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"Reliability modeling of metal interconnects with time-dependent electrical ..."

Srijita Patra, Degang Chen, Randy Geiger (2012)

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DOI: 10.1109/MWSCAS.2012.6292070

access: closed

type: Conference or Workshop Paper

metadata version: 2022-07-26

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Srijita Patra, Degang Chen, Randy Geiger:
Reliability modeling of metal interconnects with time-dependent electrical and thermal stress. MWSCAS 2012: 514-517

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