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Jaewon Park
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2020 – today
- 2023
- [j10]Yesin Ryu, Sung-Gi Ahn, Jae Hoon Lee, Jaewon Park, Yong-Ki Kim, Hyochang Kim, Yeong Geol Song, Han-Won Cho, Sunghye Cho, Seung Ho Song, Haesuk Lee, Useung Shin, Jonghyun Ahn, Je-Min Ryu, Suk Han Lee, Kyounghwan Lim, Jungyu Lee, Jeong Hoan Park, Jae-Seung Jeong, Sunghwan Jo, Dajung Cho, Sooyoung Kim, Minsu Lee, Hyunho Kim, Minhwan Kim, Jae San Kim, Jinah Kim, Hyun Gil Kang, Myung-Kyu Lee, Sung-Rae Kim, Young-Cheon Kwon, Young-Yong Byun, Kijun Lee, Sangkil Park, Jaeyoun Youn, Myeong-O. Kim, Kyomin Sohn, SangJoon Hwang, JooYoung Lee:
A 16 GB 1024 GB/s HBM3 DRAM With Source-Synchronized Bus Design and On-Die Error Control Scheme for Enhanced RAS Features. IEEE J. Solid State Circuits 58(4): 1051-1061 (2023) - 2022
- [c4]Yesin Ryu, Young-Cheon Kwon, Jae Hoon Lee, Sung-Gi Ahn, Jaewon Park, Kijun Lee, Yu Ho Choi, Han-Won Cho, Jae San Kim, Jungyu Lee, Haesuk Lee, Seung Ho Song, Je-Min Ryu, Yeong Ho Yun, Useung Shin, Dajung Cho, Jeong Hoan Park, Jae-Seung Jeong, Suk Han Lee, Kyounghwan Lim, Tae-Sung Kim, Kyungmin Kim, Yu Jin Cha, Ik Joo Lee, Tae Kyu Byun, Han Sik Yoo, Yeong Geol Song, Myung-Kyu Lee, Sunghye Cho, Sung-Rae Kim, Ji-Min Choi, Hyoungmin Kim, Soo Young Kim, Jaeyoun Youn, Myeong-O. Kim, Kyomin Sohn, SangJoon Hwang, JooYoung Lee:
A 16 GB 1024 GB/s HBM3 DRAM with On-Die Error Control Scheme for Enhanced RAS Features. VLSI Technology and Circuits 2022: 130-131 - 2021
- [j9]Jaewon Park, Jae Hoon Lee, Sang-Kil Park, Ki Chul Chun, Kyomin Sohn, Sungho Kang:
An In-DRAM BIST for 16 Gb DDR4 DRAM in the 2nd 10-nm-Class DRAM Process. IEEE Access 9: 33487-33497 (2021) - [j8]Ki Chul Chun, Yong-Ki Kim, Yesin Ryu, Jaewon Park, Chi Sung Oh, Young-Yong Byun, So-Young Kim, Dong-Hak Shin, Jun Gyu Lee, Byung-Kyu Ho, Min-Sang Park, Seong-Jin Cho, Seunghan Woo, Byoung-Mo Moon, Beomyong Kil, Sungoh Ahn, Jae Hoon Lee, Sooyoung Kim, Seouk-Kyu Choi, Jae-Seung Jeong, Sung-Gi Ahn, Jihye Kim, Jun Jin Kong, Kyomin Sohn, Nam Sung Kim, Jung-Bae Lee:
A 16-GB 640-GB/s HBM2E DRAM With a Data-Bus Window Extension Technique and a Synergetic On-Die ECC Scheme. IEEE J. Solid State Circuits 56(1): 199-211 (2021) - [j7]Junyi Yao, Yiyang Guan, Yunhwan Park, Yoon E. Choi, Hyun Soo Kim, Jaewon Park:
Optimization of PTFE Coating on PDMS Surfaces for Inhibition of Hydrophobic Molecule Absorption for Increased Optical Detection Sensitivity. Sensors 21(5): 1754 (2021) - [j6]Haechang Yang, Sanghoon Shin, Dongmin Seo, Jaewon Park, Sungkyu Seo:
Detection of Particulate Matters with a Field-Portable Microscope Using Side-Illuminated Total Internal Reflection. Sensors 21(8): 2745 (2021) - 2020
- [c3]Hocheol Nam, Jaewon Park, Seunggyun Lee, Seunghyun Yeo, Seehwan Yoo:
Hints for Memory Optimization of Asylo-based SGX Enclave Applications. ICTC 2020: 1685-1690 - [c2]Chi-Sung Oh, Ki Chul Chun, Young-Yong Byun, Yong-Ki Kim, So-Young Kim, Yesin Ryu, Jaewon Park, Sinho Kim, Sang-uhn Cha, Dong-Hak Shin, Jungyu Lee, Jong-Pil Son, Byung-Kyu Ho, Seong-Jin Cho, Beomyong Kil, Sungoh Ahn, Baekmin Lim, Yong-Sik Park, Kijun Lee, Myung-Kyu Lee, Seungduk Baek, Junyong Noh, Jae-Wook Lee, Seungseob Lee, Sooyoung Kim, Bo-Tak Lim, Seouk-Kyu Choi, Jin-Guk Kim, Hye-In Choi, Hyuk-Jun Kwon, Jun Jin Kong, Kyomin Sohn, Nam Sung Kim, Kwang-Il Park, Jung-Bae Lee:
22.1 A 1.1V 16GB 640GB/s HBM2E DRAM with a Data-Bus Window-Extension Technique and a Synergetic On-Die ECC Scheme. ISSCC 2020: 330-332 - [c1]Seunggyun Lee, Hocheol Nam, Jaewon Park, Seehwan Yoo:
Student Session: Comparative Analysis of Live VM Migration with SGX Enclave. RTCSA 2020: 1-2
2010 – 2019
- 2018
- [j5]Se-Hoon Jeong, Sunja Kim, John Buonocore, Jaewon Park, C. Jane Welsh, Jianrong Li, Arum Han:
A Three-Dimensional Arrayed Microfluidic Blood-Brain Barrier Model With Integrated Electrical Sensor Array. IEEE Trans. Biomed. Eng. 65(2): 431-439 (2018) - 2016
- [j4]Hyun Soo Kim, Se-Hoon Jeong, Chiwan Koo, Arum Han, Jaewon Park:
A Microchip for High-Throughput Axon Growth Drug Screening. Micromachines 7(7): 114 (2016) - 2014
- [j3]Sang Hyuck Bae, Jaewon Park, CheolSe Kim, SeokWoo Lee, Woosup Shin, Yong-Surk Lee:
Evaluation of Large-Sized LCD Touch Panel Using Differential Sensing Circuit and Algorithm. IEICE Trans. Inf. Syst. 97-D(5): 1363-1366 (2014)
2000 – 2009
- 2006
- [j2]Jaewon Park, Shiquan Piao, Yongwan Park:
Parallel Interference Cancellation Scheme Based on Sorting Method for a Multi-Carrier DS/CDMA System. IEICE Trans. Commun. 89-B(6): 1781-1792 (2006) - [j1]Shiquan Piao, Jaewon Park, Yongwan Park:
Outage Probability Analysis for DS-CDMA Systems with Call Admission Control Scheme. IEICE Trans. Commun. 89-B(8): 2226-2229 (2006)
Coauthor Index
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