"Study of the ESD defects impact on ICs reliability."

Fabien Essely et al. (2004)

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DOI: 10.1016/J.MICROREL.2004.07.090

access: closed

type: Journal Article

metadata version: 2020-02-22

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  - https://dblp.org/rec/journals/mr/EsselyBGBWDPTL04
Fabien Essely, Corinne Bestory, Nicolas Guitard, Marise Bafleur, A. Wislez, E. Doche, Philippe Perdu, André Touboul, Dean Lewis:
Study of the ESD defects impact on ICs reliability. Microelectron. Reliab. 44(9-11): 1811-1815 (2004)

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