"How to ensure zero defects from the beginning with semiconductor test methods."

Bernd Gessner (2007)

> Home

Details and statistics

DOI: 10.1109/TEST.2007.4437697

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-24

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - conf/itc/Gessner07
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/itc/Gessner07
Bernd Gessner:
How to ensure zero defects from the beginning with semiconductor test methods. ITC 2007: 1-2

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.