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"BIST and production testing of ADCs using imprecise stimulus."

Kumar L. Parthasarathy et al. (2003)

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DOI: 10.1145/944027.944035

access: closed

type: Journal Article

metadata version: 2022-07-26

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  - journals/todaes/ParthasarathyKPJCG03
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  - https://dblp.org/rec/journals/todaes/ParthasarathyKPJCG03
Kumar L. Parthasarathy, Turker Kuyel, Dana Price, Le Jin, Degang Chen, Randall L. Geiger:
BIST and production testing of ADCs using imprecise stimulus. ACM Trans. Design Autom. Electr. Syst. 8(4): 522-545 (2003)

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