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"Deterministic built-in self-test using split linear feedback shift ..."

Myung-Hoon Yang et al. (2007)

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DOI: 10.1049/IET-CDT:20060114

access: closed

type: Journal Article

metadata version: 2020-07-14

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  - https://dblp.org/rec/journals/iet-cdt/YangKPLK07
Myung-Hoon Yang, Youbean Kim, Youngkyu Park, D. Lee, Sungho Kang:
Deterministic built-in self-test using split linear feedback shift register reseeding for low-power testing. IET Comput. Digit. Tech. 1(4): 369-376 (2007)

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