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"Testing High-Resolution ADCs With Low-Resolution/Accuracy Deterministic ..."

Hanjun Jiang et al. (2007)

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DOI: 10.1109/TIM.2007.903621

access: closed

type: Journal Article

metadata version: 2022-07-26

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Hanjun Jiang, Beatriz Olleta, Degang Chen, Randall L. Geiger:
Testing High-Resolution ADCs With Low-Resolution/Accuracy Deterministic Dynamic Element Matched DACs. IEEE Trans. Instrum. Meas. 56(5): 1753-1762 (2007)

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