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"Long-term reliability of silicon bipolar transistors subjected to low ..."

A. Crosson et al. (2007)

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DOI: 10.1016/J.MICROREL.2007.07.057

access: closed

type: Journal Article

metadata version: 2020-02-22

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A. Crosson, Laurent Escotte, Marise Bafleur, D. Talbourdet, L. Crétinon, Philippe Perdu, Guy Perez:
Long-term reliability of silicon bipolar transistors subjected to low constraints. Microelectron. Reliab. 47(9-11): 1590-1594 (2007)

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