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"IC Immunity Modeling Process Validation Using On-Chip Measurements."

Sonia Ben Dhia et al. (2012)

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DOI: 10.1007/S10836-012-5294-3

access: closed

type: Journal Article

metadata version: 2020-09-11

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  - https://dblp.org/rec/journals/et/DhiaBVD12
Sonia Ben Dhia, Alexandre Boyer, Bertrand Vrignon, Mikaël Deobarro:
IC Immunity Modeling Process Validation Using On-Chip Measurements. J. Electron. Test. 28(3): 339-348 (2012)

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