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Sungho Kang
This is just a disambiguation page, and is not intended to be the bibliography of an actual person. The links to all actual bibliographies of persons of the same or a similar name can be found below. Any publication listed on this page has not been assigned to an actual author yet. If you know the true author of one of the publications listed below, you are welcome to contact us.
Person information
Other persons with the same name
- Sungho Kang 0001 — Yonsei University, Seoul, South Korea
- Sungho Kang 0002 — Sungkyunkwan University, Department of Electrical and Computer Engineering, Seoul, South Korea
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Journal Articles
- 2020
- [j49]Sung-Wook Shin, Jung-Hyun Park, Woo-Jin Lee, Sungho Kang, Hyunggun Kim, Sung-Taek Chung:
Analysis of Electroencephalography Signals on the Contents of Cognitive Function Game: Attention and Memory. J. Medical Imaging Health Informatics 10(6): 1452-1458 (2020) - [j48]Hyunyul Lim, Minho Cheong, Sungho Kang:
Scan-Chain-Fault Diagnosis Using Regressions in Cryptographic Chips for Wireless Sensor Networks. Sensors 20(17): 4771 (2020) - 2017
- [j47]Jaeseok Park, Minho Cheong, Sungho Kang:
R2-TSV: A Repairable and Reliable TSV Set Structure Reutilizing Redundancies. IEEE Trans. Reliab. 66(2): 458-466 (2017) - 2016
- [j46]Keewon Cho, Wooheon Kang, Hyungjun Cho, Changwook Lee, Sungho Kang:
A Survey of Repair Analysis Algorithms for Memories. ACM Comput. Surv. 49(3): 47:1-47:41 (2016) - [j45]Wooheon Kang, Changwook Lee, Hyunyul Lim, Sungho Kang:
Optimized Built-In Self-Repair for Multiple Memories. IEEE Trans. Very Large Scale Integr. Syst. 24(6): 2174-2183 (2016) - 2015
- [j44]Hyejeong Hong, Jaeil Lim, Hyunyul Lim, Sungho Kang:
Lifetime Reliability Enhancement of Microprocessors: Mitigating the Impact of Negative Bias Temperature Instability. ACM Comput. Surv. 48(1): 9:1-9:25 (2015) - [j43]HyeonUk Son, Jaewon Jang, Heetae Kim, Sungho Kang:
Reduced-code test method using sub-histograms for pipelined ADCs. IEICE Electron. Express 12(12): 20150417 (2015) - [j42]Younsun Kim, Ingeol Lee, Sungho Kang:
Eco Assist Techniques through Real-time Monitoring of BEV Energy Usage Efficiency. Sensors 15(7): 14946-14959 (2015) - [j41]Jaeil Lim, Hyunyul Lim, Sungho Kang:
3-D Stacked DRAM Refresh Management With Guaranteed Data Reliability. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 34(9): 1455-1466 (2015) - [j40]Wooheon Kang, Changwook Lee, Hyunyul Lim, Sungho Kang:
A 3 Dimensional Built-In Self-Repair Scheme for Yield Improvement of 3 Dimensional Memories. IEEE Trans. Reliab. 64(2): 586-595 (2015) - [j39]Taewoo Han, Inhyuk Choi, Sungho Kang:
Majority-Based Test Access Mechanism for Parallel Testing of Multiple Identical Cores. IEEE Trans. Very Large Scale Integr. Syst. 23(8): 1439-1447 (2015) - 2014
- [j38]Taewoo Han, Inhyuk Choi, Sungho Kang:
A novel test access mechanism for parallel testing of multi-core system. IEICE Electron. Express 11(6): 20140093 (2014) - [j37]Hyejeong Hong, Jaeil Lim, Sungho Kang:
Recovery-enhancing task scheduling for multicore processors under NBTI impact. IEICE Electron. Express 11(11): 20140324 (2014) - [j36]Changwook Lee, Wooheon Kang, Donkoo Cho, Sungho Kang:
A New Fuse Architecture and a New Post-Share Redundancy Scheme for Yield Enhancement in 3-D-Stacked Memories. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 33(5): 786-797 (2014) - [j35]Hyoyoung Shin, Youngkyu Park, Gihwa Lee, Jungsik Park, Sungho Kang:
Interleaving Test Algorithm for Subthreshold Leakage-Current Defects in DRAM Considering the Equal Bit Line Stress. IEEE Trans. Very Large Scale Integr. Syst. 22(4): 803-812 (2014) - [j34]Wooheon Kang, Hyungjun Cho, Joohwan Lee, Sungho Kang:
A BIRA for Memories With an Optimal Repair Rate Using Spare Memories for Area Reduction. IEEE Trans. Very Large Scale Integr. Syst. 22(11): 2336-2349 (2014) - [j33]Hyungsu Sung, Keewon Cho, Kunsang Yoon, Sungho Kang:
A Delay Test Architecture for TSV With Resistive Open Defects in 3-D Stacked Memories. IEEE Trans. Very Large Scale Integr. Syst. 22(11): 2380-2387 (2014) - 2013
- [j32]Hyejeong Hong, Jaeil Lim, Hyunyul Lim, Sungho Kang:
Thermal-aware dynamic voltage frequency scaling for many-core processors under process variations. IEICE Electron. Express 10(14): 20130463 (2013) - [j31]Hyejeong Hong, Jaeil Lim, Hyunyul Lim, Sungho Kang:
Dynamic thermal management for 3D multicore processors under process variations. IEICE Electron. Express 10(23): 20130800 (2013) - [j30]Incheol Kim, Ingeol Lee, Sungho Kang:
Built-In Self-Test for Static ADC Testing with a Triangle-Wave. IEICE Trans. Electron. 96-C(2): 292-294 (2013) - [j29]Hyejeong Hong, Sungho Kang:
Acceleration of Deep Packet Inspection Using a Multi-Byte Processing Prefilter. IEICE Trans. Commun. 96-B(2): 643-646 (2013) - 2012
- [j28]Hyuntae Park, Hyejeong Hong, Sungho Kang:
An efficient IP address lookup algorithm based on a small balanced tree using entry reduction. Comput. Networks 56(1): 231-243 (2012) - [j27]Yoseop Lim, Jaeseok Park, Sungho Kang:
A method for the fast diagnosis of multiple defects using an efficient candidate selection algorithm. IEICE Electron. Express 9(9): 834-839 (2012) - [j26]Yoseop Lim, Jaeseok Park, Sungho Kang:
An accurate diagnosis of transition fault clusters based on single fault simulation. IEICE Electron. Express 9(19): 1528-1533 (2012) - 2011
- [j25]HyeonUk Son, Incheol Kim, Sang-Goog Lee, Jin-Ho Ahn, Jeong-Do Kim, Sungho Kang:
Noise-Tolerant DAC BIST Scheme Using Integral Calculus Approach. IEICE Trans. Electron. 94-C(8): 1344-1347 (2011) - [j24]Hyuntae Park, Hyejeong Hong, Sungho Kang:
An Efficient IP Address Lookup Scheme Using Balanced Binary Search with Minimal Entry and Optimal Prefix Vector. IEICE Trans. Commun. 94-B(11): 3128-3131 (2011) - 2010
- [j23]Youbean Kim, Jaewon Jang, Hyunwook Son, Sungho Kang:
Pattern Mapping Method for Low Power BIST Based on Transition Freezing Method. IEICE Trans. Inf. Syst. 93-D(3): 643-646 (2010) - [j22]Myung-Hoon Yang, Hyungjun Cho, Wooheon Kang, Sungho Kang:
EOF: Efficient Built-In Redundancy Analysis Methodology With Optimal Repair Rate. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 29(7): 1130-1135 (2010) - [j21]Woosik Jeong, Joohwan Lee, Taewoo Han, Kaangchil Lee, Sungho Kang:
An Advanced BIRA for Memories With an Optimal Repair Rate and Fast Analysis Speed by Using a Branch Analyzer. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 29(12): 2014-2026 (2010) - 2009
- [j20]Youngkyu Park, Jaeseok Park, Taewoo Han, Sungho Kang:
An Effective Programmable Memory BIST for Embedded Memory. IEICE Trans. Inf. Syst. 92-D(12): 2508-2511 (2009) - [j19]Sunghoon Chun, Taejin Kim, Sungho Kang:
ATPG-XP: Test Generation for Maximal Crosstalk-Induced Faults. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 28(9): 1401-1413 (2009) - [j18]Woosik Jeong, Ilkwon Kang, Kyowon Jin, Sungho Kang:
A Fast Built-in Redundancy Analysis for Memories With Optimal Repair Rate Using a Line-Based Search Tree. IEEE Trans. Very Large Scale Integr. Syst. 17(12): 1665-1678 (2009) - 2008
- [j17]Kicheol Kim, Youbean Kim, Incheol Kim, HyeonUk Son, Sungho Kang:
A Low-Cost BIST Based on Histogram Testing for Analog to Digital Converters. IEICE Trans. Electron. 91-C(4): 670-672 (2008) - [j16]Youbean Kim, Kicheol Kim, Incheol Kim, Hyunwook Son, Sungho Kang:
A New Scan Power Reduction Scheme Using Transition Freezing for Pseudo-Random Logic BIST. IEICE Trans. Inf. Syst. 91-D(4): 1185-1188 (2008) - [j15]DongSup Song, Jin-Ho Ahn, Taejin Kim, Sungho Kang:
MTR-Fill: A Simulated Annealing-Based X-Filling Technique to Reduce Test Power Dissipation for Scan-Based Designs. IEICE Trans. Inf. Syst. 91-D(4): 1197-1200 (2008) - [j14]Youbean Kim, Kicheol Kim, Incheol Kim, Sungho Kang:
A New Built-in Self Test Scheme for Phase-Locked Loops Using Internal Digital Signals. IEICE Trans. Electron. 91-C(10): 1713-1716 (2008) - 2007
- [j13]Incheol Kim, Kicheol Kim, Youbean Kim, HyeonUk Son, Sungho Kang:
A New Analog-to-Digital Converter BIST Considering a Transient Zone. IEICE Trans. Electron. 90-C(11): 2161-2163 (2007) - [j12]Myung-Hoon Yang, Youbean Kim, Youngkyu Park, D. Lee, Sungho Kang:
Deterministic built-in self-test using split linear feedback shift register reseeding for low-power testing. IET Comput. Digit. Tech. 1(4): 369-376 (2007) - 2006
- [j11]DongSup Song, Sungho Kang:
A Clustered RIN BIST Based on Signal Probabilities of Deterministic Test Sets. IEICE Trans. Inf. Syst. 89-D(1): 354-357 (2006) - 2005
- [j10]Junseok Han, DongSup Song, Hagbae Kim, Youngyong Kim, Sungho Kang:
An Effective Built-In Self-Test for Chargepump PLL. IEICE Trans. Electron. 88-C(8): 1731-1733 (2005) - [j9]Kicheol Kim, DongSub Song, Incheol Kim, Sungho Kang:
A New Low Power Test Pattern Generator for BIST Architecture. IEICE Trans. Electron. 88-C(10): 2037-2038 (2005) - 2004
- [j8]Sangyun Hwang, Gunhee Han, Sungho Kang, Jaeseok Kim:
New distributed arithmetic algorithm for low-power FIR filter implementation. IEEE Signal Process. Lett. 11(5): 463-466 (2004) - [j7]Dongmyung Lee, Kwisung Yoo, Kicheol Kim, Gunhee Han, Sungho Kang:
Code-width testing-based compact ADC BIST circuit. IEEE Trans. Circuits Syst. II Express Briefs 51-II(11): 603-606 (2004) - 2003
- [j6]Sungho Kang, Stephen A. Szygenda:
Accurate Logic Simulation by Overcoming the Unknown Value Propagation Problem. Simul. 79(2): 59-68 (2003) - 2001
- [j5]Song Chong, Sangho Lee, Sungho Kang:
A simple, scalable, and stable explicit rate allocation algorithm for MAX-MIN flow control with minimum rate guarantee. IEEE/ACM Trans. Netw. 9(3): 322-335 (2001) - 1996
- [j4]Sungho Kang, Youngmin Hur, Stephen A. Szygenda:
A Hardware Accelerator for Fault Simulation Utilizing a Reconfigurable Array Architecture. VLSI Design 4(2): 119-133 (1996) - 1994
- [j3]Sungho Kang, Stephen A. Szygenda:
Design Validation: Comparing Theoretical and Empirical Results of Design Error Modeling. IEEE Des. Test Comput. 11(1): 18-26 (1994) - [j2]Sungho Kang, Stephen A. Szygenda:
Automatic Simulator Generation System. Simul. 63(6): 360-368 (1994) - [j1]Sungho Kang, Stephen A. Szygenda:
The simulation automation system (SAS); concepts, implementation, and results. IEEE Trans. Very Large Scale Integr. Syst. 2(1): 89-99 (1994)
Conference and Workshop Papers
- 2023
- [c64]Hyojoon Yun, Tae-Hyun Kim, Sungho Kang:
Machine Learning based Scan Chain Diagnosis for Double Faults. ISOCC 2023: 341-342 - [c63]Hyemin Kim, Sangjun Lee, Jongho Park, Sungwhan Park, Sungho Kang:
A New Flip-flop Shared Architecture of Test Point Insertion for Scan Design. ISOCC 2023: 343-344 - 2022
- [c62]Sunghoon Kim, Seokjun Jang, Youngki Moon, Sungho Kang:
Pair-Grouping Scan Chain Architecture for Multiple Scan Cell Fault Diagnosis. ISOCC 2022: 25-26 - [c61]Jongho Park, Sangjun Lee, Inhwan Lee, Sungwhan Park, Sungho Kang:
Correlation Aware Random Pattern Generation for Test Time and Shift Power Reduction of Logic BIST. ISOCC 2022: 53-54 - [c60]Hyeonchan Lim, Hyojoon Yun, Juyong Lee, Sungho Kang:
Cell-Aware Scan Diagnosis Using Partially Synchronous Set and Reset. ISOCC 2022: 121-122 - [c59]Tae Hyun Kim, Hyeonchan Lim, Minho Cheong, Hyojoon Yun, Sungho Kang:
Logic Diagnosis Based on Deep Learning for Multiple Faults. ISOCC 2022: 366-367 - 2021
- [c58]Antea Risso, Vageeswar Rajaram, Matilde Maria Pavese, Sungho Kang, Sila Deniz Calisgan, Zhenyun Qian, Matteo Rinaldi:
Long-lasting Leaf Water Stress Detector Based On An Infrared Micromechanical Photoswitch And A Solar Powered Sunlight Digitizer. IEEE SENSORS 2021: 1-4 - [c57]Sangjun Lee, Jongho Park, Inhwan Lee, Kwonhyoung Lee, Sungho Kang:
Hybrid Test Access Mechanism for Multiple Identical Cores. ISOCC 2021: 365-366 - [c56]Seokjun Jang, Hyungil Woo, Sunghoon Kim, Sungho Kang:
Secure Scan Design through Pseudo Fault Injection. ISOCC 2021: 425-426 - 2020
- [c55]Hyeonchan Lim, Tae Hyun Kim, Seunghwan Kim, Sungho Kang:
Diagnosis of Scan Chain Faults Based-on Machine-Learning. ISOCC 2020: 57-58 - 2019
- [c54]Sila Deniz Calisgan, Vageeswar Rajaram, Zhenyun Qian, Sungho Kang, Antea Risso, Matteo Rinaldi:
Zero-Power Chemical Sensor Based on a Polymer/Metal Micromechanical Switch. IEEE SENSORS 2019: 1-4 - [c53]Minho Cheng, Hyunyul Lim, Tae Hyun Kim, Sungho Kang:
A Hardware-efficient TSV Repair Scheme Based on Butterfly Topology. ISOCC 2019: 63-64 - 2018
- [c52]Sila Deniz Calisgan, Vladimir Villanueva-Lopez, Vageeswar Rajaram, Zhenyun Qian, Sungho Kang, Samuel P. Hernandez-Rivera, Matteo Rinaldi:
Spectroscopic Chemical Sensing Based on Narrowband MEMS Resonant Infrared Detectors. IEEE SENSORS 2018: 1-4 - [c51]Vageeswar Rajaram, Zhenyun Qian, Sungho Kang, Sila Deniz Calisgan, Nicol E. McGruer, Matteo Rinaldi:
A False Alarm-Free Zero-Power Micromechanical Photoswitch. IEEE SENSORS 2018: 1-4 - [c50]Minho Cheong, Ingeol Lee, Sungho Kang:
A Test Methodology for Neural Computing Unit. ISOCC 2018: 11-12 - [c49]Keewon Cho, Young-Woo Lee, Sungyoul Seo, Sungho Kang:
2-D Failure Bitmap Compression Using Line Fault Marking Method. ISOCC 2018: 21-22 - [c48]Hyeonchan Lim, Seokjun Jang, Sungho Kang:
A Software-based Scan Chain Diagnosis for Double Faults in A Scan Chain. ISOCC 2018: 265-266 - [c47]Dongsu Lee, Hyunyul Lim, Tae Hyun Kim, Sungho Kang:
Neural Network Reliability Enhancement Approach Using Dropout Underutilization in GPU. TENCON 2018: 2281-2286 - 2017
- [c46]Vageeswar Rajaram, Zhenyun Qian, Sungho Kang, Nicol E. McGruer, Matteo Rinaldi:
Threshold scaling of near-zero power micromechanical photoswitches using bias voltage. IEEE SENSORS 2017: 1-3 - [c45]Hyunyul Lim, Tae Hyun Kim, Dongsu Lee, Sungho Kang:
LARECD: Low area overhead and reliable error correction DMR architecture. ISOCC 2017: 27-28 - [c44]Keewon Cho, Young-Woo Lee, Sungyoul Seo, Sungho Kang:
An efficient built-in self-repair scheme for area reduction. ISOCC 2017: 105-106 - [c43]Hyeonchan Lim, Junghwan Kim, Soyeon Kang, Sungho Kang:
Test data reduction method based on berlekamp-massey algorithm. ISOCC 2017: 123-124 - [c42]Sungyoul Seo, Hyeonchan Lim, Soyeon Kang, Sungho Kang:
Off-chip test architecture for improving multi-site testing efficiency using tri-state decoder and 3V-level encoder. ISQED 2017: 191-195 - [c41]Hyeonchan Lim, Sungyoul Seo, Soyeon Kang, Sungho Kang:
Broadcast scan compression based on deterministic pattern generation algorithm. ISQED 2017: 449-453 - [c40]Young-Woo Lee, Inhyuk Choi, Kang-Hoon Oh, James Jinsoo Ko, Sungho Kang:
Test item priority estimation for high parallel test efficiency under ATE debug time constraints. ITC-Asia 2017: 150-154 - 2016
- [c39]Zhenyun Qian, Sungho Kang, Vageeswar Rajaram, Matteo Rinaldi:
Narrowband MEMS resonant infrared detectors based on ultrathin perfect plasmonic absorbers. IEEE SENSORS 2016: 1-3 - [c38]Soyeon Kang, Inhyuk Choi, Hyeonchan Lim, Sungyoul Seo, Sungho Kang:
Software-based embedded core test using multi-polynomial for test data reduction. ISOCC 2016: 39-40 - [c37]Young-Woo Lee, Junghwan Kim, Inhyuk Choi, Sungho Kang:
A TSV test structure for simultaneously detecting resistive open and bridge defects in 3D-ICs. ISOCC 2016: 129-130 - [c36]Tae Hyun Kim, Hyunyul Lim, Sungho Kang:
P-backtracking: A new scan chain diagnosis method with probability. ISOCC 2016: 141-142 - [c35]Junghwan Kim, Young-Woo Lee, Minho Cheong, Sungyoul Seo, Sungho Kang:
A test methodology to screen scan-path failures. ISOCC 2016: 149-150 - 2015
- [c34]Woosung Lee, Keewon Cho, Jooyoung Kim, Sungho Kang:
Near optimal repair rate built-in redundancy analysis with very small hardware overhead. ISQED 2015: 435-439 - 2013
- [c33]Wooheon Kang, Changwook Lee, Keewon Cho, Sungho Kang:
A Die Selection and Matching Method with Two Stages for Yield Enhancement of 3-D Memories. Asian Test Symposium 2013: 301-306 - [c32]Inhyuk Choi, Taewoo Han, Sungho Kang:
Bit transmission error correction scheme for FlexRay based automotive communication systems. GCCE 2013: 488-490 - 2012
- [c31]Jaeseok Park, Ingeol Lee, Young-Seok Park, Sung-Geun Kim, Kyungho Ryu, Dong-Hoon Jung, Kangwook Jo, Choong Keun Lee, Hongil Yoon, Seong-Ook Jung, Woo-Young Choi, Sungho Kang:
Integration of dual channel timing formatter system for high speed memory test equipment. ISOCC 2012: 185-187 - 2011
- [c30]Jaewon Cha, Ilwoong Kim, Sungho Kang:
New Fault Detection Algorithm for Multi-level Cell Flash Memroies. Asian Test Symposium 2011: 341-346 - [c29]Inhyuk Choi, Taewoo Han, Ilwoong Kim, Sungho Kang:
Path search engine for fast optimal path search using efficient hardware architecture. ISOCC 2011: 96-99 - 2009
- [c28]Seung Ho Ok, Woo-Jin Seo, Jin-Ho Ahn, Sungho Kang, Byung In Moon:
An Ant Colony Optimization Approach for the Preference-Based Shortest Path Search. FGIT-FGCN 2009: 539-546 - [c27]Woo-Jin Seo, Seung Ho Ok, Jin-Ho Ahn, Sungho Kang, Byung In Moon:
An Efficient Hardware Architecture of the A-star Algorithm for the Shortest Path Search Engine. NCM 2009: 1499-1502 - 2008
- [c26]Sunghoon Chun, Taejin Kim, Sungho Kang:
A new low energy BIST using a statistical code. ASP-DAC 2008: 647-652 - [c25]Jongsoo Yim, Gunbae Kim, Incheol Nam, Sangki Son, Jonghyoung Lim, Hwacheol Lee, Sangseok Kang, Byungheon Kwak, Jinseok Lee, Sungho Kang:
A Prevenient Voltage Stress Test Method for High Density Memory. DELTA 2008: 516-520 - [c24]Junghyun Nam, Sunghoon Chun, Gibum Koo, Yanggi Kim, Byungsoo Moon, Jonghyoung Lim, Jaehoon Joo, Sangseok Kang, Hoonjung Kim, Kyeongseon Shin, Kisang Kang, Sungho Kang:
A New Wafer Level Latent Defect Screening Methodology for Highly Reliable DRAM Using a Response Surface Method. ITC 2008: 1-10 - 2006
- [c23]Youbean Kim, Dongsup Song, Kicheol Kim, Incheol Kim, Sungho Kang:
TOSCA: Total Scan Power Reduction Architecture based on Pseudo-Random Built-in Self Test Structure. ATS 2006: 17-24 - [c22]Jin-Ho Ahn, Sungho Kang:
SoC Test Scheduling Algorithm Using ACO-Based Rectangle Packing. ICIC (2) 2006: 655-660 - [c21]Hyuntae Park, Byung In Moon, Sungho Kang:
Improved Reinforcement Computing to Implement AntNet-Based Routing Using General NPs for Ubiquitous Environments. ICUCT 2006: 242-251 - 2005
- [c20]DongSup Song, Sungho Kang:
Increasing Embedding Probabilities of RPRPs in RIN Based BIST. Asia-Pacific Computer Systems Architecture Conference 2005: 600-613 - [c19]Jin-Ho Ahn, Byung In Moon, Sungho Kang:
A Practical Test Scheduling Using Network-Based TAM in Network on Chip Architecture. Asia-Pacific Computer Systems Architecture Conference 2005: 614-624 - 2004
- [c18]Jung-Been Im, Sunghoon Chun, Geunbae Kim, Jin-Ho Ahn, Sungho Kang:
RAIN (RAndom Insertion) Scheduling Algorithm for SoC Test. Asian Test Symposium 2004: 242-247 - [c17]Jae Seuk Oh, Sung-il Bae, Jin-Ho Ahn, Sungho Kang:
Route Reinforcement for Efficient QoS Routing Based on Ant Algorithm. ICOIN 2004: 342-349 - [c16]Byung In Moon, Hongil Yoon, Ilgu Yun, Sungho Kang:
An In-Order SMT Architecture with Static Resource Partitioning for Consumer Applications. PDCAT 2004: 539-544 - 2002
- [c15]Sung-il Bae, Daesik Seo, Gilyoung Kang, Sungho Kang:
A New Survival Architecture for Network Processors. AISA 2002: 1-10 - [c14]Sungchul Yoon, Sangwook Kim, Jae Seuk Oh, Sungho Kang:
A New DSP Architecture for Correcting Errors Using Viterbi Algorithm. AISA 2002: 95-102 - [c13]Sangmin Bae, DongSup Song, Jihye Kim, Sungho Kang:
An Efficient On-Line Monitoring BIST for Remote Service System. AISA 2002: 205-214 - 2001
- [c12]Song Chong, Sangho Lee, Sungho Kang:
Control-theoretic max-min flow control with minimum rate guarantee. GLOBECOM 2001: 2412-2418 - 1999
- [c11]Hangkyu Lee, Sungho Kang:
A New Weight Set Generation Algorithm for Weighted Random Pattern Generation. ICCD 1999: 160-165 - 1997
- [c10]Yong Seok Kang, Jong Cheol Lee, Sungho Kang:
Built-in Self Test for Contect Addressable Memories. ICCD 1997: 48-53 - 1996
- [c9]Jae-Wook Lee, Sungho Kang:
Efficient Simulation Model Generation Using Automatic Programming Techniques. WSC 1996: 708-713 - 1995
- [c8]Youngmin Hur, Stephen A. Szygenda, E. Scott Fehr, Granville E. Ott, Sungho Kang:
Massively Parallel Array Processor for Logic, Fault, and Design Error Simulation. HPCA 1995: 340-347 - 1994
- [c7]Sungho Kang, Wai-On Law, Bill Underwood:
Path-Delay Fault Simulation for a Standard Scan Design Methodology. ICCD 1994: 359-362 - [c6]Bill Underwood, Wai-On Law, Sungho Kang, Haluk Konuk:
Fastpath: A Path-Delay Test Generator for Standard Scan Designs. ITC 1994: 154-163 - 1993
- [c5]Sungho Kang, Stephen A. Szygenda:
Automatic VHDL Model Generation System. CHDL 1993: 353-360 - 1992
- [c4]Sungho Kang, Stephen A. Szygenda:
New design error modeling and metrics for design validation. EURO-DAC 1992: 472-477 - [c3]Sungho Kang, Stephen A. Szygenda:
Modeling and Simulation of Design Errors. ICCD 1992: 443-446 - 1983
- [c2]Sungho Kang:
Linear ordering and application to placement. DAC 1983: 457-464 - 1981
- [c1]Sungho Kang, William M. van Cleemput:
Automatic PLA synthesis from a DDL-P description. DAC 1981: 391-397
Coauthor Index
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