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Philippe Perdu
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2010 – 2019
- 2018
- [j75]Anthony Boscaro, Sabir Jacquir, Samuel Chef, Kevin Sanchez, Philippe Perdu, Stéphane Binczak:
Automatic localization of signal sources in photon emission images for integrated circuit analysis. Signal Image Video Process. 12(4): 775-782 (2018) - 2017
- [j74]Anthony Boscaro, Sabir Jacquir, Kevin Sanchez, Philippe Perdu, Stéphane Binczak:
Pattern image enhancement by automatic focus correction. Microelectron. Reliab. 76-77: 249-254 (2017) - [c5]Anthony Boscaro, Sabir Jacquir, Kevin Sanchez, Philippe Perdu, Stéphane Binczak:
Automatic defect localization in VLSI circuits: A fusion approach based on the Dempster-Shafer theory. FUSION 2017: 1-8 - 2016
- [j73]Chung Tah Chua, Hock Guan Ong, Kevin Sanchez, Philippe Perdu, Chee Lip Gan:
Effects of voltage stress on the single event upset (SEU) response of 65 nm flip flop. Microelectron. Reliab. 64: 199-203 (2016) - [j72]Anthony Boscaro, Sabir Jacquir, Kevin Melendez, Kevin Sanchez, Philippe Perdu, Stéphane Binczak:
Automatic process for time-frequency scan of VLSI. Microelectron. Reliab. 64: 299-305 (2016) - 2015
- [j71]Samuel Chef, Sabir Jacquir, Kevin Sanchez, Philippe Perdu, Stéphane Binczak:
Unsupervised image processing scheme for transistor photon emission analysis in order to identify defect location. J. Electronic Imaging 24(1): 013019 (2015) - [j70]Marise Bafleur, Philippe Perdu, François Marc, Hélène Frémont, Nicolas Nolhier:
Editorial. Microelectron. Reliab. 55(9-10): 1269-1270 (2015) - [j69]Samuel Chef, Sabir Jacquir, Kevin Sanchez, Philippe Perdu, Stéphane Binczak, Chee Lip Gan:
Unsupervised learning for signal mapping in dynamic photon emission. Microelectron. Reliab. 55(9-10): 1564-1568 (2015) - [j68]Anthony Boscaro, Sabir Jacquir, Kevin Sanchez, Philippe Perdu, Stéphane Binczak:
Improvement of signal to noise ratio in electro optical probing technique by wavelets filtering. Microelectron. Reliab. 55(9-10): 1585-1591 (2015) - [j67]Nicolas Courjault, Philippe Perdu, Fulvio Infante, Thierry Lebey, Vincent Bley:
Magnetic imaging for resistive, capacitive and inductive devices; from theory to piezo actuator failure localization. Microelectron. Reliab. 55(9-10): 1622-1627 (2015) - [j66]Kevin Melendez, A. Desmoulin, Kevin Sanchez, Philippe Perdu, Dean Lewis:
A way to implement the electro-optical technique to inertial MEMS. Microelectron. Reliab. 55(9-10): 1916-1919 (2015) - 2014
- [j65]Mohamed Mehdi Rebaï, Frédéric Darracq, Jean-Paul Guillet, Elise Bernou, Kevin Sanchez, Philippe Perdu, Dean Lewis:
A comprehensive study of the application of the EOP techniques on bipolar devices. Microelectron. Reliab. 54(9-10): 2088-2092 (2014) - [j64]Samuel Chef, Bastien Billiot, Sabir Jacquir, Kevin Sanchez, Philippe Perdu, Stéphane Binczak:
Pattern image enhancement by extended depth of field. Microelectron. Reliab. 54(9-10): 2099-2104 (2014) - [j63]Arkadiusz Glowacki, Christian Boit, Philippe Perdu, Yoshitaka Iwaki:
Backside spectroscopic photon emission microscopy using intensified silicon CCD. Microelectron. Reliab. 54(9-10): 2105-2108 (2014) - 2013
- [j62]I. El Moukhtari, Vincent Pouget, C. Larue, Frédéric Darracq, Dean Lewis, Philippe Perdu:
Impact of negative bias temperature instability on the single-event upset threshold of a 65 nm SRAM cell. Microelectron. Reliab. 53(9-11): 1325-1328 (2013) - [j61]Samuel Chef, Sabir Jacquir, Kevin Sanchez, Philippe Perdu, Stéphane Binczak:
Frequency mapping in dynamic light emission with wavelet transform. Microelectron. Reliab. 53(9-11): 1387-1392 (2013) - 2012
- [j60]Arkadiusz Glowacki, Christian Boit, Philippe Perdu:
Optimum Si thickness for backside detection of photon emission using Si-CCD. Microelectron. Reliab. 52(9-10): 2031-2034 (2012) - [j59]Guillaume Bascoul, Philippe Perdu, Maryse Béguin, Dean Lewis:
High performance thermography with InGaAs photon counting camera. Microelectron. Reliab. 52(9-10): 2087-2092 (2012) - 2011
- [j58]Arkadiusz Glowacki, Christian Boit, Philippe Perdu:
Performance improvement of Si-CCD detector based backside reflected light and photon emission microscopy by FIB ultimate substrate thinning. Microelectron. Reliab. 51(9-11): 1632-1636 (2011) - [j57]Guillaume Bascoul, Philippe Perdu, A. Benigni, Sylvain Dudit, Guillaume Celi, Dean Lewis:
Time Resolved Imaging: From logical states to events, a new and efficient pattern matching method for VLSI analysis. Microelectron. Reliab. 51(9-11): 1640-1645 (2011) - [j56]Guillaume Celi, Sylvain Dudit, Thierry Parrassin, Philippe Perdu, Antoine Reverdy, Dean Lewis, Michel Vallet:
LVI detection on passive structure in advance CMOS technology: New opportunities for device analysis. Microelectron. Reliab. 51(9-11): 1662-1667 (2011) - [j55]Fulvio Infante, Philippe Perdu, H. B. Kor, Chee Lip Gan, Dean Lewis:
Magnetic field spatial Fourier analysis: A new opportunity for high resolution current localization. Microelectron. Reliab. 51(9-11): 1684-1688 (2011) - 2010
- [j54]A. Deyine, Kevin Sanchez, Philippe Perdu, F. Battistella, Dean Lewis:
CADless laser assisted methodologies for failure analysis and device reliability. Microelectron. Reliab. 50(9-11): 1236-1240 (2010) - [j53]Philippe Perdu, Jerome Di-Battista, Sylvain Dudit, Tomonori Nakamura:
VLSI functional analysis by dynamic emission microscopy. Microelectron. Reliab. 50(9-11): 1431-1435 (2010) - [j52]Guillaume Celi, Sylvain Dudit, Philippe Perdu, Antoine Reverdy, Thierry Parrassin, Emmanuel Bechet, Dean Lewis, Michel Vallet:
Facing the defect characterization and localization challenges of bridge defects on a submicronic technology (45 nm and below). Microelectron. Reliab. 50(9-11): 1499-1505 (2010) - [j51]Fulvio Infante, Philippe Perdu, Dean Lewis:
Magnetic microscopy for ground plane current detection: a fast and reliable technique for current leakage localization by means of magnetic simulations. Microelectron. Reliab. 50(9-11): 1700-1705 (2010) - [c4]Jerome Di-Battista, Jean-Christophe Courrège, Bruno Rouzeyre, Lionel Torres, Philippe Perdu:
When Failure Analysis Meets Side-Channel Attacks. CHES 2010: 188-202
2000 – 2009
- 2009
- [j50]Fulvio Infante, Philippe Perdu, Dean Lewis:
Magnetic microscopy for 3D devices: Defect localization with high resolution and long working distance on complex system in package. Microelectron. Reliab. 49(9-11): 1169-1174 (2009) - [j49]F. Molière, B. Foucher, Philippe Perdu, Alain Bravaix:
Analysis of deep submicron VLSI technological risks: A new qualification process for professional electronics. Microelectron. Reliab. 49(9-11): 1381-1385 (2009) - 2008
- [j48]Antoine Reverdy, Philippe Perdu, H. Murray, M. de la Bardonnie, Patrick Poirier:
Fast and rigorous use of thermal time constant to characterize back end of the line test structure in advanced technology. Microelectron. Reliab. 48(8-9): 1279-1284 (2008) - [j47]Aziz Machouat, Gérald Haller, Vincent Goubier, Dean Lewis, Philippe Perdu, Vincent Pouget, Pascal Fouillat, Fabien Essely:
Effect of physical defect on shmoos in CMOS DSM technologies. Microelectron. Reliab. 48(8-9): 1333-1338 (2008) - [j46]Mohsine Bouya, Nathalie Malbert, Nathalie Labat, D. Carisetti, Philippe Perdu, J. C. Clement, Benoit Lambert, M. Bonnet:
Analysis of traps effect on AlGaN/GaN HEMT by luminescence techniques. Microelectron. Reliab. 48(8-9): 1366-1369 (2008) - [j45]Magdalena Sienkiewicz, Philippe Perdu, Abdellatif Firiti, Kevin Sanchez, Olivier Crépel, Dean Lewis:
Failure Analysis enhancement by evaluating the Photoelectric Laser Stimulation impact on mixed-mode ICs. Microelectron. Reliab. 48(8-9): 1529-1532 (2008) - [j44]Julie Ferrigno, Aziz Machouat, Philippe Perdu, Dean Lewis, Gérald Haller, Vincent Goubier:
Generic simulator for faulty IC. Microelectron. Reliab. 48(8-9): 1592-1596 (2008) - [j43]Antoine Reverdy, M. de la Bardonnie, Patrick Poirier, H. Murray, Philippe Perdu, A. Boukkali:
Dynamic study of the thermal laser stimulation response on advanced technology structures. Microelectron. Reliab. 48(10): 1689-1695 (2008) - 2007
- [j42]Felix Beaudoin, Kevin Sanchez, Philippe Perdu:
Dynamic laser stimulation techniques for advanced failure analysis and design debug applications. Microelectron. Reliab. 47(9-11): 1517-1522 (2007) - [j41]A. Crosson, Laurent Escotte, Marise Bafleur, D. Talbourdet, L. Crétinon, Philippe Perdu, Guy Perez:
Long-term reliability of silicon bipolar transistors subjected to low constraints. Microelectron. Reliab. 47(9-11): 1590-1594 (2007) - [j40]Mohsine Bouya, D. Carisetti, Nathalie Malbert, Nathalie Labat, Philippe Perdu, J. C. Clement, M. Bonnet, G. Pataut:
Study of passivation defects by electroluminescence in AlGaN/GaN HEMTS on SiC. Microelectron. Reliab. 47(9-11): 1630-1633 (2007) - [c3]Julie Ferrigno, Philippe Perdu, Kevin Sanchez, Dean Lewis:
Identification of process/design issues during 0.18 µm technology qualification for space application. DATE 2007: 989-993 - 2006
- [j39]Alexandre Douin, Vincent Pouget, M. De Matos, Dean Lewis, Philippe Perdu, Pascal Fouillat:
Time resolved imaging using synchronous picosecond Photoelectric Laser Stimulation. Microelectron. Reliab. 46(9-11): 1514-1519 (2006) - [j38]Fabien Essely, Frédéric Darracq, Vincent Pouget, Mustapha Remmach, Felix Beaudoin, Nicolas Guitard, Marise Bafleur, Philippe Perdu, André Touboul, Dean Lewis:
Application of various optical techniques for ESD defect localization. Microelectron. Reliab. 46(9-11): 1563-1568 (2006) - [j37]Christophe De Nardi, Romain Desplats, Philippe Perdu, Jean-Luc Gauffier, Christophe Guérin:
Descrambling and data reading techniques for flash-EEPROM memories. Application to smart cards. Microelectron. Reliab. 46(9-11): 1569-1574 (2006) - 2005
- [j36]Nicolas Guitard, Fabien Essely, David Trémouilles, Marise Bafleur, Nicolas Nolhier, Philippe Perdu, André Touboul, Vincent Pouget, Dean Lewis:
Different Failure signatures of multiple TLP and HBM Stresses in an ESD robust protection structure. Microelectron. Reliab. 45(9-11): 1415-1420 (2005) - [j35]Kevin Sanchez, Romain Desplats, Felix Beaudoin, Philippe Perdu, J. P. Roux, G. Woods, Dean Lewis:
NIR laser stimulation for dynamic timing analysis. Microelectron. Reliab. 45(9-11): 1459-1464 (2005) - [j34]Abdellatif Firiti, Felix Beaudoin, Gérald Haller, Philippe Perdu, Dean Lewis, Pascal Fouillat:
Impact of semiconductors material on IR Laser Stimulation signal. Microelectron. Reliab. 45(9-11): 1465-1470 (2005) - [j33]Mustapha Remmach, A. Pigozzi, Romain Desplats, Philippe Perdu, Dean Lewis, J. Noel, Sylvain Dudit:
Light Emission to Time Resolved Emission For IC Debug and Failure Analysis. Microelectron. Reliab. 45(9-11): 1476-1481 (2005) - [j32]C. De Nardi, Romain Desplats, Philippe Perdu, Felix Beaudoin, J.-L. Gauffier:
Oxide charge measurements in EEPROM devices. Microelectron. Reliab. 45(9-11): 1514-1519 (2005) - [j31]Felix Beaudoin, Kevin Sanchez, Romain Desplats, Philippe Perdu, Jean Marc Nicot, J. P. Roux, M. Otte:
Dynamic Laser Stimulation Case Studies. Microelectron. Reliab. 45(9-11): 1538-1543 (2005) - [j30]Danick Briand, Felix Beaudoin, Jérôme Courbat, Nico F. de Rooij, Romain Desplats, Philippe Perdu:
Failure analysis of micro-heating elements suspended on thin membranes. Microelectron. Reliab. 45(9-11): 1786-1789 (2005) - [c2]Alexandre Douin, Vincent Pouget, Dean Lewis, Pascal Fouillat, Philippe Perdu:
Electrical Modeling for Laser Testing with Different Pulse Durations. IOLTS 2005: 9-13 - 2004
- [j29]Alberto Tosi, Mustapha Remmach, Romain Desplats, Franco Zappa, Philippe Perdu:
Implementation of TRE systems into Emission Microscopes. Microelectron. Reliab. 44(9-11): 1529-1534 (2004) - [j28]Olivier Crépel, Patrick Poirier, Philippe Descamps, Romain Desplats, Philippe Perdu, Gérald Haller, Abdellatif Firiti:
Magnetic Microscopy for IC Failure Analysis: Comparative Case Studies using SQUID, GMR and MTJ systems. Microelectron. Reliab. 44(9-11): 1559-1563 (2004) - [j27]Felix Beaudoin, J. López, M. Faucon, Romain Desplats, Philippe Perdu:
Femtosecond Laser Ablation for Backside Silicon Thinning. Microelectron. Reliab. 44(9-11): 1605-1609 (2004) - [j26]Romain Desplats, Gaël Faggion, Mustapha Remmach, Felix Beaudoin, Philippe Perdu, Dean Lewis:
Time Resolved Photon Emission Processing Flow for IC Analysis. Microelectron. Reliab. 44(9-11): 1655-1662 (2004) - [j25]Abdellatif Firiti, Felix Beaudoin, Gérald Haller, Philippe Perdu, Dean Lewis, Pascal Fouillat:
Understanding the effects of NIR laser stimulation on NMOS transistor. Microelectron. Reliab. 44(9-11): 1675-1680 (2004) - [j24]Mustapha Remmach, Romain Desplats, Philippe Perdu, J. P. Roux, Michel Vallet, Sylvain Dudit, P. Sardin, Dean Lewis:
Light Emission From Small Technologies. Are Silicon Based Detectors Reaching Their Limits? Microelectron. Reliab. 44(9-11): 1715-1720 (2004) - [j23]Nicolas Guitard, David Trémouilles, Marise Bafleur, Laurent Escotte, Laurent Bary, Philippe Perdu, Gérard Sarrabayrouse, Nicolas Nolhier, Roberto Reyna-Rojas:
Low Frequency Noise Measurements for ESD Latent Defect Detection in High Reliability Applications. Microelectron. Reliab. 44(9-11): 1781-1786 (2004) - [j22]Fabien Essely, Corinne Bestory, Nicolas Guitard, Marise Bafleur, A. Wislez, E. Doche, Philippe Perdu, André Touboul, Dean Lewis:
Study of the ESD defects impact on ICs reliability. Microelectron. Reliab. 44(9-11): 1811-1815 (2004) - 2003
- [j21]David Trémouilles, Géraldine Bertrand, Marise Bafleur, Felix Beaudoin, Philippe Perdu, Nicolas Guitard, Lionel Lescouzères:
TCAD and SPICE modeling help solve ESD protection issues in analog CMOS technology. Microelectron. Reliab. 43(1): 71-79 (2003) - [j20]Thomas Beauchêne, Dean Lewis, Felix Beaudoin, Vincent Pouget, Philippe Perdu, Pascal Fouillat, Yves Danto:
A physical approach on SCOBIC investigation in VLSI. Microelectron. Reliab. 43(1): 173-177 (2003) - [j19]Thomas Beauchêne, Dean Lewis, Felix Beaudoin, Vincent Pouget, Romain Desplats, Pascal Fouillat, Philippe Perdu, Marise Bafleur, David Trémouilles:
Thermal laser stimulation and NB-OBIC techniques applied to ESD defect localization. Microelectron. Reliab. 43(3): 439-444 (2003) - [j18]Abdellatif Firiti, D. Faujour, Gérald Haller, J. M. Moragues, Vincent Goubier, Philippe Perdu, Felix Beaudoin, Dean Lewis:
Short defect characterization based on TCR parameter extraction. Microelectron. Reliab. 43(9-11): 1563-1568 (2003) - [j17]Thomas Beauchêne, David Trémouilles, Dean Lewis, Philippe Perdu, Pascal Fouillat:
Characterization of ESD induced defects using Photovoltaic Laser Stimulation (PLS). Microelectron. Reliab. 43(9-11): 1577-1582 (2003) - [j16]Mustapha Remmach, Romain Desplats, Felix Beaudoin, E. Frances, Philippe Perdu, Dean Lewis:
Time Resolved Photoemission (PICA) - From the Physics to Practical Considerations. Microelectron. Reliab. 43(9-11): 1639-1644 (2003) - [j15]Romain Desplats, A. Eral, Felix Beaudoin, Philippe Perdu, Alan J. Weger, Moyra K. McManus, Peilin Song, Franco Stellari:
Faster IC Analysis with PICA Spatial Temporal Photon Correlation and CAD Autochanneling. Microelectron. Reliab. 43(9-11): 1663-1668 (2003) - [j14]Felix Beaudoin, Romain Desplats, Philippe Perdu, Abdellatif Firiti, Gérald Haller, Vincent Pouget, Dean Lewis:
From Static Thermal and Photoelectric Laser Stimulation (TLS/PLS) to Dynamic Laser Testing. Microelectron. Reliab. 43(9-11): 1681-1686 (2003) - [j13]Kevin Sanchez, Romain Desplats, Guy Perez, V. Pichetto, Felix Beaudoin, Philippe Perdu:
Solar Cell Analysis with Light Emission and OBIC Techniques. Microelectron. Reliab. 43(9-11): 1755-1760 (2003) - [j12]Olivier Crépel, Romain Desplats, Y. Bouttement, Philippe Perdu, C. Goupil, Philippe Descamps, Felix Beaudoin, L. Marina:
Magnetic emission mapping for passive integrated components characterisation. Microelectron. Reliab. 43(9-11): 1809-1814 (2003) - [c1]Romain Desplats, Felix Beaudoin, Philippe Perdu, Nagamani Nataraj, Ted R. Lundquist, Ketan Shah:
Fault Localization using Time Resolved Photon Emission and STIL Waveforms. ITC 2003: 254-263 - 2002
- [j11]Felix Beaudoin, D. Carisetti, Romain Desplats, Philippe Perdu, Dean Lewis, J. C. Clement:
Backside Defect Localizations and Revelations Techniques on Gallium Arsenide (GaAs) Devices. Microelectron. Reliab. 42(9-11): 1581-1585 (2002) - [j10]Felix Beaudoin, Gérald Haller, Philippe Perdu, Romain Desplats, Thomas Beauchêne, Dean Lewis:
Reliability Defect Monitoring with Thermal Laser Stimulation: Biased Versus Unbiased. Microelectron. Reliab. 42(9-11): 1729-1734 (2002) - [j9]Olivier Crépel, Felix Beaudoin, Lionel Dantas de Morais, Gérald Haller, C. Goupil, Philippe Perdu, Romain Desplats, Dean Lewis:
Backside Hot Spot Detection Using Liquid Crystal Microscopy. Microelectron. Reliab. 42(9-11): 1741-1746 (2002) - [j8]Olivier Crépel, C. Goupil, Bernadette Domengès, Philippe Descamps, Philippe Perdu, A. Doukkali:
Magnetic field measurements for Non Destructive Failure Analysis. Microelectron. Reliab. 42(9-11): 1763-1766 (2002) - [j7]Djemel Lellouchi, Felix Beaudoin, Christophe Le Touze, Philippe Perdu, Romain Desplats:
IR confocal laser microscopy for MEMS Technological Evaluation. Microelectron. Reliab. 42(9-11): 1815-1817 (2002) - 2001
- [j6]Géraldine Bertrand, Christelle Delage, Marise Bafleur, Nicolas Nolhier, Jean-Marie Dorkel, Quang Nguyen, Nicolas Mauran, David Trémouilles, Philippe Perdu:
Analysis and compact modeling of a vertical grounded-base n-p-n bipolar transistor used as ESD protection in a smart power technology. IEEE J. Solid State Circuits 36(9): 1373-1381 (2001) - [j5]Dean Lewis, Vincent Pouget, Thomas Beauchêne, Hervé Lapuyade, Pascal Fouillat, André Touboul, Felix Beaudoin, Philippe Perdu:
Front Side and Backside OBIT Mappings applied to Single Event Transient Testing. Microelectron. Reliab. 41(9-10): 1471-1476 (2001) - [j4]Felix Beaudoin, X. Chauffleur, Jean-Pierre Fradin, Philippe Perdu, Romain Desplats, Dean Lewis:
Modeling Thermal Laser Stimulation. Microelectron. Reliab. 41(9-10): 1477-1482 (2001) - [j3]Romain Desplats, Philippe Perdu, Felix Beaudoin:
A New Versatile Testing Interface for Failure Analysis in Integrated Circuits. Microelectron. Reliab. 41(9-10): 1495-1499 (2001) - [j2]Romain Desplats, Felix Beaudoin, Philippe Perdu, Patrick Poirier, David Trémouilles, Marise Bafleur, Dean Lewis:
Backside Localization of Current Leakage Faults Using Thermal Laser Stimulation. Microelectron. Reliab. 41(9-10): 1539-1544 (2001) - [j1]Felix Beaudoin, Philippe Perdu, Romain Desplats, Sebastien Rigo, Dean Lewis:
Silicon Thinning and Polishing on Packaged Devices. Microelectron. Reliab. 41(9-10): 1557-1561 (2001)
Coauthor Index
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