"Effects of voltage stress on the single event upset (SEU) response of 65 ..."

Chung Tah Chua et al. (2016)

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DOI: 10.1016/J.MICROREL.2016.07.107

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type: Journal Article

metadata version: 2022-03-23

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Chung Tah Chua, Hock Guan Ong, Kevin Sanchez, Philippe Perdu, Chee Lip Gan:
Effects of voltage stress on the single event upset (SEU) response of 65 nm flip flop. Microelectron. Reliab. 64: 199-203 (2016)

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