 435-443 - Gregory Levitin, Liudong Xing, Yuan-Shun Dai:
Reliability of Non-Coherent Warm Standby Systems With Reworking. 444-453 - Gregory Levitin, Liudong Xing, Yuan-Shun Dai:
Reliability and Mission Cost of 1-Out-of-N: G Systems With State-Dependent Standby Mode Transfers. 454-462 - Man Ho Ling, Kwok-Leung Tsui, Narayanaswamy Balakrishnan:
Accelerated Degradation Analysis for the Quality of a System Based on the Gamma Process. 463-472 - Ayon Ganguly, Debasis Kundu, Sanjit Kumar Mitra:
Bayesian Analysis of a Simple Step-Stress Model Under Weibull Lifetimes. 473-485 - Haksong Kim, Yong Lee, Sungho Kang:
A Novel Massively Parallel Testing Method Using Multi-Root for High Reliability. 486-496 - Bo Yang, Yanmei Hu, Chin-Yu Huang:
An Architecture-Based Multi-Objective Optimization Approach to Testing Resource Allocation. 497-515 - Ye Zhang, Haitao Liao:
Analysis of Destructive Degradation Tests for a Product With Random Degradation Initiation Time. 516-527 - Horst Lewitschnig:
Advances on the Stress Interaction Model. 528-534
Volume 64, Number 2, June 2015
- Jeffrey M. Voas:
So Where Are We? A Guest Opinion Editorial. 538 - Francesco Di Maio, Samuele Baronchelli, Enrico Zio:
A Visual Interactive Method for Prime Implicants Identification. 539-549 - Xing Pan, Ziling Xin, Guosheng Li:
Organizational Reliability Capability Assessment: A Case Study in China R&D Enterprise for Aviation Products. 550-561 - Massimiliano Giorgio, Maurizio Guida, Gianpaolo Pulcini:
A New Class of Markovian Processes for Deteriorating Units With State Dependent Increments and Covariates. 562-578 - Mohamed T. Ghoneim, Jhonathan P. Rojas, Chadwin D. Young, Gennadi Bersuker, Muhammad Mustafa Hussain:
Electrical Analysis of High Dielectric Constant Insulator and Metal Gate Metal Oxide Semiconductor Capacitors on Flexible Bulk Mono-Crystalline Silicon. 579-585 - Wooheon Kang, Changwook Lee, Hyunyul Lim, Sungho Kang:
A 3 Dimensional Built-In Self-Repair Scheme for Yield Improvement of 3 Dimensional Memories. 586-595 - Jing Guo, Liyi Xiao, Tianqi Wang, Shanshan Liu, Xu Wang, Zhigang Mao:
Soft Error Hardened Memory Design for Nanoscale Complementary Metal Oxide Semiconductor Technology. 596-602 - Chih-Chun Tsai, Chien-Tai Lin, Narayanaswamy Balakrishnan:
Optimal Design for Accelerated-Stress Acceptance Test Based on Wiener Process. 603-612 - Jian Zhang, Hon Keung Tony Ng, Narayanaswamy Balakrishnan:
Statistical Inference of Component Lifetimes With Location-Scale Distributions From Censored System Failure Data With Known Signature. 613-626 - Hadi Alizadeh Noughabi, Narayanaswamy Balakrishnan:
Goodness of Fit Using a New Estimate of Kullback-Leibler Information Based on Type II Censored Data. 627-635 - Ronghua Wang, Naijun Sha, Beiqing Gu, Xiaoling Xu:
Parameter Inference in a Hybrid System With Masked Data. 636-644 - Michele Compare, Enrico Zio:
Genetic Algorithms in the Framework of Dempster-Shafer Theory of Evidence for Maintenance Optimization Problems. 645-660 - María Dolores Berrade, Philip A. Scarf, Cristiano A. V. Cavalcante:
Some Insights Into the Effect of Maintenance Quality for a Protection System. 661-672 - Fuqiong Zhao, Zhigang Tian, Eric Bechhoefer, Yong Zeng:
An Integrated Prognostics Method Under Time-Varying Operating Conditions. 673-686 - Zeyi Huang, Zhengguo Xu, Wenhai Wang, Youxian Sun:
Remaining Useful Life Prediction for a Nonlinear Heterogeneous Wiener Process Model With an Adaptive Drift. 687-700 - Marcos E. Orchard, Matias S. Lacalle, Benjamín E. Olivares, Jorge F. Silva, Rodrigo Palma-Behnke, Pablo A. Estévez, Bernardo Severino, Williams Calderon-Munoz, Marcelo Cortes-Carmona:
Information-Theoretic Measures and Sequential Monte Carlo Methods for Detection of Regeneration Phenomena in the Degradation of Lithium-Ion Battery Cells. 701-709 - Daniel A. Pola, Hugo F. Navarrete, Marcos E. Orchard, Ricardo S. Rabie, Matías A. Cerda Munoz, Benjamín E. Olivares, Jorge F. Silva, Pablo A. Espinoza, Aramis Pérez:
Particle-Filtering-Based Discharge Time Prognosis for Lithium-Ion Batteries With a Statistical Characterization of Use Profiles. 710-720 - Zhaoqiang Wang, Wenbin Wang, Chang-Hua Hu, Xiao-Sheng Si, Wei Zhang:
A Prognostic-Information-Based Order-Replacement Policy for a Non-Repairable Critical System in Service. 721-735 - Matteo Corbetta, Claudio Sbarufatti, Andrea Manes, Marco Giglio:
Real-Time Prognosis of Crack Growth Evolution Using Sequential Monte Carlo Methods and Statistical Model Parameters. 736-753 - Hongyan Dui, Shubin Si, Ming Jian Zuo, Shudong Sun:
Semi-Markov Process-Based Integrated Importance Measure for Multi-State Systems. 754-765 - Serkan Eryilmaz, Altan Tuncel:
Computing the Signature of a Generalized k-Out-of-n System. 766-771 - Yong Wang, Lin Li:
Uncertainty Importance Measure of Individual Components in Multi-State Systems. 772-783 - Xiaoyan Zhu, Mahmoud Boushaba, Mohamed Reghioua:
Joint Reliability Importance in a Consecutive-k-out-of-n : F System and an m-Consecutive-k-out-of-n: F System for Markov-Dependent Components. 784-798 - Mohammad Javad Feizollahi, Roya Soltani, Hadi Feyzollahi:
The Robust Cold Standby Redundancy Allocation in Series-Parallel Systems With Budgeted Uncertainty. 799-806 - Limei Lin, Li Xu, Shuming Zhou, Dajin Wang:
The Reliability of Subgraphs in the Arrangement Graph. 807-818 - Gregory Levitin, Liudong Xing, Yuan-Shun Dai:
Non-Homogeneous 1-Out-of-N Warm Standby Systems With Random Replacement Times. 819-828 - Serkan Eryilmaz:
Mixture Representations for Three-State Systems With Three-State Components. 829-834
Volume 64, Number 3, September 2015
- Way Kuo:
Reflections on Reliability: Key Events 1999-2015. 838-839 - Shiuan-Tzuo Shen, Hsiao-Ying Lin, Wen-Guey Tzeng:
An Effective Integrity Check Scheme for Secure Erasure Code-Based Storage Systems. 840-851 - Piero Baraldi, Francesco Di Maio, Davide Genini, Enrico Zio:
Comparison of Data-Driven Reconstruction Methods For Fault Detection. 852-860 - Olga Fink, Enrico Zio, Ulrich Weidmann:
Fuzzy Classification With Restricted Boltzman Machines and Echo-State Networks for Predicting Potential Railway Door System Failures. 861-868 - Tze Ling Jee, Kai Meng Tay, Chee Peng Lim:
A New Two-Stage Fuzzy Inference System-Based Approach to Prioritize Failures in Failure Mode and Effect Analysis. 869-877 - Peican Zhu, Jie Han, Leibo Liu, Fabrizio Lombardi:
A Stochastic Approach for the Analysis of Dynamic Fault Trees With Spare Gates Under Probabilistic Common Cause Failures. 878-892 - Felipe Aguirre, Mohamed Sallak, Walter Schön:
An Efficient Method for Reliability Analysis of Systems Under Epistemic Uncertainty Using Belief Function Theory. 893-909 - Qin Zhang, Shichao Geng:
Dynamic Uncertain Causality Graph Applied to Dynamic Fault Diagnoses of Large and Complex Systems. 910-927 - Eva Hakansson, Paul K. Predecki, Maciej S. Kumosa:
Galvanic Corrosion of High Temperature Low Sag Aluminum Conductor Composite Core and Conventional Aluminum Conductor Steel Reinforced Overhead High Voltage Conductors. 928-934 - Aiman H. El-Maleh, Khaled A. Daud:
Simulation-Based Method for Synthesizing Soft Error Tolerant Combinational Circuits. 935-948 - Yuhlong Lio, Jye-Chyi Lu, Lingyan Ruan:
Robust Parameter Design for Quality and Reliability Issues Based on Accelerated Degradation Measurements. 949-959 - Firoozeh Haghighi, Suk Joo Bae:
Reliability Estimation from Linear Degradation and Failure Time Data With Competing Risks Under a Step-Stress Accelerated Degradation Test. 960-971 - Zhenglin Liang, Ajith Kumar Parlikad:
A Condition-Based Maintenance Model for Assets With Accelerated Deterioration Due to Fault Propagation. 972-982 - Kai He, Lisa M. Maillart, Oleg A. Prokopyev:
Scheduling Preventive Maintenance as a Function of an Imperfect Inspection Interval. 983-997 - Shey-Huei Sheu, Tzu-Hsin Liu, Zhe George Zhang, Yu-Hung Chien:
Extended Optimal Replacement Policy for a Two-Unit System With Shock Damage Interaction. 998-1014 - Guanghan Bai, Ming Jian Zuo, Zhigang Tian:
Ordering Heuristics for Reliability Evaluation of Multistate Networks. 1015-1023 - Jaeseung Song, Hyoungshick Kim, Soojin Park:
Enhancing Conformance Testing Using Symbolic Execution for Network Protocols. 1024-1037 - Pascal Vrignat, Manuel Avila, Florent Duculty, Frédéric Kratz:
Failure Event Prediction Using Hidden Markov Model Approaches. 1038-1048 - Olga Fink, Enrico Zio, Ulrich Weidmann:
A Classification Framework for Predicting Components' Remaining Useful Life Based on Discrete-Event Diagnostic Data. 1049-1056 - Nan-Jung Hsu, Sheng-Tsaing Tseng, Ming-Wei Chen:
Adaptive Warranty Prediction for Highly Reliable Products. 1057-1067 - Bao Liu, Ravi S. Sandhu:
Fingerprint-Based Detection and Diagnosis of Malicious Programs in Hardware. 1068-1077 - Chinyang Henry Tseng, Shiau-Huey Wang, Woei-Jiunn Tsaur:
Hierarchical and Dynamic Elliptic Curve Cryptosystem Based Self-Certified Public Key Scheme for Medical Data Protection. 1078-1085 - Syed Taha Ali, Vijay Sivaraman, Adam Radford, Sanjay Jha:
A Survey of Securing Networks Using Software Defined Networking. 1086-1097 - Dick Hamlet:
Theory of Software Testing With Persistent State. 1098-1115 - Sharareh Taghipour, Maryam L. Kassaei:
Periodic Inspection Optimization of a k-Out-of-n Load-Sharing System. 1116-1127 - Leonard Daus, Valeriu Beiu:
Lower and Upper Reliability Bounds for Consecutive-k-Out-of-n: F Systems. 1128-1135
Volume 64, Number 4, December 2015
- Jason W. Rupe:
How the IEEE Transactions on Reliability has Improved Over the Years, and Readies for Change. 1138-1139 - Jingyuan Shen, Lirong Cui:
Reliability and Birnbaum Importance for Sparsely Connected Circular Consecutive-k Systems. 1140-1157 - Siyuan Frank Yang, Wei-Ting Kary Chien:
Electromigration Lifetime Optimization by Uniform Designs and a New Lifetime Index. 1158-1163 - Koosha Rafiee, Qianmei Feng, David W. Coit:
Condition-Based Maintenance for Repairable Deteriorating Systems Subject to a Generalized Mixed Shock Model. 1164-1174 - Wei-Chang Yeh:
A Fast Algorithm for Quickest Path Reliability Evaluations in Multi-State Flow Networks. 1175-1184 - Wei-Chang Yeh:
An Improved Sum-of-Disjoint-Products Technique for Symbolic Multi-State Flow Network Reliability. 1185-1193 - Suparna Chakraborty, Neeraj Kumar Goyal:
Irredundant Subset Cut Enumeration for Reliability Evaluation of Flow Networks. 1194-1202 - Jie Liu, Valeria Vitelli, Enrico Zio, Redouane Seraoui:
A Novel Dynamic-Weighted Probabilistic Support Vector Regression-Based Ensemble for Prognostics of Time Series Data. 1203-1213 - Zhengxin Zhang, Xiao-Sheng Si, Chang-Hua Hu:
An Age- and State-Dependent Nonlinear Prognostic Model for Degrading Systems. 1214-1228 - Lok-Won Kim, John D. Villasenor:
Dynamic Function Verification for System on Chip Security Against Hardware-Based Attacks. 1229-1242 - Rishad A. Shafik, Jimson Mathew, Dhiraj K. Pradhan:
A Low-Cost Unified Design Methodology for Secure Test and Intellectual Property Core Protection. 1243-1253 - Ernst Moritz Hahn, Holger Hermanns, Ralf Wimmer, Bernd Becker:
Transient Reward Approximation for Continuous-Time Markov Chains. 1254-1275 - Maryam Kelkinnama, Mahdi Tavangar, Majid Asadi:
New Developments on Stochastic Properties of Coherent Systems. 1276-1286 - Yu Liu, Ming Jian Zuo, Yanfeng Li, Hong-Zhong Huang:
Dynamic Reliability Assessment for Multi-State Systems Utilizing System-Level Inspection Data. 1287-1299 - Jinhua Mi, Yan-Feng Li, Yu Liu, Yuanjian Yang, Hong-Zhong Huang:
Belief Universal Generating Function Analysis of Multi-State Systems Under Epistemic Uncertainty and Common Cause Failures. 1300-1309 - Qingqing Zhai, Liudong Xing, Rui Peng, Jun Yang:
Multi-Valued Decision Diagram-Based Reliability Analysis of k-out-of-n Cold Standby Systems Subject to Scheduled Backups. 1310-1324 - Gregory Levitin, Liudong Xing, Yuanshun Dai:
Heterogeneous 1-Out-of-N Warm Standby Systems With Dynamic Uneven Backups. 1325-1339 - Chih-Chun Tsai, Chien-Tai Lin:
Lifetime Inference for Highly Reliable Products Based on Skew-Normal Accelerated Destructive Degradation Test Model. 1340-1355 - Rong Pan, Tao Yang, Kangwon Seo:
Planning Constant-Stress Accelerated Life Tests for Acceleration Model Selection. 1356-1366 - Weiwen Peng, Yanfeng Li, Yuanjian Yang, Jinhua Mi, Hong-Zhong Huang:
Leveraging Degradation Testing and Condition Monitoring for Field Reliability Analysis With Time-Varying Operating Missions. 1367-1382 - Ancha Xu, Yincai Tang:
A Bayesian Method for Planning Accelerated Life Testing. 1383-1392
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