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Publication search results
found 80 matches
- 2012
- Vishwani D. Agrawal:
Editorial. J. Electron. Test. 28(1): 1 (2012) - Vishwani D. Agrawal:
Editorial. J. Electron. Test. 28(2): 151-152 (2012) - Vishwani D. Agrawal:
Editorial. J. Electron. Test. 28(3): 263-264 (2012) - Vishwani D. Agrawal:
Editorial. J. Electron. Test. 28(4): 389-390 (2012) - Vishwani D. Agrawal:
Editorial. J. Electron. Test. 28(5): 551-552 (2012) - Vishwani D. Agrawal:
Editorial. J. Electron. Test. 28(6): 773-774 (2012) - Badar-ud-din Ahmed, Youren Wang, Rizwan Ullah, Najam-ud-din Ahmed:
A Novel TOPSIS-Based Test Vector Compaction Technique for Analog Fault Detection. J. Electron. Test. 28(4): 535-540 (2012) - R. M. Ayadi, S. Mahresi, M. Masmoudi:
Self-Calibration of Output Match and Reverse Isolation in LNAs Based Switchable Resistor. J. Electron. Test. 28(2): 167-176 (2012) - Benjamin Backes, Colin McDonough, Larry Smith, Wei Wang, Robert E. Geer:
Effects of Copper Plasticity on the Induction of Stress in Silicon from Copper Through-Silicon Vias (TSVs) for 3D Integrated Circuits. J. Electron. Test. 28(1): 53-62 (2012) - Juliano Benfica, Letícia Maria Bolzani Poehls, Fabian Vargas, José Lipovetzky, Ariel Lutenberg, Edmundo Gatti, Fernando Hernandez:
A Test Platform for Dependability Analysis of SoCs Exposed to EMI and Radiation. J. Electron. Test. 28(6): 803-816 (2012) - Nicola Bombieri, Franco Fummi, Valerio Guarnieri:
FAST: An RTL Fault Simulation Framework based on RTL-to-TLM Abstraction. J. Electron. Test. 28(4): 495-510 (2012) - Alexandre Boyer, Sonia Ben Dhia, Binhong Li, Christophe Lemoine, Bertrand Vrignon:
Prediction of Long-term Immunity of a Phase-Locked Loop. J. Electron. Test. 28(6): 791-802 (2012) - Michael Buttrick, Sandip Kundu:
On Testing Prebond Dies with Incomplete Clock Networks in a 3D IC Using DLLs. J. Electron. Test. 28(1): 93-101 (2012) - Karine Castellani-Coulié, Hassen Aziza, Gilles Micolau, Jean-Michel Portal:
Optimization of SEU Simulations for SRAM Cells Reliability under Radiation. J. Electron. Test. 28(3): 331-338 (2012) - Kanad Chakraborty, Vishwani D. Agrawal:
Data-Driven DPPM Estimation and Adaptive Fault Coverage Calibration Using MATLAB®. J. Electron. Test. 28(6): 869-875 (2012) - Hsiu-Ming (Sherman) Chang, David C. Keezer:
Guest Editorial: Special Issue on Analog, Mixed-Signal, RF, and MEMS Testing. J. Electron. Test. 28(5): 555-556 (2012) - Xiaomei Chen, Xiaofeng Meng, Guohua Wang:
A Modified Simulation-Based Multi-Signal Modeling for Electronic System. J. Electron. Test. 28(2): 155-165 (2012) - Atefe Dalirsani, Stefan Holst, Melanie Elm, Hans-Joachim Wunderlich:
Structural Test and Diagnosis for Graceful Degradation of NoC Switches. J. Electron. Test. 28(6): 831-841 (2012) - Sachin Dileep Dasnurkar, Jacob A. Abraham:
Calibration Enabled Scalable Current Sensor Module for Quiescent Current Testing. J. Electron. Test. 28(5): 697-704 (2012) - Sonia Ben Dhia, Alexandre Boyer, Bertrand Vrignon, Mikaël Deobarro:
IC Immunity Modeling Process Validation Using On-Chip Measurements. J. Electron. Test. 28(3): 339-348 (2012) - Jingbo Duan, Bharath K. Vasan, Chen Zhao, Degang Chen, Randall L. Geiger:
On Chip Signal Generators for Low Overhead ADC BIST. J. Electron. Test. 28(5): 615-623 (2012) - Cesare Ferri, Dimitra Papagiannopoulou, R. Iris Bahar, Andrea Calimera:
NBTI-Aware Data Allocation Strategies for Scratchpad Based Embedded Systems. J. Electron. Test. 28(3): 349-363 (2012) - Renan Alves Fonseca, Luigi Dilillo, Alberto Bosio, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Nabil Badereddine:
Impact of Resistive-Bridging Defects in SRAM at Different Technology Nodes. J. Electron. Test. 28(3): 317-329 (2012) - Judit Freijedo, Jorge Semião, Juan J. Rodríguez-Andina, Fabian Vargas, Isabel C. Teixeira, João Paulo Teixeira:
Modeling the Effect of Process, Power-Supply Voltage and Temperature Variations on the Timing Response of Nanometer Digital Circuits. J. Electron. Test. 28(4): 421-434 (2012) - Didac Gómez, Josep Altet, Diego Mateo:
On the Use of Static Temperature Measurements as Process Variation Observable. J. Electron. Test. 28(5): 685-695 (2012) - Michelangelo Grosso, Wilson-Javier Pérez-Holguín, Ernesto Sánchez, Matteo Sonza Reorda, Alberto Paolo Tonda, Jaime Velasco-Medina:
Software-Based Testing for System Peripherals. J. Electron. Test. 28(2): 189-200 (2012) - Valerio Guarnieri, Giuseppe Di Guglielmo, Nicola Bombieri, Graziano Pravadelli, Franco Fummi, Hanno Hantson, Jaan Raik, Maksim Jenihhin, Raimund Ubar:
On the Reuse of TLM Mutation Analysis at RTL. J. Electron. Test. 28(4): 435-448 (2012) - Jari Hannu, Juha Häkkinen, Juha-Veikko Voutilainen, Heli Jantunen, Markku Moilanen:
Current State of the Mixed-Signal Test Bus 1149.4. J. Electron. Test. 28(6): 857-863 (2012) - Aritra Hazra, Priyankar Ghosh, Pallab Dasgupta, Partha Pratim Chakrabarti:
Cohesive Coverage Management: Simulation Meets Formal Methods. J. Electron. Test. 28(4): 449-468 (2012) - Xuan-Lun Huang, Jiun-Lang Huang, Hung-I Chen, Chang-Yu Chen, Tseng Kuo-Tsai, Ming-Feng Huang, Yung-Fa Chou, Ding-Ming Kwai:
An MCT-Based Bit-Weight Extraction Technique for Embedded SAR ADC Testing and Calibration. J. Electron. Test. 28(5): 705-722 (2012)
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