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"Testing of Precision DACs Using Low-Resolution ADCs with Dithering."

Le Jin et al. (2006)

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DOI: 10.1109/TEST.2006.297628

access: closed

type: Conference or Workshop Paper

metadata version: 2022-07-26

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  - conf/itc/JinHGC06
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Le Jin, Hosam Haggag, Randall L. Geiger, Degang Chen:
Testing of Precision DACs Using Low-Resolution ADCs with Dithering. ITC 2006: 1-10

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