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ORCIDOdair Lelis Goncalez
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2020 – today
- 2021
[j3]Carlos J. González
, Bruno L. Costa, Diego N. Machado, Rafael Galhardo Vaz, Alexis C. Vilas Bôas, Odair Lelis Gonçalez, Helmut Puchner, Fernanda Lima Kastensmidt, Nilberto H. Medina, Marcilei Aparecida Guazzelli, Tiago Roberto Balen:
Failure Mechanism and Sampling Frequency Dependency on TID Response of SAR ADCs. J. Electron. Test. 37(3): 329-343 (2021)- 2020
- [c6]Bruno L. Costa, Carlos J. González, Rafael Galhardo Vaz, Odair Lelis Gonçalez, Tiago R. Balen:
Influence of sampling frequency on TID response of SAR ADCs. LATS 2020: 1-6
2010 – 2019
- 2017
- [c5]Carlos J. González, Cristiano P. Chenet, Matheus Budelon, Rafael Galhardo Vaz, Odair Lelis Goncalez, Tiago R. Balen:
Evaluation of a mixed-signal design diversity system under radiation effects. LATS 2017: 1-6 - 2016
- [j2]Peterson R. Agostinho, Odair Lelis Goncalez, Gilson I. Wirth:
Rail to rail radiation hardened operational amplifier in standard CMOS technology with standard layout techniques. Microelectron. Reliab. 67: 99-103 (2016) - 2015
- [j1]Alexandre Simionovski, Rafael Galhardo Vaz, Odair Lelis Goncalez, Gilson I. Wirth:
Impact of Total Ionizing Dose on Bulk Built-In Current Sensors with Dynamic Storage Cell. J. Electron. Test. 31(4): 411-417 (2015) - 2014
- [c4]Evaldo Carlos Fonseca Pereira, Odair Lelis Goncalez, Rafael Galhardo Vaz, Claudio Antonio Federico, Thiago Hanna Both, Gilson Inácio Wirth:
The effects of total ionizing dose on the neutron SEU cross section of a 130 nm 4 Mb SRAM memory. LATW 2014: 1-4 - [c3]Lucas A. Tambara, Jorge L. Tonfat, Ricardo Reis, Fernanda Lima Kastensmidt, Evaldo Carlos Fonseca Pereira, Rafael Galhardo Vaz, Odair Lelis Goncalez:
Soft error rate in SRAM-based FPGAs under neutron-induced and TID effects. LATW 2014: 1-6 - 2012
- [c2]Guilherme Schwanke Cardoso, Tiago R. Balen, Marcelo Soares Lubaszewski, Rafael Galhardo Vaz, Odair Lelis Goncalez:
Impact of TID-induced threshold deviations in analog building-blocks of operational amplifiers. LATW 2012: 1-6 - 2011
- [c1]Tiago R. Balen, Guilherme Schwanke Cardoso, Odair Lelis Gonçalez, Marcelo Soares Lubaszewski:
Investigating the effects of transient faults in Programmable Capacitor Arrays. LATW 2011: 1-6
Coauthor Index
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