"A Low-Cost On-Chip Built-In Self-Test Solution for ADC Linearity Test."

Tao Chen et al. (2020)

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DOI: 10.1109/TIM.2019.2936716

access: closed

type: Journal Article

metadata version: 2022-07-26

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Tao Chen, Chulhyun Park, Hao Meng, Dadian Zhou, José Silva-Martínez, Randall L. Geiger, Degang Chen:
A Low-Cost On-Chip Built-In Self-Test Solution for ADC Linearity Test. IEEE Trans. Instrum. Meas. 69(6): 3516-3526 (2020)

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