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Michel Vallet
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2010 – 2019
- 2011
- [j6]Thierry Parrassin, Guillaume Celi, Sylvain Dudit, Michel Vallet:
Failure analysis defect location on a real case 55 nm memory using dynamic power supply emulation. Microelectron. Reliab. 51(9-11): 1646-1651 (2011) - [j5]Guillaume Celi, Sylvain Dudit, Thierry Parrassin, Philippe Perdu, Antoine Reverdy, Dean Lewis, Michel Vallet:
LVI detection on passive structure in advance CMOS technology: New opportunities for device analysis. Microelectron. Reliab. 51(9-11): 1662-1667 (2011) - 2010
- [j4]Philippe Galy, Sylvain Dudit, Michel Vallet, Ph. Larre, M. Bilinski, E. Petit, J. Beltritti, A. Dray, Jean Jimenez, Frank Jezequel, R. Chevallier, C. Boutonnat, V. Varo:
Inventory of silicon signatures induced by CDM event on deep sub-micronic CMOS-BICMOS technologies. Microelectron. Reliab. 50(9-11): 1388-1392 (2010) - [j3]Guillaume Celi, Sylvain Dudit, Philippe Perdu, Antoine Reverdy, Thierry Parrassin, Emmanuel Bechet, Dean Lewis, Michel Vallet:
Facing the defect characterization and localization challenges of bridge defects on a submicronic technology (45 nm and below). Microelectron. Reliab. 50(9-11): 1499-1505 (2010)
2000 – 2009
- 2009
- [j2]Philippe Galy, Sylvain Dudit, Michel Vallet, Corinne Richier, Christophe Entringer, Frank Jezequel, E. Petit, J. Beltritti:
Impact and damage on deep sub-micron CMOS technology induced by substrate current due to ESD stress. Microelectron. Reliab. 49(9-11): 1107-1110 (2009) - 2004
- [j1]Mustapha Remmach, Romain Desplats, Philippe Perdu, J. P. Roux, Michel Vallet, Sylvain Dudit, P. Sardin, Dean Lewis:
Light Emission From Small Technologies. Are Silicon Based Detectors Reaching Their Limits? Microelectron. Reliab. 44(9-11): 1715-1720 (2004)
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