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"Impact of Resistive-Bridging Defects in SRAM at Different Technology Nodes."
Renan Alves Fonseca et al. (2012)
- Renan Alves Fonseca, Luigi Dilillo, Alberto Bosio, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Nabil Badereddine:
Impact of Resistive-Bridging Defects in SRAM at Different Technology Nodes. J. Electron. Test. 28(3): 317-329 (2012)
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