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2020 – today
- 2023
[j14]Josep Altet
, Xavier Aragonès, Enrique Barajas, Xavier Gisbert, Sergio Martínez, Diego Mateo:
Aging Compensation in a Class-A High-Frequency Amplifier with DC Temperature Measurements. Sensors 23(16): 7069 (2023)- [c25]Max Doblas, Gerard Candón, Xavier Carril, Marc Domínguez, Enric Erra, Alberto González, César Hernández, Víctor Jiménez, Vatistas Kostalampros, Rubén Langarita, Neiel Leyva, Guillem López-Paradís, Jonnatan Mendoza, Josep Oltra, Julián Pavón, Cristóbal Ramírez, Narcís Rodas, Enrico Reggiani, Mario Rodríguez, Carlos Rojas, Abraham Ruiz, Hugo Safadi, Víctor Soria, Alejandro Suanes, Iván Vargas, Fernando Arreza, Roger Figueras, Pau Fontova-Musté, Joan Marimon, Ricardo Martínez, Sergio Moreno, Jordi Sacristán, Oscar Alonso, Xavier Aragonès, Adrián Cristal, Ángel Diéguez, Manuel López, Diego Mateo, Francesc Moll, Miquel Moretó, Oscar Palomar, Marco A. Ramírez, Francisco Serra-Graells, Nehir Sönmez, Lluís Terés, Osman S. Unsal, Mateo Valero, Luis Villa:
Sargantana: An Academic SoC RISC-V Processor in 22nm FDSOI Technology. DCIS 2023: 1-6 - 2022
- [c24]Francesco Malena, Xavier Aragonès, Diego Mateo, Michele Caselli, Andrea Boni:
An Ultra Low-Voltage RF Front-end Receiver for IoT Devices. PRIME 2022: 161-164 - 2021
- [j13]Josep Altet, Enrique Barajas, Diego Mateo, Alexandre Billong, Xavier Aragonès, Xavier Perpiñà, Ferran Reverter:
BPF-Based Thermal Sensor Circuit for On-Chip Testing of RF Circuits. Sensors 21(3): 805 (2021) - 2020
- [c23]Rosana Rodríguez, Albert Crespo-Yepes, Javier Martín-Martínez, Montserrat Nafría, Xavier Aragonès, Diego Mateo, Enrique Barajas:
Experimental Monitoring of Aging in CMOS RF Linear Power Amplifiers: Correlation Between Device and Circuit Degradation. IRPS 2020: 1-7
2010 – 2019
- 2019
- [j12]Javier Diaz-Fortuny, Javier Martín-Martínez, Rosana Rodríguez, Rafael Castro-López, Elisenda Roca, Xavier Aragonès, Enrique Barajas, Diego Mateo, Francisco V. Fernández, Montserrat Nafría:
A Versatile CMOS Transistor Array IC for the Statistical Characterization of Time-Zero Variability, RTN, BTI, and HCI. IEEE J. Solid State Circuits 54(2): 476-488 (2019) - [j11]Enrique Barajas, Xavier Aragonès, Diego Mateo, Josep Altet:
Differential Temperature Sensors: Review of Applications in the Test and Characterization of Circuits, Usage and Design Methodology. Sensors 19(21): 4815 (2019) - [c22]Xavier Aragonès, Alex Alvarez, Juan Pablo Rovayo, Josep Altet, Diego Mateo:
Design of ULV ULP LNAs Exploiting FBB in FDSOI 28nm Technology. DCIS 2019: 1-6 - [c21]Anant Rungta, Josep Altet, Enrique Barajas, Antonio Rubio, Xavier Aragonès, Diego Mateo:
On the Use of Built-In Temperature Sensors to Monitor Aging in RF Circuits. DCIS 2019: 1-6 - [c20]Xavier Aragonès, Diego Mateo, Enrique Barajas, Albert Crespo-Yepes, Rosana Rodríguez, Javier Martín-Martínez, Montserrat Nafría:
Aging in CMOS RF Linear Power Amplifiers: Experimental Comparison and Modeling. ISCAS 2019: 1-5 - 2018
- [c19]Enrique Barajas, Xavier Aragonès, Diego Mateo, Francesc Moll, Antonio Rubio, Javier Martín-Martínez, Rosana Rodríguez, Marc Porti, Montserrat Nafría, Rafael Castro-López, Elisenda Roca, Francisco V. Fernández:
Analysis of Body Bias and RTN-Induced Frequency Shift of Low Voltage Ring Oscillators in FDSOI Technology. PATMOS 2018: 82-87 - 2017
- [c18]Javier Diaz-Fortuny, Javier Martín-Martínez, Rosana Rodríguez, Montserrat Nafría, Rafael Castro-López, Elisenda Roca, Francisco V. Fernández, Enrique Barajas, Xavier Aragonès, Diego Mateo:
A transistor array chip for the statistical characterization of process variability, RTN and BTI/CHC aging. SMACD 2017: 1-4 - 2014
- [j10]Josep Altet, José Luis González, Didac Gómez, Xavier Perpiñà, Wilfrid Claeys, Stéphane Grauby, Cédric Dufis, Miquel Vellvehí, Diego Mateo, Ferran Reverter, Stefan Dilhaire, Xavier Jordà:
Electro-thermal characterization of a differential temperature sensor in a 65 nm CMOS IC: Applications to gain monitoring in RF amplifiers. Microelectron. J. 45(5): 484-490 (2014) - [c17]Josep Altet, Eduardo Aldrete-Vidrio, Ferran Reverter, Didac Gómez, José Luis González, Marvin Onabajo, José Silva-Martínez, B. Martineau, X. Perpiñà, Louay Abdallah, Haralampos-G. D. Stratigopoulos, Xavier Aragonès, Xavier Jordà, Miquel Vellvehí, Stefan Dilhaire, Salvador Mir, Diego Mateo:
Review of temperature sensors as monitors for RF-MMW built-in testing and self-calibration schemes. MWSCAS 2014: 1081-1084 - 2013
- [j9]Marc Molina, Xavier Aragonès, Diego Mateo, José Luis González:
Inductor shielding strategies to protect mmW LC-VCOs from high frequency substrate noise. Microelectron. J. 44(5): 405-413 (2013) - 2012
- [j8]Didac Gómez, Josep Altet, Diego Mateo:
On the Use of Static Temperature Measurements as Process Variation Observable. J. Electron. Test. 28(5): 685-695 (2012) - [j7]Xavier Trulls, Diego Mateo, Adria Bofill:
A small-area inductorless configurable wideband LNA with high dynamic range. Microelectron. J. 43(3): 198-204 (2012) - [j6]Didac Gómez, Cédric Dufis, Josep Altet, Diego Mateo, José Luis González:
Electro-thermal coupling analysis methodology for RF circuits. Microelectron. J. 43(9): 633-641 (2012) - [c16]Josep Altet, Diego Mateo, Didac Gómez:
On line monitoring of RF power amplifiers with embedded temperature sensors. IOLTS 2012: 109-113 - [c15]Josep Altet, Diego Mateo, Didac Gómez, Xavier Perpiñà, Miquel Vellvehí, Xavier Jordà:
DC temperature measurements for power gain monitoring in RF power amplifiers. ITC 2012: 1-8 - 2011
- [j5]Marvin Onabajo, Didac Gómez, Eduardo Aldrete-Vidrio, Josep Altet, Diego Mateo, José Silva-Martínez:
Survey of Robustness Enhancement Techniques for Wireless Systems-on-a-Chip and Study of Temperature as Observable for Process Variations. J. Electron. Test. 27(3): 225-240 (2011) - [j4]Marvin Onabajo, Josep Altet, Eduardo Aldrete-Vidrio, Diego Mateo, José Silva-Martínez:
Electrothermal Design Procedure to Observe RF Circuit Power and Linearity Characteristics With a Homodyne Differential Temperature Sensor. IEEE Trans. Circuits Syst. I Regul. Pap. 58-I(3): 458-469 (2011) - 2010
- [c14]Enrique Barajas, Diego Mateo, José Luis González:
Behavioural Modelling of DLLs for Fast Simulation and Optimisation of Jitter and Power Consumption. DSD 2010: 541-547 - [c13]Josep Altet, Diego Mateo, Eduardo Aldrete-Vidrio:
Thermal coupling in ICs: Applications to the test and characterization of analogue and RF circuits. IOLTS 2010: 135
2000 – 2009
- 2009
- [c12]Eduardo Aldrete-Vidrio, Marvin Onabajo, Josep Altet, Diego Mateo, José Silva-Martínez:
Non-invasive RF built-in testing using on-chip temperature sensors. ITC 2009: 1 - 2008
- [c11]Eduardo Aldrete-Vidrio, M. Amine Salhi, Josep Altet, Stéphane Grauby, Diego Mateo, H. Michel, L. Clerjaud, Jean-Michel Rampnoux, Antonio Rubio, Wilfrid Claeys, Stefan Dilhaire:
Using Temperature as Observable of the Frequency Response of RF CMOS Amplifiers. ETS 2008: 47-52 - [c10]Laura Moreno, Didac Gómez, José Luis González, Diego Mateo, Xavier Aragonès, Roc Berenguer, Héctor Solar:
A low-power RF front-end for 2.5 GHz receivers. ISCAS 2008: 976-979 - 2007
- [j3]Diego Mateo, Josep Altet, Eduardo Aldrete-Vidrio:
Electrical characterization of analogue and RF integrated circuits by thermal measurements. Microelectron. J. 38(2): 151-156 (2007) - [c9]Enrique Barajas, R. Cosculluela, D. Coutinho, Diego Mateo, José Luis González, I. Cairò, S. Banda, M. Ikeda:
Interactive presentation: Behavioral modeling of delay-locked loops and its application to jitter optimization in ultra wide-band impulse radio systems. DATE 2007: 1430-1435 - 2006
- [c8]Josep Altet, Diego Mateo, José Luis González, Eduardo Aldrete-Vidrio:
Observation of high-frequency analog/RF electrical circuit characteristics by on-chip thermal measurements. ISCAS 2006 - [c7]Antonio Calomarde, Diego Mateo, Antonio Rubio:
High level spectral-based analysis of power consumption in DSPs systems. ISCAS 2006 - 2005
- [j2]Miguel A. Méndez, José Luis González, Diego Mateo, Antonio Rubio:
An investigation on the relation between digital circuitry characteristics and power supply noise spectrum in mixed-signal CMOS integrated circuits. Microelectron. J. 36(1): 77-84 (2005) - [c6]Miguel A. Méndez, Diego Mateo, Xavier Aragonès, José Luis González:
Phase noise degradation of LC-tank VCOs due to substrate noise and package coupling. ESSCIRC 2005: 105-108 - [c5]Enrique Barajas, Luis Elvira, Miguel A. Méndez, Ferran Martorell, Diego Mateo, José Luis González:
Discrete and continuous substrate noise spectrum dependence on digital circuit characteristics. ISCAS (5) 2005: 4273-4276 - 2003
- [c4]Ferran Martorell, Diego Mateo, Xavier Aragonès:
Modeling and Evaluation of Substrate Noise Induced by Interconnects. DATE 2003: 10524-10529
1990 – 1999
- 1998
- [j1]Diego Mateo, Antonio Rubio:
Design and implementation of a 5×5 trits multiplier in a quasi-adiabatic ternary CMOS logic. IEEE J. Solid State Circuits 33(7): 1111-1116 (1998) - 1996
- [c3]M. Rullán, Carles Ferrer, Joan Oliver, Diego Mateo, Antonio Rubio:
Analysis of ISSQ/IDDQ Testing Implementation and Circuit Partitioning in CMOS Cell-Based Design. ED&TC 1996: 584-588 - 1995
- [c2]Antonio Rubio, Edmond Janssens, H. Casier, Joan Figueras, Diego Mateo, P. De Pauw, Jaume Segura:
A built-in quiescent current monitor for CMOS VLSI circuits. ED&TC 1995: 581-587 - [c1]Jaume A. Segura, Miquel Roca, Diego Mateo, Antonio Rubio:
An approach to dynamic power consumption current testing of CMOS ICs. VTS 1995: 95-100
Coauthor Index
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