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ORCIDKevin Sanchez
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2020 – today
- 2022
[j20]Kevin Sanchez, Bilel Achour
, Antony Coustou, Aurélie Lecestre, Samuel Charlot, Maylis Lavayssière, Alexandre Lefrançois, Hervé Aubert, Patrick Pons:
Transient Response of Miniature Piezoresistive Pressure Sensor Dedicated to Blast Wave Monitoring. Sensors 22(24): 9571 (2022)
2010 – 2019
- 2018
- [j19]Anthony Boscaro, Sabir Jacquir, Samuel Chef, Kevin Sanchez, Philippe Perdu, Stéphane Binczak:
Automatic localization of signal sources in photon emission images for integrated circuit analysis. Signal Image Video Process. 12(4): 775-782 (2018) - 2017
- [j18]Anthony Boscaro, Sabir Jacquir, Kevin Sanchez, Philippe Perdu, Stéphane Binczak:
Pattern image enhancement by automatic focus correction. Microelectron. Reliab. 76-77: 249-254 (2017) - [c2]Anthony Boscaro, Sabir Jacquir, Kevin Sanchez, Philippe Perdu, Stéphane Binczak:
Automatic defect localization in VLSI circuits: A fusion approach based on the Dempster-Shafer theory. FUSION 2017: 1-8 - 2016
- [j17]Roberta Pilia, Guillaume Bascoul, Kevin Sanchez, Giovanna Mura, Fulvio Infante:
Single Event Transient acquisition and mapping for space device Characterization. Microelectron. Reliab. 64: 73-78 (2016) - [j16]Chung Tah Chua, Hock Guan Ong, Kevin Sanchez, Philippe Perdu, Chee Lip Gan:
Effects of voltage stress on the single event upset (SEU) response of 65 nm flip flop. Microelectron. Reliab. 64: 199-203 (2016) - [j15]Anthony Boscaro, Sabir Jacquir, Kevin Melendez, Kevin Sanchez, Philippe Perdu, Stéphane Binczak:
Automatic process for time-frequency scan of VLSI. Microelectron. Reliab. 64: 299-305 (2016) - 2015
- [j14]Samuel Chef, Sabir Jacquir, Kevin Sanchez, Philippe Perdu, Stéphane Binczak:
Unsupervised image processing scheme for transistor photon emission analysis in order to identify defect location. J. Electronic Imaging 24(1): 013019 (2015) - [j13]Samuel Chef, Sabir Jacquir, Kevin Sanchez, Philippe Perdu, Stéphane Binczak, Chee Lip Gan:
Unsupervised learning for signal mapping in dynamic photon emission. Microelectron. Reliab. 55(9-10): 1564-1568 (2015) - [j12]Anthony Boscaro, Sabir Jacquir, Kevin Sanchez, Philippe Perdu, Stéphane Binczak:
Improvement of signal to noise ratio in electro optical probing technique by wavelets filtering. Microelectron. Reliab. 55(9-10): 1585-1591 (2015) - [j11]Kevin Melendez, A. Desmoulin, Kevin Sanchez, Philippe Perdu, Dean Lewis:
A way to implement the electro-optical technique to inertial MEMS. Microelectron. Reliab. 55(9-10): 1916-1919 (2015) - 2014
- [j10]Mohamed Mehdi Rebaï, Frédéric Darracq, Jean-Paul Guillet, Elise Bernou, Kevin Sanchez, Philippe Perdu, Dean Lewis:
A comprehensive study of the application of the EOP techniques on bipolar devices. Microelectron. Reliab. 54(9-10): 2088-2092 (2014) - [j9]Samuel Chef, Bastien Billiot, Sabir Jacquir, Kevin Sanchez, Philippe Perdu, Stéphane Binczak:
Pattern image enhancement by extended depth of field. Microelectron. Reliab. 54(9-10): 2099-2104 (2014) - 2013
- [j8]Samuel Chef, Sabir Jacquir, Kevin Sanchez, Philippe Perdu, Stéphane Binczak:
Frequency mapping in dynamic light emission with wavelet transform. Microelectron. Reliab. 53(9-11): 1387-1392 (2013) - 2010
- [j7]David Veyrié, Olivier Gilard, Kevin Sanchez, Sébastien Lhuillier, Frédéric Bourcier:
New methodology for the assessment of the thermal resistance of laser diodes and light emitting diodes. Microelectron. Reliab. 50(4): 456-461 (2010) - [j6]A. Deyine, Kevin Sanchez, Philippe Perdu, F. Battistella, Dean Lewis:
CADless laser assisted methodologies for failure analysis and device reliability. Microelectron. Reliab. 50(9-11): 1236-1240 (2010)
2000 – 2009
- 2008
- [j5]Magdalena Sienkiewicz, Philippe Perdu, Abdellatif Firiti, Kevin Sanchez, Olivier Crépel, Dean Lewis:
Failure Analysis enhancement by evaluating the Photoelectric Laser Stimulation impact on mixed-mode ICs. Microelectron. Reliab. 48(8-9): 1529-1532 (2008) - 2007
- [j4]Felix Beaudoin, Kevin Sanchez, Philippe Perdu:
Dynamic laser stimulation techniques for advanced failure analysis and design debug applications. Microelectron. Reliab. 47(9-11): 1517-1522 (2007) - [c1]Julie Ferrigno, Philippe Perdu, Kevin Sanchez, Dean Lewis:
Identification of process/design issues during 0.18 µm technology qualification for space application. DATE 2007: 989-993 - 2005
- [j3]Kevin Sanchez, Romain Desplats, Felix Beaudoin, Philippe Perdu, J. P. Roux, G. Woods, Dean Lewis:
NIR laser stimulation for dynamic timing analysis. Microelectron. Reliab. 45(9-11): 1459-1464 (2005) - [j2]Felix Beaudoin, Kevin Sanchez, Romain Desplats, Philippe Perdu, Jean Marc Nicot, J. P. Roux, M. Otte:
Dynamic Laser Stimulation Case Studies. Microelectron. Reliab. 45(9-11): 1538-1543 (2005) - 2003
- [j1]Kevin Sanchez, Romain Desplats, Guy Perez, V. Pichetto, Felix Beaudoin, Philippe Perdu:
Solar Cell Analysis with Light Emission and OBIC Techniques. Microelectron. Reliab. 43(9-11): 1755-1760 (2003)
Coauthor Index
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