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ORCIDAida Todri
- > Home > Persons > Aida Todri
Publications
- 2014
[j6]Aida Todri-Sanial
, Sandip Kundu, Patrick Girard, Alberto Bosio, Luigi Dilillo, Arnaud Virazel:
Globally Constrained Locally Optimized 3-D Power Delivery Networks. IEEE Trans. Very Large Scale Integr. Syst. 22(10): 2131-2144 (2014)- [j5]Joao Azevedo, Arnaud Virazel, Alberto Bosio, Luigi Dilillo, Patrick Girard, Aida Todri-Sanial, Jérémy Alvarez-Herault, Ken Mackay:
A Complete Resistive-Open Defect Analysis for Thermally Assisted Switching MRAMs. IEEE Trans. Very Large Scale Integr. Syst. 22(11): 2326-2335 (2014) - [c43]Yuanqing Cheng, Aida Todri-Sanial, Alberto Bosio, Luigi Dilillo, Patrick Girard, Arnaud Virazel:
Power supply noise-aware workload assignments for homogeneous 3D MPSoCs with thermal consideration. ASP-DAC 2014: 544-549 - [c42]Carolina Metzler, Aida Todri-Sanial, Alberto Bosio, Luigi Dilillo, Patrick Girard, Arnaud Virazel:
Timing-aware ATPG for critical paths with multiple TSVs. DDECS 2014: 116-121 - [c41]Anu Asokan, Aida Todri-Sanial, Alberto Bosio, Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel:
Path delay test in the presence of multi-aggressor crosstalk, power supply noise and ground bounce. DDECS 2014: 207-212 - [c40]Miroslav Valka, Alberto Bosio, Luigi Dilillo, Aida Todri, Arnaud Virazel, Patrick Girard, P. Debaud, S. Guilhot:
Test and diagnosis of power switches. DDECS 2014: 213-218 - [c39]Imran Wali, Arnaud Virazel, Alberto Bosio, Luigi Dilillo, Patrick Girard, Aida Todri:
Protecting combinational logic in pipelined microprocessor cores against transient and permanent faults. DDECS 2014: 223-225 - [c38]Alberto Bosio, Luigi Dilillo, Patrick Girard, Aida Todri-Sanial, Arnaud Virazel, S. Bernabovi, Paolo Bernardi:
An intra-cell defect grading tool. DDECS 2014: 298-301 - [c37]Miroslav Valka, Alberto Bosio, Luigi Dilillo, Aida Todri, Arnaud Virazel, Patrick Girard, P. Debaud, S. Guilhot:
iBoX - Jitter based Power Supply Noise sensor. ETS 2014: 1-2 - [c36]Anu Asokan, Aida Todri-Sanial, Alberto Bosio, Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel:
A Delay Probability Metric for Input Pattern Ranking Under Process Variation and Supply Noise. ISVLSI 2014: 226-231 - [c35]Aymen Touati, Alberto Bosio, Luigi Dilillo, Patrick Girard, Aida Todri-Sanial, Arnaud Virazel, Paolo Bernardi:
A Comprehensive Evaluation of Functional Programs for Power-Aware Test. NATW 2014: 69-72 - [c33]Carolina Metzler, Aida Todri-Sanial, Alberto Bosio, Luigi Dilillo, Patrick Girard, Arnaud Virazel:
TSV aware timing analysis and diagnosis in paths with multiple TSVs. VTS 2014: 1-6 - 2013
- [j4]Aida Todri, Sandip Kundu, Patrick Girard, Alberto Bosio, Luigi Dilillo, Arnaud Virazel:
A Study of Tapered 3-D TSVs for Power and Thermal Integrity. IEEE Trans. Very Large Scale Integr. Syst. 21(2): 306-319 (2013) - [j3]Aida Todri, Alberto Bosio, Luigi Dilillo, Patrick Girard, Arnaud Virazel:
Uncorrelated Power Supply Noise and Ground Bounce Consideration for Test Pattern Generation. IEEE Trans. Very Large Scale Integr. Syst. 21(5): 958-970 (2013) - [c32]Elena I. Vatajelu, Luigi Dilillo, Alberto Bosio, Patrick Girard, Aida Todri, Arnaud Virazel, Nabil Badereddine:
Adaptive Source Bias for Improved Resistive-Open Defect Coverage during SRAM Testing. Asian Test Symposium 2013: 109-114 - [c31]Leonardo Bonet Zordan, Alberto Bosio, Luigi Dilillo, Patrick Girard, Aida Todri, Arnaud Virazel, Nabil Badereddine:
Test solution for data retention faults in low-power SRAMs. DATE 2013: 442-447 - [c30]Elena I. Vatajelu, Georgios Tsiligiannis, Luigi Dilillo, Alberto Bosio, Patrick Girard, Serge Pravossoudovitch, Aida Todri, Arnaud Virazel, Frederic Wrobel, Frédéric Saigné:
On the correlation between Static Noise Margin and Soft Error Rate evaluated for a 40nm SRAM cell. DFTS 2013: 143-148 - [c29]Elena I. Vatajelu, Alberto Bosio, Luigi Dilillo, Patrick Girard, Aida Todri, Arnaud Virazel, Nabil Badereddine:
Analyzing the effect of concurrent variability in the core cells and sense amplifiers on SRAM read access failures. DTIS 2013: 39-44 - [c28]Carolina Metzler, Aida Todri-Sanial, Alberto Bosio, Luigi Dilillo, Patrick Girard, Arnaud Virazel, Pascal Vivet, Marc Belleville:
Computing detection probability of delay defects in signal line tsvs. ETS 2013: 1-6 - [c27]Elena I. Vatajelu, Alberto Bosio, Luigi Dilillo, Patrick Girard, Aida Todri, Arnaud Virazel, Nabil Badereddine:
Analyzing resistive-open defects in SRAM core-cell under the effect of process variability. ETS 2013: 1-6 - [c26]Georgios Tsiligiannis, Elena I. Vatajelu, Luigi Dilillo, Alberto Bosio, Patrick Girard, Serge Pravossoudovitch, Aida Todri, Arnaud Virazel, Frederic Wrobel, Frédéric Saigné:
SRAM soft error rate evaluation under atmospheric neutron radiation and PVT variations. IOLTS 2013: 145-150 - [c25]Zhenzhou Sun, Alberto Bosio, Luigi Dilillo, Patrick Girard, Aida Todri, Arnaud Virazel, Etienne Auvray:
Effect-cause intra-cell diagnosis at transistor level. ISQED 2013: 460-467 - [c23]Leonardo Bonet Zordan, Alberto Bosio, Luigi Dilillo, Patrick Girard, Aida Todri, Arnaud Virazel, Nabil Badereddine:
On the reuse of read and write assist circuits to improve test efficiency in low-power SRAMs. ITC 2013: 1-10 - [c22]Georgios Tsiligiannis, Luigi Dilillo, Alberto Bosio, Patrick Girard, Serge Pravossoudovitch, Aida Todri-Sanial, Arnaud Virazel, Julien Mekki, Markus Brugger, J.-R. Vaillé, Frederic Wrobel, Frédéric Saigné:
Characterization of an SRAM based particle detector for mixed-field radiation environments. IWASI 2013: 75-80 - [c21]Aida Todri-Sanial, Alberto Bosio, Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel:
Worst-case power supply noise and temperature distribution analysis for 3D PDNs with multiple clock domains. NEWCAS 2013: 1-4 - [c20]Leonardo Bonet Zordan, Alberto Bosio, Luigi Dilillo, Patrick Girard, Aida Todri, Arnaud Virazel, Nabil Badereddine:
A built-in scheme for testing and repairing voltage regulators of low-power srams. VTS 2013: 1-6 - 2012
- [c19]Joao Azevedo, Arnaud Virazel, Alberto Bosio, Luigi Dilillo, Patrick Girard, Aida Todri, Guillaume Prenat, Jérémy Alvarez-Herault, Ken Mackay:
Impact of Resistive-Bridge Defects in TAS-MRAM Architectures. Asian Test Symposium 2012: 125-130 - [c18]Miroslav Valka, Alberto Bosio, Luigi Dilillo, Patrick Girard, Aida Todri, Arnaud Virazel, P. Debaud, S. Guilhot:
Power Supply Noise Sensor Based on Timing Uncertainty Measurements. Asian Test Symposium 2012: 161-166 - [c17]Alberto Bosio, Luigi Dilillo, Patrick Girard, Aida Todri, Arnaud Virazel:
Why and How Controlling Power Consumption during Test: A Survey. Asian Test Symposium 2012: 221-226 - [c16]Joao Azevedo, Arnaud Virazel, Alberto Bosio, Luigi Dilillo, Patrick Girard, Aida Todri-Sanial, Guillaume Prenat, Jérémy Alvarez-Herault, Ken Mackay:
Impact of resistive-open defects on the heat current of TAS-MRAM architectures. DATE 2012: 532-537 - [c15]Joao Azevedo, Arnaud Virazel, Alberto Bosio, Luigi Dilillo, Patrick Girard, Aida Todri, Guillaume Prenat, Jérémy Alvarez-Herault, Ken Mackay:
Coupling-based resistive-open defects in TAS-MRAM architectures. ETS 2012: 1 - [c14]Carolina Metzler, Aida Todri, Alberto Bosio, Luigi Dilillo, Patrick Girard, Arnaud Virazel:
Through-Silicon-Via resistive-open defect analysis. ETS 2012: 1 - [c13]Leonardo Bonet Zordan, Alberto Bosio, Luigi Dilillo, Patrick Girard, Aida Todri, Arnaud Virazel, Nabil Badereddine:
Defect analysis in power mode control logic of low-power SRAMs. ETS 2012: 1 - [c12]Georgios Tsiligiannis, Luigi Dilillo, Alberto Bosio, Patrick Girard, Aida Todri, Arnaud Virazel, Antoine D. Touboul, Frederic Wrobel, Frédéric Saigné:
Evaluation of test algorithms stress effect on SRAMs under neutron radiation. IOLTS 2012: 121-122 - [c11]Leonardo Bonet Zordan, Alberto Bosio, Luigi Dilillo, Patrick Girard, Aida Todri, Arnaud Virazel, Nabil Badereddine:
Low-power SRAMs power mode control logic: Failure analysis and test solutions. ITC 2012: 1-10 - [c10]D. A. Tran, Arnaud Virazel, Alberto Bosio, Luigi Dilillo, Patrick Girard, Aida Todri, Michael E. Imhof, Hans-Joachim Wunderlich:
A pseudo-dynamic comparator for error detection in fault tolerant architectures. VTS 2012: 50-55 - 2011
- [c9]Leonardo Bonet Zordan, Alberto Bosio, Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Aida Todri, Arnaud Virazel, Nabil Badereddine:
Failure Analysis and Test Solutions for Low-Power SRAMs. Asian Test Symposium 2011: 459-460 - [c8]Alberto Bosio, Luigi Dilillo, Patrick Girard, Aida Todri, Arnaud Virazel, Kohei Miyase, Xiaoqing Wen:
Power-Aware Test Pattern Generation for At-Speed LOS Testing. Asian Test Symposium 2011: 506-510 - [c7]Aida Todri, Alberto Bosio, Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel:
A study of path delay variations in the presence of uncorrelated power and ground supply noise. DDECS 2011: 189-194
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