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Randall L. Geiger
Randy Geiger
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- affiliation: Iowa State University, Ames, Iowa, USA
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2020 – today
- 2024
- [c126]Kwabena Oppong Banahene, Randall L. Geiger:
Compact Temperature Sensor with Voltage-Ratio Current-Independent Output for Reference Independent Data Conversion. ISCAS 2024: 1-5 - [c125]Daniel Adjei, Bryce Gadogbe, Degang Chen, Randall L. Geiger:
Novel Single-Temperature Trim Techniques for Bandgap Voltage References. MWSCAS 2024: 683-687 - [c124]Emmanuel Amankrah, Bryce Gadogbe, Patricia Tutuani, Randall L. Geiger:
A 0.5V, 5.7ppm/°C Voltage Reference with Subthreshold MOSFET and Piecewise Compensation. MWSCAS 2024: 960-964 - [c123]Patricia Tutuani, Emmanuel Amankrah, Randall L. Geiger:
A 4ps Resolution Capacitive-Tuned Delay Pulse Shrinking Time to Digital Converter. MWSCAS 2024: 1091-1095 - 2023
- [c122]Daniel Adjei, Bryce Gadogbe
, Degang Chen, Randall L. Geiger:
A Resistorless Precision Curvature-Compensated Bandgap Voltage Reference Based on the VGO Extraction Technique. ISCAS 2023: 1-5 - [c121]Bryce Gadogbe
, Daniel Adjei, Kwabena Oppong Banahene, Randall L. Geiger, Degang Chen:
Sub-ppm/°C High Performance Voltage Reference. ISCAS 2023: 1-4 - [c120]Daniel Adjei, Bryce Gadogbe, Degang Chen, Randall L. Geiger, Shravan K. Chaganti, Dhyey Desai, Jerry Doorenbos, Jim Todsen:
An Improved Single-Temperature Trim Technique for 1st Order-Compensated Bandgap References. MWSCAS 2023: 59-63 - [c119]Bryce Gadogbe, Ruohang Yang, Kwabena Oppong Banahene, Pallavi Ebenezer, Randall L. Geiger, Degang Chen:
Very Compact Temperature Sensor for Power/Thermal Management. MWSCAS 2023: 142-146 - [c118]Ruohan Yang, Bryce Gadogbe, Randall L. Geiger, Degang Chen:
A Compact and Accurate MOS-based Temperature Sensor for Thermal Management. MWSCAS 2023: 594-598 - [c117]Bryce Gadogbe, Randall L. Geiger:
A 15μW Low Cost CMOS Smart Temperature Sensor. MWSCAS 2023: 599-603 - 2022
- [c116]Kwabena Oppong Banahene, Matthew R. Strong, Bryce Gadogbe
, Degang Chen, Randall L. Geiger:
Hardware Security Vulnerability in Analog Signal Chain Filters. ISCAS 2022: 667-671 - 2021
- [j20]Nanqi Liu
, Randall L. Geiger, Degang Chen
:
Sub-ppm/°C Bandgap References With Natural Basis Expansion for Curvature Cancellation. IEEE Trans. Circuits Syst. I Regul. Pap. 68(9): 3551-3561 (2021) - 2020
- [j19]Chulhyun Park
, Tao Chen
, Kyoohyun Noh
, Dadian Zhou
, Suraj Prakash
, Mohammadhossein Naderi Alizadeh
, Aydin I. Karsilayan
, Degang Chen
, Randall L. Geiger, José Silva-Martínez
:
A 12-Bit 125-MS/s 2.5-Bit/Cycle SAR-Based Pipeline ADC Employing a Self-Biased Gain Boosting Amplifier. IEEE Trans. Circuits Syst. 67-I(11): 3618-3629 (2020) - [j18]Tao Chen
, Chulhyun Park, Shravan K. Chaganti
, José Silva-Martínez, Randall L. Geiger, Degang Chen:
An Ultrafast Multibit/Stage Pipelined ADC Testing and Calibration Method. IEEE Trans. Instrum. Meas. 69(3): 729-738 (2020) - [j17]Tao Chen, Chulhyun Park, Hao Meng, Dadian Zhou, José Silva-Martínez, Randall L. Geiger, Degang Chen:
A Low-Cost On-Chip Built-In Self-Test Solution for ADC Linearity Test. IEEE Trans. Instrum. Meas. 69(6): 3516-3526 (2020) - [c115]Pallavi Sugantha Ebenezer, Vijayalakshmi Naganadhan, Degang Chen, Randall L. Geiger:
Three-Junction Bandgap Circuit with Sub 1 ppm/°C Temperature Coefficient. MWSCAS 2020: 305-308
2010 – 2019
- 2019
- [c114]Nanqi Liu
, Randy Geiger, Degang Chen:
Bandgap Voltage VGO Extraction with Two-Temperature Trimming for Designing Sub-ppm/°C Voltage References. ISCAS 2019: 1-4 - [c113]Tyler Archer, Pallavi Ebenezer, Chin-Wen Chen, Randall L. Geiger:
Nonlinear Device Conversion. MWSCAS 2019: 359-364 - [c112]Pallavi Ebenezer, Tyler Archer, Degang Chen, Randall L. Geiger:
A Precision Bandgap Voltage Reference Using Curvature Elimination Technique. MWSCAS 2019: 505-508 - [e1]Hoi Lee, Randall L. Geiger:
62nd IEEE International Midwest Symposium on Circuits and Systems, MWSCAS 2019, Dallas, TX, USA, August 4-7, 2019. IEEE 2019, ISBN 978-1-7281-2788-0 [contents] - 2018
- [j16]Tao Chen
, Xiankun Jin
, Randall L. Geiger, Degang Chen
:
USER-SMILE: Ultrafast Stimulus Error Removal and Segmented Model Identification of Linearity Errors for ADC Built-in Self-Test. IEEE Trans. Circuits Syst. I Regul. Pap. 65-I(7): 2059-2069 (2018) - [c111]Hao Meng, Randall L. Geiger, Degang Chen:
A High Constancy Rail-to-rail Level Shift Generator for SEIR-based BIST circuit for ADCs. ISCAS 2018: 1-5 - [c110]Qianqian Wang, Degang Chen, Randall L. Geiger:
Transparent side channel trigger mechanism on analog circuits with PAAST hardware Trojans. ISCAS 2018: 1-4 - 2017
- [c109]Xiankun Jin, Tao Chen
, Mayank Jain, Arun Kumar Barman, David Kramer, Doug Garrity, Randall L. Geiger, Degang Chen:
An on-chip ADC BIST solution and the BIST enabled calibration scheme. ITC 2017: 1-10 - [c108]Qianqian Wang, Degang Chen, Randall L. Geiger:
Technique for generating timing skew resistant time-interleaved signals. MWSCAS 2017: 1561-1564 - 2015
- [c107]Yen-Ting Wang, Chen Zhao, Degang Chen, Randall L. Geiger:
Direct temperature to digital converters with low supply sensitivity for power/thermal management. ISCAS 2015: 1066-1069 - [c106]Qianqian Wang, Randall L. Geiger, Degang Chen:
A programmable temperature trigger circuit. ISCAS 2015: 1070-1073 - [c105]Xu Zhang, Chongli Cai, Hao Meng, Siva Sudani, Randall L. Geiger, Degang Chen:
A calibration technique for SAR analog-to-digital converter based on INL testing with quantization bits and redundant bit. ISCAS 2015: 3024-3027 - [c104]Xing Cao, Qianqian Wang, Randall L. Geiger, Degang Chen:
A hardware Trojan embedded in the Inverse Widlar reference generator. MWSCAS 2015: 1-4 - 2014
- [c103]Zhiqiang Liu, You Li, Yan Duan, Randall L. Geiger, Degang Chen:
Identification and break of positive feedback loops in Trojan States Vulnerable Circuits. ISCAS 2014: 289-292 - [c102]José Silva-Martínez, Edgar Sánchez-Sinencio, José G. Delgado-Frias, Randall L. Geiger:
Welcome to MWSCAS 2014. MWSCAS 2014: 1-2 - [c101]Srijita Patra, Randall L. Geiger:
Comparison of MOSFET mismatch models with random physical and random model variables. MWSCAS 2014: 278-281 - [c100]Qianqian Wang, Randall L. Geiger, Degang Chen:
Challenges and opportunities for determining presence of multiple equilibrium points with circuit simulators. MWSCAS 2014: 406-409 - [c99]Rui Bai, Randall L. Geiger:
Effects of non-ideal characteristics of substrate BJT on bandgap reference circuits. MWSCAS 2014: 471-474 - [c98]Yen-Ting Wang, Degang Chen, Randall L. Geiger:
A CMOS supply-insensitive with 13ppm/°C temperature coefficient current reference. MWSCAS 2014: 475-478 - [c97]Zhiqiang Liu, You Li, Randall L. Geiger, Degang Chen:
Auto-identification of positive feedback loops in multi-state vulnerable circuits. VTS 2014: 1-5 - 2013
- [j15]Bharath Karthik Vasan, Siva Kumar Sudani, Degang Chen, Randall L. Geiger:
Low-Distortion Sine Wave Generation Using a Novel Harmonic Cancellation Technique. IEEE Trans. Circuits Syst. I Regul. Pap. 60-I(5): 1122-1134 (2013) - [c96]Srijita Patra, Degang Chen, Randy Geiger:
Reliability degradation with electrical, thermal and thermal gradient stress in interconnects. ISCAS 2013: 1063-1066 - [c95]Chen Zhao, Yen-Ting Wang, David Genzer, Degang Chen, Randall L. Geiger:
A CMOS on-chip temperature sensor with -0.21°C 0.17 °C inaccuracy from -20 °C to 100 °C. ISCAS 2013: 2621-2625 - [c94]Yen-Ting Wang, Degang Chen, Randall L. Geiger:
Practical methods for verifying removal of Trojan stable operating points. ISCAS 2013: 2658-2661 - [c93]Siva Sudani, Degang Chen, Randall L. Geiger:
High resolution ADC spectral test with known impure source and non-coherent sampling. ISCAS 2013: 2674-2677 - [c92]Chin-Wen Chen, Randall L. Geiger, Shu-Chuan Huang:
A low-power supply-insensitive temperature sensor in 90nm CMOS process. MWSCAS 2013: 979-982 - [c91]Yen-Ting Wang, Degang Chen, Randall L. Geiger:
Effectiveness of circuit-level continuation methods for Trojan State Elimination verification. MWSCAS 2013: 1043-1046 - 2012
- [j14]Jingbo Duan, Bharath K. Vasan, Chen Zhao, Degang Chen, Randall L. Geiger:
On Chip Signal Generators for Low Overhead ADC BIST. J. Electron. Test. 28(5): 615-623 (2012) - [c90]Jingbo Duan, Degang Chen, Randall L. Geiger:
A low cost method for testing offset and gain error for ADC BIST. ISCAS 2012: 2023-2026 - [c89]Bharath K. Vasan, Siva Sudani, Degang Chen, Randall L. Geiger:
Sinusoidal signal generation for production testing and BIST applications. ISCAS 2012: 2601-2604 - [c88]Chen Zhao, Randall L. Geiger, Degang Chen:
A compact low-power supply-insensitive CMOS current reference. ISCAS 2012: 2825-2828 - [c87]Siva Sudani, Degang Chen, Randy Geiger:
A method for accurate full spectrum testing without requiring coherency. MWSCAS 2012: 346-349 - [c86]Srijita Patra, Degang Chen, Randy Geiger:
Reliability modeling of metal interconnects with time-dependent electrical and thermal stress. MWSCAS 2012: 514-517 - [c85]Yen-Ting Wang, Chen Zhao, Randall L. Geiger, Degang Chen, Shu-Chuan Huang:
Performance verification of start-up circuits in reference generators. MWSCAS 2012: 518-521 - 2011
- [c84]Chen Zhao, Jun He, Sheng-Huang Lee, Karl Peterson, Randall L. Geiger, Degang Chen:
Linear vt-based temperature sensors with low process sensitivity and improved power supply headroom. ISCAS 2011: 2553-2556 - 2010
- [c83]Jingbo Duan, Degang Chen, Randall L. Geiger:
Phase control of triangular stimulus generator for ADC BIST. ISCAS 2010: 1935-1938 - [c82]Jun He, Degang Chen, Randall L. Geiger:
Detailed analyses in prediction of capacitive-mismatch-induced offset in dynamic comparators. ISCAS 2010: 2390-2393 - [c81]Bharath K. Vasan, Randall L. Geiger, Degang Chen:
Linearity testing of ADCs using low linearity stimulus and Kalman filtering. ISCAS 2010: 3032-3035
2000 – 2009
- 2009
- [j13]Jun He, Sanyi Zhan, Degang Chen, Randall L. Geiger:
Analyses of Static and Dynamic Random Offset Voltages in Dynamic Comparators. IEEE Trans. Circuits Syst. I Regul. Pap. 56-I(5): 911-919 (2009) - [j12]Le Jin, Degang Chen, Randall L. Geiger:
Code-Density Test of Analog-to-Digital Converters Using Single Low-Linearity Stimulus Signal. IEEE Trans. Instrum. Meas. 58(8): 2679-2685 (2009) - [j11]Hanqing Xing, Hanjun Jiang, Degang Chen, Randall L. Geiger:
High-Resolution ADC Linearity Testing Using a Fully Digital-Compatible BIST Strategy. IEEE Trans. Instrum. Meas. 58(8): 2697-2705 (2009) - [c80]Bharath K. Vasan, Jingbo Duan, Chen Zhao, Randall L. Geiger, Degang Chen:
Signal generators for cost effective BIST of ADCs. ECCTD 2009: 113-116 - [c79]Jingbo Duan, Degang Chen, Randall L. Geiger:
Cost Effective Signal Generators for ADC BIST. ISCAS 2009: 13-16 - [c78]Thu T. Duong, Degang Chen, Randall L. Geiger:
Optimal Area and Impedance Allocation for Dual-string DACs. ISCAS 2009: 2741-2744 - 2008
- [j10]Le Jin, Hosam Haggag, Randall L. Geiger, Degang Chen:
Testing of Precision DAC Using Low-Resolution ADC With Wobbling. IEEE Trans. Instrum. Meas. 57(5): 940-946 (2008) - [c77]Hanqing Xing, Degang Chen, Randall L. Geiger:
On-chip at-speed linearity testing of high-resolution high-speed DACs using DDEM ADCs with dithering. EIT 2008: 117-122 - [c76]Jacob D. Sloat, Randall L. Geiger:
An inexpensive microelectronic environmental test chamber. EIT 2008: 168-170 - [c75]Jun He, Sanyi Zhan, Degang Chen, Randall L. Geiger:
A simple and accurate method to predict offset voltage in dynamic comparators. ISCAS 2008: 1934-1937 - [c74]Vipul Katyal, Randall L. Geiger, Degang Chen:
Adjustable hysteresis CMOS Schmitt triggers. ISCAS 2008: 1938-1941 - [c73]Hanqing Xing, Degang Chen, Randall L. Geiger, Le Jin:
System identification -based reduced-code testing for pipeline ADCs' linearity test. ISCAS 2008: 2402-2405 - 2007
- [j9]Chengming He, Le Jin, Degang Chen, Randy Geiger:
Robust High-Gain Amplifier Design Using Dynamical Systems and Bifurcation Theory With Digital Postprocessing Techniques. IEEE Trans. Circuits Syst. I Regul. Pap. 54-I(5): 964-973 (2007) - [j8]Hanjun Jiang, Beatriz Olleta, Degang Chen, Randall L. Geiger:
Testing High-Resolution ADCs With Low-Resolution/Accuracy Deterministic Dynamic Element Matched DACs. IEEE Trans. Instrum. Meas. 56(5): 1753-1762 (2007) - [j7]Le Jin, Degang Chen, Randall L. Geiger:
SEIR Linearity Testing of Precision A/D Converters in Nonstationary Environments With Center-Symmetric Interleaving. IEEE Trans. Instrum. Meas. 56(5): 1776-1785 (2007) - [c72]Haibo Fei, Randall L. Geiger:
Linear Current Division Principles. ISCAS 2007: 2830-2833 - [c71]Hanjun Jiang, Degang Chen, Randall L. Geiger:
Deterministic DEM DAC Performance Analysis. ISCAS 2007: 3860-3863 - [c70]Hanqing Xing, Hanjun Jiang, Degang Chen, Randall L. Geiger:
A fully digital-compatible BIST strategy for ADC linearity testing. ITC 2007: 1-10 - [c69]Le Jin, Degang Chen, Randall L. Geiger:
Code-Density Test of Analog-to-Digital Converters Using Single Low-Linearity Stimulus Signal. VTS 2007: 303-310 - 2006
- [j6]Yu Lin, Degang Chen, Randall L. Geiger:
Yield enhancement with optimal area allocation for ratio-critical analog circuits. IEEE Trans. Circuits Syst. I Regul. Pap. 53-I(3): 534-553 (2006) - [j5]Beatriz Olleta, Hanjun Jiang, Degang Chen, Randall L. Geiger:
A deterministic dynamic element matching approach for testing high-resolution ADCs with low-accuracy excitations. IEEE Trans. Instrum. Meas. 55(3): 902-915 (2006) - [c68]Vipul Katyal, Randall L. Geiger, Degang Chen:
A New High Precision Low Offset Dynamic Comparator for High Resolution High Speed ADCs. APCCAS 2006: 5-8 - [c67]Xin Dai, Degang Chen, Randall L. Geiger:
Explicit characterization of bandgap references. ISCAS 2006 - [c66]Le Jin, Hanqing Xing, Degang Chen, Randall L. Geiger:
A self-calibrated bandgap voltage reference with 0.5 ppm/°C temperature coefficient. ISCAS 2006 - [c65]Yu Lin, Randall L. Geiger:
Unit resistor characterization for matching-critical circuit design. ISCAS 2006 - [c64]Chao Su, Randall L. Geiger:
Dynamic calibration of current-steering DAC. ISCAS 2006 - [c63]Kazuyuki Wada, Randall L. Geiger:
Minimization of total area in integrated active RC filters. ISCAS 2006 - [c62]Hanqing Xing, Degang Chen, Randall L. Geiger:
Linearity test for high resolution DACs using low-accuracy DDEM flash ADCs. ISCAS 2006 - [c61]Hanqing Xing, Le Jin, Degang Chen, Randall L. Geiger:
Characterization of a current-mode bandgap circuit structure for high-precision reference applications. ISCAS 2006 - [c60]Le Jin, Degang Chen, Randall L. Geiger:
Linearity Test of Analog-to-Digital Converters Using Kalman Filtering. ITC 2006: 1-9 - [c59]Le Jin, Hosam Haggag, Randall L. Geiger, Degang Chen:
Testing of Precision DACs Using Low-Resolution ADCs with Dithering. ITC 2006: 1-10 - 2005
- [j4]Le Jin, Kumar L. Parthasarathy, Turker Kuyel, Degang Chen, Randall L. Geiger:
Accurate testing of analog-to-digital converters using low linearity signals with stimulus error identification and removal. IEEE Trans. Instrum. Meas. 54(3): 1188-1199 (2005) - [c58]Beatriz Olleta, Hanjun Jiang, Degang Chen, Randall L. Geiger:
A segmented thermometer coded DAC with deterministic dynamic element matching for high resolution ADC test. ISCAS (1) 2005: 784-787 - [c57]Zhongjun Yu, Degang Chen, Randall L. Geiger, Ioannis Papantonopoulos:
Pipeline ADC linearity testing with dramatically reduced data capture time. ISCAS (1) 2005: 792-795 - [c56]Le Jin, Degang Chen, Randall L. Geiger:
A digital self-calibration algorithm for ADCs based on histogram test using low-linearity input signals. ISCAS (2) 2005: 1378-1381 - [c55]Yu Lin, Vipul Katyal, Randall L. Geiger:
Power dependence of feedback amplifiers on opamp architecture. ISCAS (2) 2005: 1618-1621 - [c54]Yu Lin, Vipul Katyal, Mark Schlarmann, Randall L. Geiger:
kT/C constrained optimization of power in pipeline ADCs. ISCAS (3) 2005: 1968-1971 - [c53]Wenbo Liu, Hanqing Xing, Le Jin, Randall L. Geiger, Degang Chen:
A test strategy for time-to-digital converters using dynamic element matching and dithering. ISCAS (4) 2005: 3809-3812 - [c52]Hanjun Jiang, Degang Chen, Randall L. Geiger:
Dither incorporated deterministic dynamic element matching for high resolution ADC test using extremely low resolution DACs. ISCAS (5) 2005: 4285-4288 - [c51]Hanqing Xing, Degang Chen, Randall L. Geiger:
A two-step DDEM ADC for accurate and cost-effective DAC testing. ISCAS (5) 2005: 4289-4292 - [c50]Xin Dai, Degang Chen, Randall L. Geiger:
A cost-effective histogram test-based algorithm for digital calibration of high-precision pipelined ADCs. ISCAS (5) 2005: 4831-4834 - [c49]Xin Dai, Chengming He, Hanqing Xing, Degang Chen, Randall L. Geiger:
An Nth order central symmetrical layout pattern for nonlinear gradients cancellation. ISCAS (5) 2005: 4835-4838 - [c48]Sreenath Thoka, Randall L. Geiger:
Fast-switching adaptive bandwidth frequency synthesizer using a loop filter with switched zero-resistor array. ISCAS (6) 2005: 5373-5376 - [c47]Degang Chen, Zhongjun Yu, Randall L. Geiger:
An adaptive, truly background calibration method for high speed pipeline ADC design. ISCAS (6) 2005: 6190-6193 - [c46]Le Jin, Kumar L. Parthasarathy, Turker Kuyel, Randall L. Geiger, Degang Chen:
High-performance ADC linearity test using low-precision signals in non-stationary environments. ITC 2005: 10 - [c45]Kumar L. Parthasarathy, Turker Kuyel, Zhongjun Yu, Degang Chen, Randall L. Geiger:
A 16-bit resistor string DAC with full-calibration at final test. ITC 2005: 10 - 2004
- [c44]Hanjun Jiang, Haibo Fei, Degang Chen, Randall L. Geiger:
A background digital self-calibration scheme for pipelined ADCs based on transfer curve estimation. ISCAS (1) 2004: 61-64 - [c43]Chengming He, Kuangming Yap, Degang Chen, Randall L. Geiger:
NTH order circular symmetry pattern and hexagonal tesselation: two new layout techniques cancelling nonlinear gradient. ISCAS (1) 2004: 237-240 - [c42]Zhongjun Yu, Degang Chen, Randall L. Geiger:
The SRE/SRM approach for spectral testing of AMS circuits. ISCAS (1) 2004: 249-252 - [c41]Chengming He, Le Jin, Degang Chen, Randall L. Geiger:
Robust design of high gain amplifiers using dynamical systems and bifurcation theory. ISCAS (1) 2004: 481-484 - [c40]Zhongjun Yu, Degang Chen, Randall L. Geiger:
Accurate testing of ADC's spectral performance using imprecise sinusoidal excitations. ISCAS (1) 2004: 645-648 - [c39]Haibo Fei, Randall L. Geiger, Degang Chen:
Optimum area allocation for resistors and capacitors in continuous-time monolithic filters. ISCAS (1) 2004: 865-868 - [c38]Beatriz Olleta, Hanjun Jiang, Degang Chen, Randall L. Geiger:
Testing high resolution ADCs using deterministic dynamic element matching. ISCAS (1) 2004: 920-923 - [c37]Beatriz Olleta, Hanjun Jiang, Degang Chen, Randall L. Geiger:
Parameter optimization of deterministic dynamic element matching DACs for accurate and cost-effective ADC testing. ISCAS (1) 2004: 924-927 - [c36]Le Jin, Chengming He, Degang Chen, Randall L. Geiger:
An SoC compatible linearity test approach for precision ADCs using easy-to-generate sinusoidal stimuli. ISCAS (1) 2004: 928-931 - [c35]Le Jin, Chengming He, Degang Chen, Randall L. Geiger:
Fast implementation of a linearity test approach for high-resolution ADCs using non-linear ramp signals. ISCAS (1) 2004: 932-935 - [c34]Hanjun Jiang, Beatriz Olleta, Degang Chen, Randall L. Geiger:
Testing High Resolution ADCs with Low Resolution/Accuracy Deterministic Dynamic Element Matched DACs. ITC 2004: 1379-1388 - [c33]Zhongjun Yu, Degang Chen, Randall L. Geiger:
A Computationally Efficient Method for Accurate Spectral Testing without Requiring Coherent Sampling. ITC 2004: 1398-1407 - 2003
- [j3]Yonghua Cong, Randall L. Geiger:
A 1.5-V 14-bit 100-MS/s self-calibrated DAC. IEEE J. Solid State Circuits 38(12): 2051-2060 (2003) - [j2]Kumar L. Parthasarathy, Turker Kuyel, Dana Price, Le Jin, Degang Chen, Randall L. Geiger:
BIST and production testing of ADCs using imprecise stimulus. ACM Trans. Design Autom. Electr. Syst. 8(4): 522-545 (2003) - [c32]