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"Backside Localization of Current Leakage Faults Using Thermal Laser ..."

Romain Desplats et al. (2001)

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DOI: 10.1016/S0026-2714(01)00167-6

access: closed

type: Journal Article

metadata version: 2020-02-22

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Romain Desplats, Felix Beaudoin, Philippe Perdu, Patrick Poirier, David Trémouilles, Marise Bafleur, Dean Lewis:
Backside Localization of Current Leakage Faults Using Thermal Laser Stimulation. Microelectron. Reliab. 41(9-10): 1539-1544 (2001)

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