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"Fault Models and Test Generation for OpAmp Circuits - The FFM."
José Vicente Calvano et al. (2001)
- José Vicente Calvano, Antonio Carneiro de Mesquita Filho, Vladimir Castro Alves, Marcelo Lubaszewski:
Fault Models and Test Generation for OpAmp Circuits - The FFM. J. Electron. Test. 17(2): 121-138 (2001)
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