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ORCID"2007 IEEE International Test Conference, ITC 2007, Santa Clara, ..."
Jill Sibert, Janusz Rajski (2007)
- Jill Sibert, Janusz Rajski:
2007 IEEE International Test Conference, ITC 2007, Santa Clara, California, USA, October 21-26, 2007. IEEE Computer Society 2007, ISBN 1-4244-1128-9 [contents]
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