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Ritesh P. Turakhia

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2000 – 2009

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2009
[c5]
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Sandeep Kumar Goel, Narendra Devta-Prasanna, Ritesh P. Turakhia:
Effective and Efficient Test Pattern Generation for Small Delay Defect. VTS 2009: 111-116
[c4]
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Ritesh P. Turakhia, Mark Ward, Sandeep Kumar Goel, Brady Benware:
Bridging DFM Analysis and Volume Diagnostics for Yield Learning - A Case Study. VTS 2009: 167-172
2007
[c3]
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Ritesh P. Turakhia, W. Robert Daasch, Mark Ward, John Van Slyke:
Silicon evaluation of longest path avoidance testing for small delay defects. ITC 2007: 1-10
2006
[j1]
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Ritesh P. Turakhia, W. Robert Daasch, Joel Lurkins, Brady Benware:
Changing Test and Data Modeling Requirements for Screening Latent Defects as Statistical Outliers. IEEE Des. Test Comput. 23(2): 100-109 (2006)
2005
[c2]
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Ritesh P. Turakhia, Brady Benware, Robert Madge, Thaddeus T. Shannon, W. Robert Daasch:
Defect Screening Using Independent Component Analysis on I_DDQ. VTS 2005: 427-432
2004
[c1]
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  - conf/itc/MadgeBTDSR04
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Robert Madge, Brady Benware, Ritesh P. Turakhia, W. Robert Daasch, Chris Schuermyer, Jens Ruffler:
In Search of the Optimum Test Set - Adaptive Test Methods for Maximum Defect Coverage and Lowest Test Cost. ITC 2004: 203-212

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