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"Front Side and Backside OBIT Mappings applied to Single Event Transient ..."

Dean Lewis et al. (2001)

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DOI: 10.1016/S0026-2714(01)00198-6

access: closed

type: Journal Article

metadata version: 2021-01-20

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Dean Lewis, Vincent Pouget, Thomas Beauchêne, Hervé Lapuyade, Pascal Fouillat, André Touboul, Felix Beaudoin, Philippe Perdu:
Front Side and Backside OBIT Mappings applied to Single Event Transient Testing. Microelectron. Reliab. 41(9-10): 1471-1476 (2001)

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