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Atefe Dalirsani
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2010 – 2019
- 2017
- [j2]Gert Schley, Atefe Dalirsani, Marcus Eggenberger, Nadereh Hatami, Hans-Joachim Wunderlich, Martin Radetzki:
Multi-Layer Diagnosis for Fault-Tolerant Networks-on-Chip. IEEE Trans. Computers 66(5): 848-861 (2017) - 2016
- [c9]Atefe Dalirsani, Hans-Joachim Wunderlich:
Functional Diagnosis for Graceful Degradation of NoC Switches. ATS 2016: 246-251 - 2015
- [b1]Atefe Dalirsani:
Self-diagnosis in Network-on-Chips. University of Stuttgart, 2015 - [c8]Michael A. Kochte, Atefe Dalirsani, Andrea Bernabei, Martin Omaña, Cecilia Metra, Hans-Joachim Wunderlich:
Intermittent and Transient Fault Diagnosis on Sparse Code Signatures. ATS 2015: 157-162 - 2014
- [c7]Atefe Dalirsani, Nadereh Hatami, Michael E. Imhof, Marcus Eggenberger, Gert Schley, Martin Radetzki, Hans-Joachim Wunderlich:
On Covering Structural Defects in NoCs by Functional Tests. ATS 2014: 87-92 - [c6]Atefe Dalirsani, Michael A. Kochte, Hans-Joachim Wunderlich:
Area-efficient synthesis of fault-secure NoC switches. IOLTS 2014: 13-18 - [c5]Atefe Dalirsani, Michael E. Imhof, Hans-Joachim Wunderlich:
Structural Software-Based Self-Test of Network-on-Chip. VTS 2014: 1-6 - 2013
- [c4]Atefe Dalirsani, Michael A. Kochte, Hans-Joachim Wunderlich:
SAT-based code synthesis for fault-secure circuits. DFTS 2013: 39-44 - 2012
- [j1]Atefe Dalirsani, Stefan Holst, Melanie Elm, Hans-Joachim Wunderlich:
Structural Test and Diagnosis for Graceful Degradation of NoC Switches. J. Electron. Test. 28(6): 831-841 (2012) - 2011
- [c3]Atefe Dalirsani, Stefan Holst, Melanie Elm, Hans-Joachim Wunderlich:
Structural Test for Graceful Degradation of NoC Switches. ETS 2011: 183-188
2000 – 2009
- 2007
- [c2]Mohammad Hosseinabady
, Atefe Dalirsani, Zainalabedin Navabi:
Using the inter- and intra-switch regularity in NoC switch testing. DATE 2007: 361-366 - [c1]Atefe Dalirsani, Mohammad Hosseinabady
, Zainalabedin Navabi:
An Analytical Model for Reliability Evaluation of NoC Architectures. IOLTS 2007: 49-56
Coauthor Index
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