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"High-Resolution ADC Linearity Testing Using a Fully Digital-Compatible ..."
Hanqing Xing et al. (2009)
- Hanqing Xing, Hanjun Jiang, Degang Chen, Randall L. Geiger:
High-Resolution ADC Linearity Testing Using a Fully Digital-Compatible BIST Strategy. IEEE Trans. Instrum. Meas. 58(8): 2697-2705 (2009)
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