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"Fault Models and Compact Test Vectors for MOS OpAmp circuits."

José Vicente Calvano et al. (2000)

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DOI: 10.5555/827245.827282

access: closed

type: Conference or Workshop Paper

metadata version: 2022-06-02

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  - https://dblp.org/rec/conf/sbcci/CalvanoALF00
José Vicente Calvano, Vladimir Castro Alves, Marcelo Soares Lubaszewski, Antonio Carneiro de Mesquita Filho:
Fault Models and Compact Test Vectors for MOS OpAmp circuits. SBCCI 2000: 289-294

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