![](https://dblp1.uni-trier.de/img/logo.ua.320x120.png)
![](https://dblp1.uni-trier.de/img/dropdown.dark.16x16.png)
![](https://dblp1.uni-trier.de/img/peace.dark.16x16.png)
Остановите войну!
for scientists:
![search dblp search dblp](https://dblp1.uni-trier.de/img/search.dark.16x16.png)
![search dblp](https://dblp1.uni-trier.de/img/search.dark.16x16.png)
default search action
Marcelo Lubaszewski
Person information
Refine list
![note](https://dblp1.uni-trier.de/img/note-mark.dark.12x12.png)
refinements active!
zoomed in on ?? of ?? records
view refined list in
export refined list as
2020 – today
- 2023
- [c105]Állan G. Ferreira, Lucas B. Zilch, Vinícius Navarro, Marcelo Soares Lubaszewski, Tiago R. Balen:
Towards a Machine Learning Based Method for Indirect Test Generation of Mixed-Signal Circuits. SBCCI 2023: 1-6 - 2022
- [c104]Lucas B. Zilch, Állan G. Ferreira, Marcelo Soares Lubaszewski, Tiago R. Balen:
Evaluating Fault Coverage of Structural and Specification-based Tests Obtained With a Low-Cost Analog TPG Tool. LATS 2022: 1-6 - 2020
- [c103]João Carlos Britto Filho, Marcelo Lubaszewski:
A Highly Reliable Wearable Device for Fall Detection. LATS 2020: 1-7
2010 – 2019
- 2019
- [e2]João Antonio Martino, Marcelo Lubaszewski, Matteo Sonza Reorda:
Proceedings of the 32nd Symposium on Integrated Circuits and Systems Design, SBCCI 2019, Sao Paulo, Brazil, August 26-30, 2019. ACM 2019, ISBN 978-1-4503-6844-5 [contents] - 2016
- [c102]E. Petitprez, Dalton M. Colombo
, Felipe M. Henes, Laurent Courcelle, R. Tararam, S. Jacobsen, R. Soares, C. Krug, Marcelo Lubaszewski:
Successful prototyping of complex integrated circuits with focused ion beam. SBCCI 2016: 1-5 - 2015
- [j31]Cristiano P. Chenet, Lucas A. Tambara, Gabriel de M. Borges, Fernanda Lima Kastensmidt
, Marcelo Soares Lubaszewski, Tiago R. Balen:
Exploring design diversity redundancy to improve resilience in mixed-signal systems. Microelectron. Reliab. 55(12): 2833-2844 (2015) - [c101]Francisco O. O. Gomes, Luciano de Paula, Joao C. S. Santos, Laurent Courcelle, Daniel Piovani, Filipe Viera, Felipe M. Henes, Marcelo Lubaszewski:
A low-power RFID enabled temperature sensor for cold chain management. ISCAS 2015: 2113-2116 - [c100]Rafael Cantalice, Alexandre Simionovski, Fernando Paixão Cortes, Marcelo Lubaszewski:
Low power, high-sensitivity clock recovery circuit for LF/HF RFID applications. SBCCI 2015: 22:1-22:5 - 2014
- [c99]Fernando da Rocha Paixão Cortes, Juan Pablo Martinez Brito, Everton Ghignatti, Alfredo Olmos, Fernando Chávez, Marcelo Lubaszewski:
A power management system architecture for LF passive RFID tags. LASCAS 2014: 1-4 - [c98]Fernando Paixão Cortes, Juan Pablo Martinez Brito, Rafael Cantalice, Everton Ghignatti, Alfredo Olmos, Fernando Chávez, Marcelo Lubaszewski:
A low-power RF/analog front-end architecture for LF passive RFID tags with dynamic power sensing. IEEE RFID 2014: 60-66 - [c97]Alfredo Olmos, Juan Pablo Martinez Brito, Fabrício Jorge Antunes Ferreira, Fernando Chávez, Marcelo Soares Lubaszewski:
A 2-Transistor Sub-1V Low Power Temperature Compensated CMOS Voltage Reference. SBCCI 2014: 26:1-26:5 - 2013
- [c96]Alexandre M. Amory
, Matheus T. Moreira, Ney Laert Vilar Calazans, Fernando Gehm Moraes
, Cristiano Lazzari, Marcelo Soares Lubaszewski:
Evaluating the scalability of test buses. ISSoC 2013: 1-6 - [c95]Alexandre M. Amory
, Edson I. Moreno, Fernando Moraes
, Marcelo Lubaszewski:
Determining the test sources/sinks for NoC TAMs. ISVLSI 2013: 8-13 - [c94]Lucas A. Tambara, Fernanda Lima Kastensmidt
, Paolo Rech
, Tiago R. Balen, Marcelo Lubaszewski:
Neutron-induced single event effects analysis in a SAR-ADC architecture embedded in a mixed-signal SoC. ISVLSI 2013: 188-193 - 2012
- [c93]Marcelo de Souza Moraes, Marcos Barcellos Hervé, Marcelo Lubaszewski:
Low pin count DfT technique for RFID ICs. DFT 2012: 31-36 - [c92]Guilherme Schwanke Cardoso, Tiago R. Balen, Marcelo Soares Lubaszewski, Rafael Galhardo Vaz, Odair Lelis Goncalez:
Impact of TID-induced threshold deviations in analog building-blocks of operational amplifiers. LATW 2012: 1-6 - 2011
- [j30]Luiz Fernando Gonçalves, Jefferson Luiz Bosa, Tiago Roberto Balen, Marcelo Lubaszewski, Eduardo Luis Schneider
, Renato V. B. Henriques:
Fault Detection, Diagnosis and Prediction in Electrical Valves Using Self-Organizing Maps. J. Electron. Test. 27(4): 551-564 (2011) - [j29]Marcos Barcellos Hervé, Marcelo de Souza Moraes, Pedro Almeida, Marcelo Lubaszewski, Fernanda Lima Kastensmidt
, Érika F. Cota:
Functional Test of Mesh-Based NoCs with Deterministic Routing: Integrating the Test of Interconnects and Routers. J. Electron. Test. 27(5): 635-646 (2011) - [j28]Caroline Concatto, João Almeida, Guilherme Fachini, Marcos Hervé, Fernanda Lima Kastensmidt
, Érika F. Cota, Marcelo Lubaszewski:
Improving the yield of NoC-based systems through fault diagnosis and adaptive routing. J. Parallel Distributed Comput. 71(5): 664-674 (2011) - [j27]Alexandre M. Amory
, Cristiano Lazzari, Marcelo Lubaszewski, Fernando Gehm Moraes
:
A new test scheduling algorithm based on Networks-on-Chip as Test Access Mechanisms. J. Parallel Distributed Comput. 71(5): 675-686 (2011) - [j26]Renato P. Ribas, Simone Bavaresco, N. Schuch, Vinicius Callegaro, Marcelo Lubaszewski, André Inácio Reis:
Contributions to the evaluation of ensembles of combinational logic gates. Microelectron. J. 42(2): 371-381 (2011) - [c91]Alexandre M. Amory
, Luciano Ost, César A. M. Marcon, Fernando Gehm Moraes
, Marcelo Lubaszewski:
Evaluating energy consumption of homogeneous MPSoCs using spare tiles. DATE 2011: 1164-1167 - [c90]Tiago R. Balen, Guilherme Schwanke Cardoso, Odair Lelis Gonçalez, Marcelo Soares Lubaszewski:
Investigating the effects of transient faults in Programmable Capacitor Arrays. LATW 2011: 1-6 - [c89]Alexandre M. Amory
, César A. M. Marcon
, Fernando Gehm Moraes
, Marcelo Lubaszewski:
Task mapping on NoC-based MPSoCs with faulty tiles: Evaluating the energy consumption and the application execution time. International Symposium on Rapid System Prototyping 2011: 164-170 - [c88]Alexandre M. Amory
, Cristiano Lazzari, Marcelo Lubaszewski, Fernando Gehm Moraes
:
Early estimation of wire length for dedicated test access mechanisms in networks-on-chip based SoCs. SBCCI 2011: 73-78 - 2010
- [c87]Gabriel de M. Borges, Luiz Fernando Gonçalves, Tiago R. Balen, Marcelo Lubaszewski:
Increasing reliability of programmable mixed-signal systems by applying design diversity redundancy. ETS 2010: 261 - [c86]Tiago R. Balen, Marcelo Lubaszewski:
Radiation effects on programmable analog devices and mitigation techniques. IOLTS 2010: 136 - [c85]Matheus Braga, Érika F. Cota, Fernanda Lima Kastensmidt
, Marcelo Lubaszewski:
Efficiently using data splitting and retransmission to tolerate faults in networks-on-chip interconnects. ISCAS 2010: 4101-4104 - [c84]Gabriel de M. Borges, Luiz Fernando Gonçalves, Tiago R. Balen, Marcelo Lubaszewski:
Diversity TMR: Proof of concept in a mixed-signal case. LATW 2010: 1-6 - [c83]Luiz Fernando Gonçalves, Eduardo Luis Schneider
, Renato Ventura Bayan Henriques, Marcelo Lubaszewski, Jefferson Luiz Bosa, Paulo Martins Engel:
Fault prediction in electrical valves using temporal Kohonen maps. LATW 2010: 1-6 - [c82]Marcos Hervé, Pedro Almeida, Fernanda Lima Kastensmidt
, Érika F. Cota, Marcelo Lubaszewski:
Concurrent test of Network-on-Chip interconnects and routers. LATW 2010: 1-6 - [c81]Gabriel de M. Borges, Luiz Fernando Gonçalves, Tiago R. Balen, Marcelo Lubaszewski:
Evaluating the effectiveness of a mixed-signal TMR scheme based on design diversity. SBCCI 2010: 134-139 - [c80]Mariza Botelho, Fernanda Lima Kastensmidt, Marcelo Lubaszewski, Érika F. Cota, Luigi Carro:
A broad strategy to detect crosstalk faults in network-on-chip interconnects. VLSI-SoC 2010: 298-303 - [c79]Marcelo Lubaszewski, Érika F. Cota:
Special session 12B: Embedded tutorial test and fault tolerance of networks-on-chip. VTS 2010: 354
2000 – 2009
- 2009
- [j25]Marcelo Lubaszewski, Andrew Richardson
, C. C. Su:
Guest editorial. Microelectron. J. 40(7): 1041 (2009) - [c78]Marcelo Lubaszewski:
Can Functional Test Achieve Low-cost Full Coverage of NoC Faults? DFT 2009: 224-224 - [c77]Caroline Concatto, Pedro Almeida, Fernanda Lima Kastensmidt
, Érika F. Cota, Marcelo Lubaszewski, Marcos Hervé:
Improving yield of torus nocs through fault-diagnosis-and-repair of interconnect faults. IOLTS 2009: 61-66 - [c76]Renato P. Ribas, Simone Bavaresco, Marcelo Lubaszewski, André Inácio Reis:
Efficient Test Circuit to Qualify Logic Cells. ISCAS 2009: 2733-2736 - [c75]Marcos Barcellos Hervé, Érika F. Cota, Fernanda Lima Kastensmidt
, Marcelo Lubaszewski:
NoC interconnection functional testing: Using boundary-scan to reduce the overall testing time. LATW 2009: 1-6 - [c74]Franco Leite, Tiago R. Balen, Marcos Hervé, Marcelo Lubaszewski, Gilson I. Wirth
:
Using Bulk Built-In Current Sensors and recomputing techniques to mitigate transient faults in microprocessors. LATW 2009: 1-6 - [c73]Marcos Hervé, Érika F. Cota, Fernanda Lima Kastensmidt
, Marcelo Lubaszewski:
Diagnosis of interconnect shorts in mesh NoCs. NOCS 2009: 256-265 - [c72]Érika F. Cota, Luigi Carro
, Felipe Pinto, Ricardo Augusto da Luz Reis, Marcelo Lubaszewski:
Resource-and-time-aware test strategy for configurable quaternary logic blocks. SBCCI 2009 - [c71]Luiz Fernando Gonçalves, Jefferson Luiz Bosa, Renato V. B. Henriques, Marcelo Lubaszewski:
Design of an embedded system for the proactive maintenance of electrical valves. SBCCI 2009 - 2008
- [j24]Érika F. Cota, Fernanda Gusmão de Lima Kastensmidt
, Maico Cassel, Marcos Hervé, Pedro Almeida, Paulo Meirelles
, Alexandre M. Amory
, Marcelo Lubaszewski:
A High-Fault-Coverage Approach for the Test of Data, Control and Handshake Interconnects in Mesh Networks-on-Chip. IEEE Trans. Computers 57(9): 1202-1215 (2008) - [j23]Bozena Kaminska, Marcelo Lubaszewski, José Machado da Silva
:
Selected Papers from the International Mixed Signals Testing and GHz/Gbps Test Workshop. VLSI Design 2008: 165673:1-165673:2 (2008) - [c70]Carlos Roberto Moratelli
, Felipe Ghellar, Érika F. Cota, Marcelo Lubaszewski:
A fault-tolerant, DFA-resistant AES core. ISCAS 2008: 244-247 - [c69]Felipe Ghellar, Marcelo Lubaszewski:
A novel AES cryptographic core highly resistant to differential power analysis attacks. SBCCI 2008: 140-145 - [e1]Marcelo Lubaszewski, Michel Renovell, Rajesh K. Gupta:
Proceedings of the 21st Annual Symposium on Integrated Circuits and Systems Design, SBCCI 2008, Gramado, Brazil, September 1-4, 2008. ACM 2008, ISBN 978-1-60558-231-3 [contents] - 2007
- [j22]Marcelo Lubaszewski, Andrew Richardson
, C. C. Su:
Guest Editorial. J. Electron. Test. 23(6): 469 (2007) - [j21]Tiago R. Balen, José Vicente Calvano, Marcelo Lubaszewski, Michel Renovell:
Built-In Self-Test of Field Programmable Analog Arrays based on Transient Response Analysis. J. Electron. Test. 23(6): 497-512 (2007) - [j20]Alexandre M. Amory
, Kees Goossens, Erik Jan Marinissen
, Marcelo Lubaszewski, Fernando Moraes
:
Wrapper design for the reuse of a bus, network-on-chip, or other functional interconnect as test access mechanism. IET Comput. Digit. Tech. 1(3): 197-206 (2007) - [c68]Tiago R. Balen, Fernanda Lima Kastensmidt
, Marcelo Lubaszewski, Michel Renovell:
Single Event Upset in SRAM-based Field Programmable Analog Arrays: Effects and Mitigation. ISVLSI 2007: 192-197 - [c67]Érika F. Cota, Fernanda Lima Kastensmidt
, Maico Cassel, Paulo Meirelles
, Alexandre M. Amory
, Marcelo Lubaszewski:
Redefining and testing interconnect faults in Mesh NoCs. ITC 2007: 1-10 - [c66]Alexandre M. Amory
, Frederico Ferlini, Marcelo Lubaszewski, Fernando Moraes
:
DfT for the Reuse of Networks-on-Chip as Test Access Mechanism. VTS 2007: 435-440 - [i1]Alexandre M. Amory, Marcelo Lubaszewski, Fernando Gehm Moraes, Edson I. Moreno:
Test Time Reduction Reusing Multiple Processors in a Network-on-Chip Based Architecture. CoRR abs/0710.4795 (2007) - 2006
- [c65]Alexandre M. Amory
, Kees Goossens, Erik Jan Marinissen
, Marcelo Lubaszewski, Fernando Moraes
:
Wrapper Design for the Reuse of Networks-on-Chip as Test Access Mechanism. ETS 2006: 213-218 - [c64]Carlos Roberto Moratelli
, Érika F. Cota, Marcelo Lubaszewski:
A cryptography core tolerant to DFA fault attacks. SBCCI 2006: 190-195 - [c63]Margrit R. Krug, Marcelo de Souza Moraes, Marcelo Lubaszewski:
Using a software testing technique to identify registers for partial scan implementation. SBCCI 2006: 208-213 - [c62]Margrit R. Krug, Marcelo Lubaszewski, Marcelo de Souza Moraes:
Improving ATPG Gate-Level Fault Coverage by using Test Vectors generated from Behavioral HDL Descriptions. VLSI-SoC 2006: 314-319 - [c61]Tiago R. Balen, José Vicente Calvano, Marcelo Lubaszewski, Michel Renovell:
Functional Test of Field Programmable Analog Arrays. VTS 2006: 326-333 - 2005
- [j19]Florence Azaïs, Marcelo Lubaszewski, Pascal Nouet, Michel Renovell:
A Strategy for Optimal Test Point Insertion in Analog Cascaded Filters. J. Electron. Test. 21(1): 9-16 (2005) - [j18]Tiago R. Balen, Antonio Q. Andrade, Florence Azaïs, Marcelo Lubaszewski, Michel Renovell:
Applying the Oscillation Test Strategy to FPAA's Configurable Analog Blocks. J. Electron. Test. 21(2): 135-146 (2005) - [j17]Antonio Andrade Jr., Gustavo Vieira, Tiago R. Balen, Marcelo Lubaszewski, Florence Azaïs, Michel Renovell:
Built-in self-test of global interconnects of field programmable analog arrays. Microelectron. J. 36(12): 1112-1123 (2005) - [c60]Alexandre M. Amory
, Marcelo Lubaszewski, Fernando Gehm Moraes
, Edson I. Moreno:
Test Time Reduction Reusing Multiple Processors in a Network-on-Chip Based Architecture. DATE 2005: 62-63 - [c59]Alexandre M. Amory
, Eduardo Wenzel Brião, Érika F. Cota, Marcelo Lubaszewski, Fernando Gehm Moraes
:
A scalable test strategy for network-on-chip routers. ITC 2005: 9 - [c58]Marcelo de Souza Moraes, Érika F. Cota, Luigi Carro, Flávio Rech Wagner, Marcelo Lubaszewski:
A constraint-based solution for on-line testing of processors embedded in real-time applications. SBCCI 2005: 68-73 - [c57]Gustavo Pereira, Antonio Andrade Jr., Tiago R. Balen, Marcelo Lubaszewski, Florence Azaïs, Michel Renovell:
Testing the Interconnect Networks and I/O Resources of Field Programmable Analog Arrays. VTS 2005: 389-394 - 2004
- [j16]Érika F. Cota, Luigi Carro
, Marcelo Lubaszewski, Alex Orailoglu:
Searching for Global Test Costs Optimization in Core-Based Systems. J. Electron. Test. 20(4): 357-373 (2004) - [j15]Alex Gonsales, Marcelo Lubaszewski, Luigi Carro
, Michel Renovell:
A New FPGA for DSP Applications Integrating BIST Capabilities. J. Electron. Test. 20(4): 423-431 (2004) - [j14]Érika F. Cota, Luigi Carro
, Marcelo Lubaszewski:
Reusing an on-chip network for the test of core-based systems. ACM Trans. Design Autom. Electr. Syst. 9(4): 471-499 (2004) - [c56]Marcelo Lubaszewski, José Luis Huertas:
Test and Design-for-Test of Mixed-Signal Integrated Circuits. IFIP Congress Tutorials 2004: 183-212 - [c55]Tiago R. Balen, Antonio Andrade Jr., Florence Azaïs, Michel Renovell, Marcelo Lubaszewski:
Testing the Configurable Analog Blocks of Field Programmable Analog Arrays. ITC 2004: 893-902 - [c54]Antonio Andrade Jr., Érika F. Cota, Marcelo Lubaszewski:
Improving mixed-signal SOC testing: a power-aware reuse-based approach with analog BIST. SBCCI 2004: 105-110 - [c53]Alexandre M. Amory
, Érika F. Cota, Marcelo Lubaszewski, Fernando Gehm Moraes
:
Reducing test time with processor reuse in network-on-chip based systems. SBCCI 2004: 111-116 - [c52]Tiago R. Balen, Antonio Andrade Jr., Florence Azaïs, Marcelo Lubaszewski, Michel Renovell:
An Approach to the Built-In Self-Test of Field Programmable Analog Arrays. VTS 2004: 383-388 - 2003
- [j13]L. Cassol, O. Betat, Luigi Carro
, Marcelo Lubaszewski:
The SigmaDelta-BIST Method Applied to Analog Filters. J. Electron. Test. 19(1): 13-20 (2003) - [c51]Érika F. Cota, Luigi Carro, Flávio Rech Wagner, Marcelo Lubaszewski:
Power-aware NoC Reuse on the Testing of Core-based Systems. ITC 2003: 612-621 - [c50]José Vicente Calvano, Marcelo Lubaszewski:
Designing for Test Analog Signal Processors for MEMS-Based Inertial Sensors. IWSOC 2003: 251-256 - [c49]Vinícius P. Correia, Marcelo Lubaszewski, André Inácio Reis:
SIFU! - A Didactic Stuck-at Fault Simulator. MSE 2003: 93-94 - [c48]Érika F. Cota, Márcio Eduardo Kreutz, Cesar A. Zeferino
, Luigi Carro, Marcelo Lubaszewski, Altamiro Amadeu Susin:
The Impact of NoC Reuse on the Testing of Core-based Systems. VTS 2003: 128-133 - 2002
- [c47]Érika F. Cota, Luigi Carro, Marcelo Lubaszewski, Alex Orailoglu:
Test Planning and Design Space Exploration in a Core-Based Environment. DATE 2002: 478-485 - [c46]Alex Gonsales, Marcelo Lubaszewski, Luigi Carro, Michel Renovell:
A New FPGA for DSP Applications Integrating BIST Capabilities. LATW 2002: 76-81 - [c45]José Vicente Calvano, Vladimir Castro Alves, Marcelo Lubaszewski, Antonio Carneiro de Mesquita Filho:
Designing for Test Butterworth and Chebyshev Low-Pass Filters of Any Order. LATW 2002: 83-85 - [c44]José Vicente Calvano, Antonio Carneiro de Mesquita Filho, Marcelo Lubaszewski, Vladimir Castro Alves:
State Model Approach for Analog Fault Modeling. LATW 2002: 86-88 - [c43]Érika F. Cota, Luigi Carro, Alex Orailoglu, Marcelo Lubaszewski:
Generic and Detailed Search for TAM Definition in Core-Based Systems. LATW 2002: 160-164 - [c42]Florence Azaïs, Serge Bernard, Yves Bertrand, Mariane Comte, Michel Renovell, Marcelo Lubaszewski:
Estimating Static Parameters of A-to-D Converters from Spectral Analysis. LATW 2002: 174-179 - [c41]Felipe S. Marques, Vinícius P. Correia, A. Prado, Marcelo Lubaszewski, André Inácio Reis:
Testability Properties of BDDs. SBCCI 2002: 83-88 - [c40]José Vicente Calvano, Vladimir Castro Alves, Antonio Carneiro de Mesquita Filho, Marcelo Lubaszewski:
Filters Designed for Testability Wrapped on the Mixed-Signal Test Bus. VTS 2002: 201-206 - 2001
- [j12]Marcelo Lubaszewski, Víctor H. Champac:
Guest Editorial. J. Electron. Test. 17(2): 83-84 (2001) - [j11]José Vicente Calvano, Antonio Carneiro de Mesquita Filho, Vladimir Castro Alves, Marcelo Lubaszewski:
Fault Models and Test Generation for OpAmp Circuits - The FFM. J. Electron. Test. 17(2): 121-138 (2001) - [j10]Érika F. Cota, Fernanda Lima, Sana Rezgui, Luigi Carro
, Raoul Velazco, Marcelo Lubaszewski, Ricardo Reis:
Synthesis of an 8051-Like Micro-Controller Tolerant to Transient Faults. J. Electron. Test. 17(2): 149-161 (2001) - [j9]Renato P. Ribas, André Inácio Reis, Marcelo Lubaszewski:
Concepção de Circuitos e Sistemas Integrados. RITA 8(1): 7-21 (2001) - [c39]Luigi Carro, André C. Nácul, Daniel Janner, Marcelo Lubaszewski:
Built-in Test of Analog Non-Linear Circuits in a SOC Environment. VLSI-SOC 2001: 437-448 - [c38]José Vicente Calvano, Antonio Carneiro de Mesquita Filho, Vladimir Castro Alves, Marcelo Lubaszewski:
Filter Sensitivity Analysis Using the TRAM. LATW 2001: 80-83 - [c37]José Vicente Calvano, Vladimir Castro Alves, Marcelo Lubaszewski, Antonio Carneiro de Mesquita Filho:
Designing Testable Networks for Transfer Function Realization. LATW 2001: 84-87 - [c36]L. Cassol, Luigi Carro, Marcelo Lubaszewski:
The Sigma-Delta-Bist Method Applied to Linear Analog Circuits. LATW 2001: 126-130 - [c35]Bernard Courtois, Salvador Mir, Benoît Charlot, Marcelo Lubaszewski:
An Analog-based Approach for MEMS Testing. LATW 2001: 200-203 - [c34]Érika F. Cota, Luigi Carro, Marcelo Lubaszewski:
A Test Method for a Broad Class of DSP Circuits. LATW 2001: 214-219 - [c33]André C. Nácul, Luigi Carro, Daniel Janner, Marcelo Lubaszewski:
A BIST Procedure for Analog Mixers in Software Radio. SBCCI 2001: 103-108 - 2000
- [j8]Érika F. Cota, Marcelo Negreiros
, Luigi Carro
, Marcelo Lubaszewski:
A new adaptive analog test and diagnosis system. IEEE Trans. Instrum. Meas. 49(2): 223-227 (2000) - [j7]Marcelo Lubaszewski, Salvador Mir, Vladimir Kolarik
, C. Nielsen, Bernard Courtois:
Design of self-checking fully differential circuits and boards. IEEE Trans. Very Large Scale Integr. Syst. 8(2): 113-128 (2000) - [c32]Luigi Carro, Érika F. Cota, Marcelo Lubaszewski, Yves Bertrand, Florence Azaïs, Michel Renovell:
TI-BIST: a temperature independent analog BIST for switched-capacitor filters. Asian Test Symposium 2000: 78-83 - [c31]José Vicente Calvano, Vladimir Castro Alves, Marcelo Lubaszewski:
Testing a PWM circuit using functional fault models and compact test vectors for operational amplifiers. Asian Test Symposium 2000: 96- - [c30]Érika F. Cota, Michel Renovell, Florence Azaïs, Yves Bertrand, Luigi Carro, Marcelo Lubaszewski:
Reuse of Existing Resources for Analog BIST of a Switch Capacitor Filte. DATE 2000: 226-230 - [c29]Margrit Reni Krug, Marcelo Lubaszewski, José Manuel Martins Ferreira, Gustavo Ribeiro da Costa Alves:
Implementing a Self-Checking PROFIBUS Slave. LATW 2000: 4-8 - [c28]Fernanda Gusmão de Lima, Eduardo D'Avila, Mauricio Moraes, Marcelo Lubaszewski, Ricardo Reis:
A Self-Testing Mask Programmable Matrix Using Built-in Current Sensing. LATW 2000: 15-19 - [c27]José Vicente Calvano, Vladimir Castro Alves, Marcelo Soares Lubaszewski:
Mixed-Signal Test Bus IEEE 1149.4 Compatible BIST Scheme for Classical 2nd Order Filter Approximations using the Transient Response Analysis Method. LATW 2000: 84-87 - [c26]Luigi Carro, Michel Renovell, Érika F. Cota, Marcelo Lubaszewski, Yves Bertrand, Florence Azaïs:
On the Temperature Dependencies of Analog BIST. LATW 2000: 88-93 - [c25]Érika F. Cota, Marcelo Lubaszewski, Raoul Velasco, Sana Rezgui:
Synthesis of a 8051-Like Microcontroller Tolerant to Transient Faults. LATW 2000: 134-139 - [c24]José Vicente Calvano, Vladimir Castro Alves, Marcelo Lubaszewski:
The Use of Macromodels on Op-Amp Circuits Fault Modeling. LATW 2000: 188-192 - [c23]Luigi Carro, Luciano Agostini, Roberto Pacheco, Marcelo Lubaszewski:
Using Reconfigurability Features to Break Down Test Costs: a Case Study. LATW 2000: 209-214 - [c22]André Inácio Reis, A. Prado, Marcelo Lubaszewski:
Testability Properties of Vertex Precedent BDDs. SBCCI 2000: 15-20 - [c21]Fernanda Gusmão de Lima, Érika F. Cota, Luigi Carro, Marcelo Lubaszewski, Ricardo Reis, Raoul Velazco, Sana Rezgui:
Designing a Radiation Hardened 8051-Like Micro-Controller. SBCCI 2000: 255-262 - [c20]José Vicente Calvano, Vladimir Castro Alves, Marcelo Soares Lubaszewski, Antonio Carneiro de Mesquita Filho:
Fault Models and Compact Test Vectors for MOS OpAmp circuits. SBCCI 2000: 289-294 - [c19]José Vicente Calvano, Vladimir Castro Alves, Marcelo Lubaszewski:
Fault Detection Methodology and BIST Method for 2nd Order Butterworth, Chebyshev and Bessel Filter Approximations. VTS 2000: 319-324
1990 – 1999
- 1999
- [c18]Érika F. Cota, Luigi Carro, Marcelo Lubaszewski:
A Method to Diagnose Faults in Linear Analog Circuits using an Adaptive Tester. DATE 1999: 184-188 - [c17]Benoît Charlot, Salvador Mir, Érika F. Cota, Marcelo Lubaszewski, Bernard Courtois:
Fault modeling of suspended thermal MEMS. ITC 1999: 319-328 - [c16]Bernard Courtois, Jean-Michel Karam, Salvador Mir, Marcelo Lubaszewski, Vladimír Székely, Márta Rencz, Klaus Hofmann, Manfred Glesner:
Design and Test of MEMs. VLSI Design 1999: 270- - 1998
- [j6]Vladimír Székely, Márta Rencz, Jean-Michel Karam, Marcelo Lubaszewski, Bernard Courtois:
Thermal Monitoring of Self-Checking Systems. J. Electron. Test. 12(1-2): 81-92 (1998) - [j5]Marcelo Lubaszewski, Bernard Courtois:
A Reliable Fail-Safe System. IEEE Trans. Computers 47(2): 236-241 (1998) - [c15]Jaime Velasco-Medina
, Marcelo Lubaszewski, Michael Nicolaidis:
An Approach to the On-Line Testing of Operational Amplifiers. Asian Test Symposium 1998: 290-295 - [c14]Marcelo Lubaszewski:
Bridging the Gap between Microelectronics and Micromechanics Testing. Asian Test Symposium 1998: 513 - [c13]Marcelo Lubaszewski, Érika F. Cota, Bernard Courtois:
Microsystems Testing: an Approach and Open Problems. DATE 1998: 524-528 - [c12]Marcelo Lubaszewski, Michel Renovell, Salvador Mir, Florence Azaïs, Yves Bertrand:
A Built-In Multi-Mode Stimuli Generator for Analogue and Mixed-Signal Testing. SBCCI 1998: 175-178 - [c11]Jean-Michel Karam, Marcelo Lubaszewski, R. D. Shawn Blanton, Andrew Richardson:
Testing MEMS. VTS 1998: 320-321 - 1997
- [j4]Érika F. Cota, José Di Elias Domênico, Marcelo Lubaszewski:
A CAT Tool for Frequency-domain Testing and Diagnosis on Analog. J. Braz. Comput. Soc. 4(2) (1997) - 1996
- [j3]Salvador Mir, Marcelo Lubaszewski, Bernard Courtois:
Fault-based ATPG for linear analog circuits with minimal size multifrequency test sets. J. Electron. Test. 9(1-2): 43-57 (1996) - [j2]Salvador Mir, Marcelo Lubaszewski, Bernard Courtois:
Unified built-in self-test for fully differential analog circuits. J. Electron. Test. 9(1-2): 135-151 (1996) - [c10]Vladimír Székely, Márta Rencz, Jean-Michel Karam, Marcelo Lubaszewski, Bernard Courtois:
Thermal Monitoring Of Safety-Critical Integrated Systems. Asian Test Symposium 1996: 282-288 - [c9]Salvador Mir, Bernard Courtois, Marcelo Lubaszewski, Vladimir Kolarik
:
Automatic Test Generation for Maximal Diagnosis of Linear Analogue Circuits. ED&TC 1996: 254-258 - [c8]Marcelo Lubaszewski, Salvador Mir, Leandro Pulz:
ABILBO: Analog BuILt-in Block Observer. ICCAD 1996: 600-603 - [c7]Fabrizio Francesconi, Valentino Liberali, Marcelo Lubaszewski, Salvador Mir:
Design of high-performance band-pass sigma-delta modulator with concurrent error detection. ICECS 1996: 1202-1205 - 1995
- [j1]Vladimir Kolarik
, Salvador Mir, Marcelo Lubaszewski, Bernard Courtois:
Analog checkers with absolute and relative tolerances. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 14(5): 607-612 (1995) - [c6]Marcelo Lubaszewski, Vladimir Kolarik, Salvador Mir, C. Nielsen, Bernard Courtois:
Mixed-signal circuits and boards for high safety applications. ED&TC 1995: 34-41 - [c5]Khaled Saab, Bozena Kaminska, Bernard Courtois, Marcelo Lubaszewski:
Frequency-based BIST for analog circuit testin. VTS 1995: 54-59 - 1994
- [c4]Salvador Mir, Vladimir Kolarik, Marcelo Lubaszewski, C. Nielsen, Bernard Courtois:
Built-in self-test and fault diagnosis of fully differential analogue circuits. ICCAD 1994: 486-490 - [c3]Vladimir Kolarik, Marcelo Lubaszewski, Bernard Courtois:
Designing self-exercising analogue checkers. VTS 1994: 252-257 - 1993
- [c2]Meryem Marzouki, Marcelo Lubaszewski, Mohamed Hedi Touati:
Unifying test and diagnosis of interconnects and logic clusters in partial boundary scan boards. ICCAD 1993: 654-657 - 1992
- [c1]Marcelo Lubaszewski, Bernard Courtois:
On the Design of Self-Checking Boundary Scannable Boards. ITC 1992: 372-381
Coauthor Index
aka: Tiago Roberto Balen
aka: Fernanda Gusmão de Lima Kastensmidt
aka: Fernanda Gusmão de Lima
aka: Fernanda Lima 0001
![](https://dblp1.uni-trier.de/img/cog.dark.24x24.png)
manage site settings
To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.
Unpaywalled article links
Add open access links from to the list of external document links (if available).
Privacy notice: By enabling the option above, your browser will contact the API of unpaywall.org to load hyperlinks to open access articles. Although we do not have any reason to believe that your call will be tracked, we do not have any control over how the remote server uses your data. So please proceed with care and consider checking the Unpaywall privacy policy.
Archived links via Wayback Machine
For web page which are no longer available, try to retrieve content from the of the Internet Archive (if available).
Privacy notice: By enabling the option above, your browser will contact the API of archive.org to check for archived content of web pages that are no longer available. Although we do not have any reason to believe that your call will be tracked, we do not have any control over how the remote server uses your data. So please proceed with care and consider checking the Internet Archive privacy policy.
Reference lists
Add a list of references from ,
, and
to record detail pages.
load references from crossref.org and opencitations.net
Privacy notice: By enabling the option above, your browser will contact the APIs of crossref.org, opencitations.net, and semanticscholar.org to load article reference information. Although we do not have any reason to believe that your call will be tracked, we do not have any control over how the remote server uses your data. So please proceed with care and consider checking the Crossref privacy policy and the OpenCitations privacy policy, as well as the AI2 Privacy Policy covering Semantic Scholar.
Citation data
Add a list of citing articles from and
to record detail pages.
load citations from opencitations.net
Privacy notice: By enabling the option above, your browser will contact the API of opencitations.net and semanticscholar.org to load citation information. Although we do not have any reason to believe that your call will be tracked, we do not have any control over how the remote server uses your data. So please proceed with care and consider checking the OpenCitations privacy policy as well as the AI2 Privacy Policy covering Semantic Scholar.
OpenAlex data
Load additional information about publications from .
Privacy notice: By enabling the option above, your browser will contact the API of openalex.org to load additional information. Although we do not have any reason to believe that your call will be tracked, we do not have any control over how the remote server uses your data. So please proceed with care and consider checking the information given by OpenAlex.
last updated on 2024-07-11 20:16 CEST by the dblp team
all metadata released as open data under CC0 1.0 license
see also: Terms of Use | Privacy Policy | Imprint